2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement最新文献_第6页

A DSL Framework for Policy-Based Security of Distributed Systems 分布式系统基于策略安全的DSL框架

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.43

Hédi Hamdi, M. Mosbah

引用次数: 9

Checking Service Instance Protection for AMF Configurations 检查AMF配置的服务实例保护

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.25

Pejman Salehi, F. Khendek, M. Toeroe, A. Hamou-Lhadj, Abdelouahed Gherbi

引用次数: 6

Systematic Cooperation between Industry and Universities –The Experience from Siemens IT Solutions and Services 产学研系统合作——西门子IT解决方案与服务的经验

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.64

{"title":"Systematic Cooperation between Industry and Universities –The Experience from Siemens IT Solutions and Services","authors":"","doi":"10.1109/SSIRI.2009.64","DOIUrl":"https://doi.org/10.1109/SSIRI.2009.64","url":null,"abstract":"These years the cooperation between industrial companies and universities are under significant changes. The dialogues have been held regularly to increase understanding and discuss the cooperation framework. The large number of students from software institutes in China has done 10 month - 1 year internship programs in companies. These programs intensify the cooperation. It is a trend to deepen the cooperation between industrial companies and universities in different directions, such as setup curriculum. Although companies and universities have different targets, both parties share the same interests to train highly qualified students to meet the market demands. Siemens IT Solutions and Services, China, has started the contacts with universities since July 2004. In general we have a 5-step systematic approach to identify partners, implement internship program, support university curriculum, design dedicated class for company, and fund research projects. In this talk, we will give overview of our cooperation and examples. And we will focus on our vision for the future directions to support curriculum and research projects.","PeriodicalId":196276,"journal":{"name":"2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131402779","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Generating Test Cases for Timed Systems from Controlled Natural Language Specifications 从受控的自然语言规范生成定时系统的测试用例

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.58

Matthias Schnelte

引用次数: 8

A Comparative Study of Access Control Languages 访问控制语言的比较研究

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.18

Sathish Pinagapani, Dianxiang Xu, Jun Kong

引用次数: 1

Automatic Test Data Generation for C Programs C程序自动测试数据生成

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.53

P. Bokil, P. Darke, U. Shrotri, R. Venkatesh

引用次数: 39

Performance Testing of Mobile Applications at the Unit Test Level 单元测试级别的移动应用程序性能测试

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.28

Heejin Kim, Byoungju Choi, W. Eric Wong

{"title":"Performance Testing of Mobile Applications at the Unit Test Level","authors":"Heejin Kim, Byoungju Choi, W. Eric Wong","doi":"10.1109/SSIRI.2009.28","DOIUrl":"https://doi.org/10.1109/SSIRI.2009.28","url":null,"abstract":"With the rapid growth of the wireless market and the development of various mobile devices, innovative methods and technologies to produce high-quality mobile applications and reduce time to market have been emerging. Mobile applications are often characterized by an array of limitations such as the short development lifecycle to gain a competitive advantage and difficulties to update once released. Hence, rigorous testing on the applications is required before distribution to the market, including structural white-box, functional black-box, integration and system testing. Although recently performance testing at the system test level has become crucial given its direct connection with the product quality improvement, most such tests are confined to the areas of load, usability, and stress testing. Moreover, the implementation itself is insufficient due to the limitations of the development environment. This paper proposes a method to support performance testing utilizing a database established through benchmark testing in emulator-based test environment at the unit test level. It also presents the tool that supports the proposed method of performance testing and verifies the reliability of performance test results through experiments.","PeriodicalId":196276,"journal":{"name":"2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124699568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 49

Keynote: Reliability for Software-Based Systems 主题演讲:基于软件系统的可靠性

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.76

Frances Paulisch

引用次数: 0

ReconBin: Reconstructing Binary File from Execution for Software Analysis ReconBin:重建二进制文件从执行软件分析

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.46

Lingyun Ying, Purui Su, D. Feng, Xianggen Wang, Yi Yang, Yu Liu

{"title":"ReconBin: Reconstructing Binary File from Execution for Software Analysis","authors":"Lingyun Ying, Purui Su, D. Feng, Xianggen Wang, Yi Yang, Yu Liu","doi":"10.1109/SSIRI.2009.46","DOIUrl":"https://doi.org/10.1109/SSIRI.2009.46","url":null,"abstract":"Static analysis is one of the most popular approaches of software analysis. As more and more software protects their code by transformation or encryption, then releases them at runtime dynamically, it is hard to statically analyze these protected executables because of the failure of disassembling. In this paper, we propose a novel and general technique to reconstruct binary files for static analysis by monitoring the executions of protected executables. Our approach can identify and extract the dynamically released code at runtime, and at the same time record the control transfers information, and then reconstruct a binary file based on the original executable. The whole process does not depend on any prior knowledge on the protection methods. Experiments on our prototype ReconBin show that our approach can properly reconstruct the executables protected by SMC and packers, and the reconstructed binary files can be successfully analyzed by static analysis tools such as IDA Pro. We show that it also can be used to analyze the code dynamically generated by virtual machines, emulators, and buffer overflow attacks, which also dynamically inject attack code into stack and direct execution flow to it.","PeriodicalId":196276,"journal":{"name":"2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130041797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Keynote: Automatic Test Data Generation : Who, When and Where ? 主题演讲:自动测试数据生成:谁、何时、何地?

2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement Pub Date : 2009-07-08 DOI: 10.1109/SSIRI.2009.75

A. Offutt

{"title":"Keynote: Automatic Test Data Generation : Who, When and Where ?","authors":"A. Offutt","doi":"10.1109/SSIRI.2009.75","DOIUrl":"https://doi.org/10.1109/SSIRI.2009.75","url":null,"abstract":"The past decade has seen exciting changes in how we develop and test software. Researchers have invented numerous techniques and criteria that are now mature enough to be ready for industrial use. During this time, the need for reliable software has grown enormously. The user base is expanding, technological advances put software into more mission-critical locations, software continues to grow in complexity, and secure software must be correct software. However, many of the strongest testing ideas invented by researchers have not yet been adopted by industry. In particular, one of the hardest problems in software testing is automatic generation of test inputs; a problem with many sophisticated solutions from the research community but for which industry tools only have primitive solutions. This talk will discuss automatic test data generation in the context of the model-driven test design process, then discuss mismatches between testing in industry and techniques from the research community. The talk will discuss why industry needs to improve testing, explore some of the difficulties in transitioning testing research results to industrial use, and close with a description of practical, usable engineering tools that can incorporate the best automatic test data generation ideas in pragmatic ways.","PeriodicalId":196276,"journal":{"name":"2009 Third IEEE International Conference on Secure Software Integration and Reliability Improvement","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134404880","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0