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2009 20th International Zurich Symposium on Electromagnetic Compatibility最新文献

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A Radiated Emission Model Compatible to a Commercial Electromagnetic Simulation Tool 兼容商用电磁仿真工具的辐射发射模型
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783467
P. F. Lopez, A. Ramanujan, Y. V. Gilabert, C. Arcambal, A. Louis, B. Mazari
{"title":"A Radiated Emission Model Compatible to a Commercial Electromagnetic Simulation Tool","authors":"P. F. Lopez, A. Ramanujan, Y. V. Gilabert, C. Arcambal, A. Louis, B. Mazari","doi":"10.1109/EMCZUR.2009.4783467","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783467","url":null,"abstract":"To evaluate magnetic fields radiated by electronic components, different radiated emission models have been created. Within IRSEEM, a model based on equivalent sources obtained from near-field measurements has been developed. The aim of our study is to insert this model into commercial electromagnetic tools such as HFSS to make it helpful for engineers.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"36 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132973239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 26
Numerical Evaluation of Absorber Reflectivity in an Artificial Waveguide 人工波导吸收器反射率的数值计算
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783477
H. Pues, Y. Arien, F. Demming-Janssen, J. Dauwen
{"title":"Numerical Evaluation of Absorber Reflectivity in an Artificial Waveguide","authors":"H. Pues, Y. Arien, F. Demming-Janssen, J. Dauwen","doi":"10.1109/EMCZUR.2009.4783477","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783477","url":null,"abstract":"The reflectivity of an absorber-lined wall in a shielded enclosure (considered as a metal-backed doubly-periodic absorber array) is calculated by simulating a one-port S-parameter measurement of a single absorber in an artificial waveguide. Compared to real measurements in waveguides or coaxial lines, a much larger frequency range is obtained. By properly taking into account the effect of higher-order modes, a distinction is made between specular and non-specular reflections. The method is applied to two types of hollow pyramidal absorbers to illustrate its usefulness.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131549132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A Behavioral Simulation and Analysis Method for Communication System 通信系统行为仿真与分析方法
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783464
Chen Wenqing, Su Donglin, He Xiaomu, Liu Yan
{"title":"A Behavioral Simulation and Analysis Method for Communication System","authors":"Chen Wenqing, Su Donglin, He Xiaomu, Liu Yan","doi":"10.1109/EMCZUR.2009.4783464","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783464","url":null,"abstract":"This paper put forward a system-level EMC Behavioral Simulation Method for communication system. Analyzing, describing and simulating key modules of communication system from up to down, the behavioral models of system,subsystem,module and component were designed. The technique allowed to simulate a system in the time domain mode as well as in the frequency domain mode by taking into account the nonlinearity transfer characteristics.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114038209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Influence of the IEC 61967 Test Board on IC Electromagnetic Emissions IEC 61967测试板对集成电路电磁发射的影响
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783445
Y. Villavicencio, F. Musolino, F. Fiori, D. Pandini
{"title":"Influence of the IEC 61967 Test Board on IC Electromagnetic Emissions","authors":"Y. Villavicencio, F. Musolino, F. Fiori, D. Pandini","doi":"10.1109/EMCZUR.2009.4783445","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783445","url":null,"abstract":"This paper deals with the experimental characterization of integrated circuit electromagnetic emissions. The influence of the IEC standardized board layout on the conducted emission of an integrated circuit has been analyzed by full-wave and circuital simulations. Guidelines for the design of such a test board which help to improve measurement repeatability are also provided.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121957311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Influences of CUT on the VSWR of GTEM Cell CUT对GTEM细胞驻波比的影响
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783387
Xiang Zhou, Quan-xing Jiang, Hong-qi Jiang
{"title":"Influences of CUT on the VSWR of GTEM Cell","authors":"Xiang Zhou, Quan-xing Jiang, Hong-qi Jiang","doi":"10.1109/EMCZUR.2009.4783387","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783387","url":null,"abstract":"The GTEM cell method to measuring shielding effectiveness is accepted by ANSI/SCTE48-3 2004, but there is no analysis of the influences of the introduction of cable under test(CUT) on the VSWR of GTEM cell, which will result in measure error. The influences of the size, position, shape and direction of CUT is analyzed by simulation, and the influences of the direction is analyzed by experiment. The introduction of CUT will change the VSWR of GTEM, then affect the measure precision. The measure advice is given to improve the measure precision.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122049032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Mutual Inductance of Capacitor Low-Pass Filters 电容低通滤波器的互感
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783470
T. Fischer, Christian Kneuer, M. Albach, G. Schubert
{"title":"Mutual Inductance of Capacitor Low-Pass Filters","authors":"T. Fischer, Christian Kneuer, M. Albach, G. Schubert","doi":"10.1109/EMCZUR.2009.4783470","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783470","url":null,"abstract":"This paper describes the magnetic coupling of simple SMD capacitor low-pass filters which is investigated by the method of partial elements (PEEC). Based on analytical equations, the improvement of simple filter structures is possible with the help of the PCB layout only. As has been shown by measurement and simulation, the advanced usage of one and two capacitors allows improvements of up to 20dB at 1 GHz resulting exclusively from the chosen PCB layout. Moreover, attenuation can be increased up to 42dB with low-ESL capacitors.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122474515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Evaluation Method of Anisotropic Absorber Panel at Microwave Frequencies 微波频率下各向异性吸收板的评价方法
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783433
S. Yamamoto, Yoshiaki Takae, K. Hatakeyama
{"title":"Evaluation Method of Anisotropic Absorber Panel at Microwave Frequencies","authors":"S. Yamamoto, Yoshiaki Takae, K. Hatakeyama","doi":"10.1109/EMCZUR.2009.4783433","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783433","url":null,"abstract":"A evaluation method of anisotropic absorber panel is discussed. Anisotropic absorber panel have the axis of anisotropy. Reflection coefficient at the principal axis shows maximum or minimum value. In order to evaluate the principal axis of anisotropic absorber panel, we proposed diagonalization method. By diagonalizing reflection coefficient matrix, reflection coefficients at the principal axis and principal axis direction can be calculated. In this paper, the principal axis of several materials are evaluated.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124614125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fast Assessment of Antenna-PCB Coupling in Mobile Devices: a Macromodeling Approach 移动设备中天线- pcb耦合的快速评估:一种宏建模方法
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783423
S. Grivet-Talocia, M. Bandinu, F. Canavero, I. Kelander, P. Kotiranta
{"title":"Fast Assessment of Antenna-PCB Coupling in Mobile Devices: a Macromodeling Approach","authors":"S. Grivet-Talocia, M. Bandinu, F. Canavero, I. Kelander, P. Kotiranta","doi":"10.1109/EMCZUR.2009.4783423","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783423","url":null,"abstract":"This paper presents a fast procedure for the evaluation of electromagnetic coupling between antennas and Printed Circuit Board (PCB) traces on mobile devices. Starting from the geometrical description of the device, a single full-wave simulation is used to compute the electric fields at selected PCB locations. Then, the theory of field-excited transmission lines is used to compute the antenna-induced EMI coupling coefficients at the terminations of an arbitrarily routed PCB trace. The results are finally fed to a rational fitting algorithm for the generation of a broadband SPICE-compatible netlist. This netlist can be used in system-level circuit-based simulations for signal integrity assessments including antenna-induced EMI.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126409752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Monitoring of static magnetic field and variable electromagnetic fields in a large magnetic fusion plasma experimental facility 大型磁聚变等离子体实验装置静磁场和变电磁场的监测
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783489
T. Uda, M. Tanaka, T. Kawano, Y. Kamimura, J. Wang, O. Fujiwara
{"title":"Monitoring of static magnetic field and variable electromagnetic fields in a large magnetic fusion plasma experimental facility","authors":"T. Uda, M. Tanaka, T. Kawano, Y. Kamimura, J. Wang, O. Fujiwara","doi":"10.1109/EMCZUR.2009.4783489","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783489","url":null,"abstract":"The environmental static magnetic field and electromagnetic fields of various frequencies were measured around the Large Helical Device (LHD), a fusion plasma facility located in Japan. The LHD uses a superconducting magnet coil system and high-power plasma heating devices. Usually, leakage of the static magnetic field strength was less than 0.1 mT, but it varied according to the experimental conditions and protection of the operating coils. Leakage of the electric and magnetic fields from the Ion Cyclotron Range of Frequency (ICRF) plasma heating sources of 25-100 MHz were observed in bursts of either a short time or a long time according to particular plasma experiments, but the measured leaks were less than occupational regulation levels. Also, extremely low frequency (ELF) electromagnetic levels were measured near the magnetic coil power supply boxes, and high magnetic strength was observed. As a whole, the electromagnetic fields of the magnetic fusion experimental facility have various frequencies and time-dependent variable fields. Therefore, this facility should be precisely monitored to make proposal for a suitable safety management system.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129205473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Diffusion of Wireless Communication Technologies and Technological Lock-in 无线通信技术的扩散与技术锁定
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783450
Nicolas Rohner, R. Boutellier
{"title":"Diffusion of Wireless Communication Technologies and Technological Lock-in","authors":"Nicolas Rohner, R. Boutellier","doi":"10.1109/EMCZUR.2009.4783450","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783450","url":null,"abstract":"This paper analyses the diffusion of wireless technologies and its contribution to the value proposition of companies. Technological dependency on these key technologies was assessed by investigating emerging lock-in effects. The current situation was assessed with 21 case studies in Swiss Medium Sized Enterprises.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"2012 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127380202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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