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2019 92nd ARFTG Microwave Measurement Conference (ARFTG)最新文献

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Probe Positioner and Probe Tip Calibration for Traceable On-Wafer Measurement 用于可追溯晶圆测量的探头定位器和探头尖端校准
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637232
R. Sakamaki, M. Horibe
{"title":"Probe Positioner and Probe Tip Calibration for Traceable On-Wafer Measurement","authors":"R. Sakamaki, M. Horibe","doi":"10.1109/ARFTG.2019.8637232","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637232","url":null,"abstract":"This paper presents a loaded-probe positioner calibration and evaluation of the ratio between Z-coordinate of the positioner and probe skating distance. The accuracy of the loaded-probe positioner in the in-plane direction was validated by comparing length measurements of two lines between a calibrated optical microscope and accurate probe positioning at both edges of the lines. Furthermore, the accuracy of the probe positioner in the vertical direction was also validated using a calibrated step master. The calibration results showed that the accuracy of the probe positioner was within the accuracy limits of the precision probing technique. The ratio of Z-coordinate to probe skating distance varied with the probe skating distance and probe models. The skating distance directly contributed to the distance between probes. The impact of the ratio on the evaluation of a 2-mm transmission line was investigated at 300 GHz band.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130992399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Modulated Measurements and Time-Local Signal Level Control 调制测量和时间本地信号电平控制
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637229
J. Martens
{"title":"Modulated Measurements and Time-Local Signal Level Control","authors":"J. Martens","doi":"10.1109/ARFTG.2019.8637229","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637229","url":null,"abstract":"Power control directly on modulated signals with varying envelopes for network analysis and other measurements may be needed when pre-amplifier or other network drift is noticeable and the DUT is operating somewhat nonlinearly or not in thermal equilibrium. More importantly, this control (or leveling) may need to focus on certain portions of the envelope (e.g., maximum overshoot point at the beginning of a frame). Detection planes, detection methods and leveling loop structure are all important considerations and affect bandwidth, latency, control range and practical power accuracy. Direct digitizing detection at an IF can offer bandwidth and control range advantages but care is needed on latency control. Several hundred MHz to several GHz bandwidths with∼100 dB detection range and ms-scale latencies are achievable through mm-wave carrier frequencies with sub-dB inaccuracies even for time scales of the order of nanoseconds.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126710778","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Next Generation Microwave and Millimeter-Wave Measurement Techniques and Systems 下一代微波和毫米波测量技术与系统
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/arftg.2019.8637243
{"title":"Next Generation Microwave and Millimeter-Wave Measurement Techniques and Systems","authors":"","doi":"10.1109/arftg.2019.8637243","DOIUrl":"https://doi.org/10.1109/arftg.2019.8637243","url":null,"abstract":"","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"204 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121115048","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
5G: Changing the Way We Work, Live and Play (Invited) 5G:改变我们工作、生活和娱乐的方式(特邀)
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637215
Michael O’Neal
{"title":"5G: Changing the Way We Work, Live and Play (Invited)","authors":"Michael O’Neal","doi":"10.1109/ARFTG.2019.8637215","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637215","url":null,"abstract":"This talk will begin with a review of the progression of mobile networks and the motivation for a 5G network. Then we will have a look at a synopsis of frequency allocation, standards and carrier activity. 5G use cases and ecosystem will be presented. From a systems architecture standpoint we will describe where we are now and where we may go in the future. Sub-6GHz and mm-wave system and semiconductor technology choices and tradeoffs are reviewed. Finally, we will discuss system simulation capabilities and test challenges.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131283157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Iterative Method Based on Resonator-Measurements and Analytical Data Yields Permittivity of Graphene Materials 基于谐振器测量和分析数据的迭代方法得到石墨烯材料的介电常数
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637218
H. Schmiedel, M. Jacob, J. Hamilton
{"title":"Iterative Method Based on Resonator-Measurements and Analytical Data Yields Permittivity of Graphene Materials","authors":"H. Schmiedel, M. Jacob, J. Hamilton","doi":"10.1109/ARFTG.2019.8637218","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637218","url":null,"abstract":"Resonator measurements allow to determine permittivity and losses of board materials with conducting strips such as microstrip. The resonant wavelength is related to the board permittivity and the resonator length. A linear regression yields the effective permittivity. To reduce the uncertainty of the linear regression, an Iterative Method is proposed. It combines the regression on measured datapoints with an additional analytical datapoint based on the electrical resonator length and results in reducing the permittivity's uncertainty by one magnitude. Measurements of composite material show, that permittivity can be modified as desired by adding graphene flakes. Also losses will be measured.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131500690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Novel Calibration Technique for Wideband Transmitters Using Constellation Mapping 基于星座映射的宽带发射机标定新技术
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637231
S. Madhuwantha, Prasidh Ramabadran, R. Farrell, J. Dooley
{"title":"Novel Calibration Technique for Wideband Transmitters Using Constellation Mapping","authors":"S. Madhuwantha, Prasidh Ramabadran, R. Farrell, J. Dooley","doi":"10.1109/ARFTG.2019.8637231","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637231","url":null,"abstract":"Next generation wireless communication systems such as 5G will feature a step increase in the speed of wireless data transmission. This requires using RF signals of wider bandwidths along with higher order modulation schemes. Such signals are subjected to frequency and power dependent impairments such as gain compression, amplitude ripple and tilt, group-delay and AM-PM conversion as they traverse through the transmitter's hardware blocks. This paper introduces a novel calibration scheme that applies a specially designed wideband 64-QAM modulated stimulus and uses the captured response to evaluate the impairments within the transmitter's RF chain. The needed pre-compensation is applied in a single iteration. This technique is intended for use with Doherty, Outphasing and MIMO type applications. Presented technique was experimentally validated using signal bandwidths up to 100 MHz for both weakly and strongly nonlinear systems.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132795610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A 3D Printed TE10 Rectangular to TE01 Circular Waveguide Transition for Polymer Waveguide Characterization 用于聚合物波导表征的3D打印TE10矩形到TE01圆形波导转换
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 2019-01-01 DOI: 10.1109/ARFTG.2019.8637235
M. Del Mastro, M. A. Del Pino, M. Spirito
{"title":"A 3D Printed TE10 Rectangular to TE01 Circular Waveguide Transition for Polymer Waveguide Characterization","authors":"M. Del Mastro, M. A. Del Pino, M. Spirito","doi":"10.1109/ARFTG.2019.8637235","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637235","url":null,"abstract":"In this paper we present a copper plated 3D printed implementation of the Marié rectangular to circular waveguide transition. The copper plated 3D printed structure allows to overcome machining limitation when dealing with curved surfaces, confining the signal propagation in air, thus avoiding losses from the printing polymers. Waveguide flanges are employed at both the rectangular (WR-12) and circular port to perform a full TRL calibration when the transitions are used in a VNA environment. A step diameter taper is used on the circular port of the transition to facilitate testing of circular polymer waveguides of different diameters. Experimental characterization is carried out for multiple samples of polymer (i.e., Teflon) waveguides in the 65–90 GHz range.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130023759","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Experimental Considerations on Accurate fT and fmax Extraction for MOS Transistors Measured Up to 110 GHz 测量频率高达110 GHz的MOS晶体管精确提取fT和fmax的实验考虑
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.2019.8637249
J. Rimmelspacher, A. Werthof, R. Weigel, A. Geiselbrechtinger, V. Issakov
{"title":"Experimental Considerations on Accurate fT and fmax Extraction for MOS Transistors Measured Up to 110 GHz","authors":"J. Rimmelspacher, A. Werthof, R. Weigel, A. Geiselbrechtinger, V. Issakov","doi":"10.1109/ARFTG.2019.8637249","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637249","url":null,"abstract":"The unity current gain frequency $(f_{T})$ and the maximum oscillation frequency $(f_{max})$ are key parameters used to characterize the highest achievable speed of a semiconductor technology. However, these values are usually evaluated based on transistor measurements performed at low gigahertz frequencies and extrapolated far to a range of several hundreds of gigahertz. Hence, a large deviation of obtained results is possible, depending on the point at which the extrapolation is taken. Additionally, depending on the decision down to which metallization layer the transistor interconnect parasitics are de-embedded, the value of ${f_{max}}$ may vary significantly. This paper presents an experimental study on methodology how to extract accurately ${f_{T}}$ and ${f_{max}}$ from S-parameter measurements. We evaluate systematically various extrapolation frequencies and discuss the results. As an example, we characterize MOS devices of a 40 nm bulk CMOS technology by S-parameter measurements up to 110 GHz. We use OPEN-SHORT de-embedding technique and discuss its applicability.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129713463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Wideband Load Pull Measurement Techniques: Architecture, Accuracy, and Applications 宽带负载拉力测量技术:结构、精度和应用
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.2019.8637240
M. Marchetti, G. Avolio, M. Squillante, Ajay K. Doggalli, B.V. Anteverta-Mw
{"title":"Wideband Load Pull Measurement Techniques: Architecture, Accuracy, and Applications","authors":"M. Marchetti, G. Avolio, M. Squillante, Ajay K. Doggalli, B.V. Anteverta-Mw","doi":"10.1109/ARFTG.2019.8637240","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637240","url":null,"abstract":"This paper concentrates on load pull measurements for high-frequency devices and circuits. We will discuss the architecture and the design aspects of a state-of-the-art load pull measurement system which enables wideband impedance control with complex modulated signals both at RF and baseband frequencies. We will present several application examples, ranging from high speed load pull for technology evaluations and power amplifier design to modulated testing for 5G applications. Finally, we will describe a procedure for evaluating traceable uncertainty of power measurements as a function of the load impedance.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"131 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122749226","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Automated Performance of On-Wafer Calibration and Characterization Using Non-Contact Probes 使用非接触式探针的晶圆上校准和表征的自动性能
2019 92nd ARFTG Microwave Measurement Conference (ARFTG) Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.2019.8637236
K. Sertel
{"title":"Automated Performance of On-Wafer Calibration and Characterization Using Non-Contact Probes","authors":"K. Sertel","doi":"10.1109/ARFTG.2019.8637236","DOIUrl":"https://doi.org/10.1109/ARFTG.2019.8637236","url":null,"abstract":"We present the repeatability performance of automated non-contact on-wafer probing for millimeter-wave and terahertz band applications. Based on the antenna-coupled noncontact probing approach, we incorporated computer control into the existing hardware to automate the test wafer manipulation. A digital microscope with pattern recognition is used to precisely control the alignment of on-wafer antennas at the test ports to minimize positioning repeatability errors. Commercial-off-the-shelf micro-positioners used in our system allow for sub-micron repeatability in device alignment, significantly improving repeatability. Furthermore, the non-contact system does not need vertical translation (conventionally used for probe landing), thus can achieve highly repeatable measurements. The repeatability performance of the automated system presented here is thus limited by the drift of the frequency extenders used.","PeriodicalId":197304,"journal":{"name":"2019 92nd ARFTG Microwave Measurement Conference (ARFTG)","volume":"3 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114105001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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