2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)最新文献_第4页

Advanced analysis for separation of ambient and device under test emission for in-situ measurements 用于现场测量的环境和被测装置发射分离的先进分析

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/emcsi38923.2020.9191454

T. Gross, J. Medler

引用次数: 2

A New Tunable Damped Sine-like Waveform Generator For IEMI Applications 一种用于IEMI应用的新型可调谐阻尼正弦波形发生器

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191504

O. Izadi, R. K. Frazier, N. Altunyurt, Sahra Sedighsarvestani, D. Pommerenke, C. Hwang

引用次数: 0

A Study on Evaluation Board Requirements for Assessing Vulnerability of Cryptographic Modules to Side-Channel Attacks 评估加密模块侧信道攻击脆弱性的评估板需求研究

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191655

K. Iokibe, Tomonobu Kan, Y. Toyota

{"title":"A Study on Evaluation Board Requirements for Assessing Vulnerability of Cryptographic Modules to Side-Channel Attacks","authors":"K. Iokibe, Tomonobu Kan, Y. Toyota","doi":"10.1109/EMCSI38923.2020.9191655","DOIUrl":"https://doi.org/10.1109/EMCSI38923.2020.9191655","url":null,"abstract":"We studied for specifying requirements for side-channel attack (SCA) vulnerability evaluation boards. SCAs are a potential threat to cryptographic modules mounted in electronics products. Cryptographic modules are required to be evaluated in terms of vulnerability by using a test board. However, no reasonable requirements for such test boards have been specified. In this paper, we investigated the signal-to-noise ratio (SNR) of side-channel leakage and the transfer impedance from the side-channel leakage source to an observation port where side-channel leakage is probed in an evaluation board. We examined two models of existing SCA vulnerability evaluation boards that implemented the Advanced Encryption Standard (AES). Results suggest that cryptographic modules need to provide SNRs of side-channel leakage greater than 2 dB for implementations of the cryptographic algorithm involving no SCA countermeasures. It is also inferred that the transfer impedance needs to satisfy two conflicting requirements. The transfer impedance should be as large as possible, considering the ease of evaluation. At the same time, the transfer impedance needs to be low enough to suppress fluctuations in the power supply voltage and guarantee evaluation in a state equivalent to the actual operating state of the IC. Coaxial connectors would be recommended to be implemented for increasing the SNR and for reproducibility of measurements.","PeriodicalId":189322,"journal":{"name":"2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130394388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Dielectric Material and Foil Surface Roughness Properties Extraction Based on Single-ended Measurements and Phase Constant ($beta$) Fitting 基于单端测量和相位常数($beta$)拟合的介电材料和箔表面粗糙度提取

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191679

Shaohui Yong, V. Khilkevich, Srinath Penugonda, Xiao-Ding Cai, Qian Gao, Bidyut Sen, Han Gao, Douglas Yanagawa, Darja Padilla, S. Hinaga, J. Drewniak, J. Fan

{"title":"Dielectric Material and Foil Surface Roughness Properties Extraction Based on Single-ended Measurements and Phase Constant ($beta$) Fitting","authors":"Shaohui Yong, V. Khilkevich, Srinath Penugonda, Xiao-Ding Cai, Qian Gao, Bidyut Sen, Han Gao, Douglas Yanagawa, Darja Padilla, S. Hinaga, J. Drewniak, J. Fan","doi":"10.1109/EMCSI38923.2020.9191679","DOIUrl":"https://doi.org/10.1109/EMCSI38923.2020.9191679","url":null,"abstract":"Dielectric substrate and foil surface roughness properties of fabricated printed circuit boards (PCB) are important for high-speed channel design. Several stripline-based extraction methods have been developed to characterize dielectric relative permittivity ($varepsilon_{r}$), dielectric dissipation factor ($text{tan}delta$), and foil surface roughness correction factor ($K_{R}$) using measured S-parameters. However, the $text{tan}delta$ extraction still needs further improvement due to the difficulty in separation of dielectric and conductor loss. The authors found that the frequency-dependence of the stripline phase constant ($beta$) is helpful to determine the $text{tan}delta$ without introducing high sensitivity to foil surface roughness. By introducing a causal dielectric frequency-dependent model, $varepsilon_{r}$ and $text{tan}delta$ are extracted by fitting measured $beta$. The foil surface roughness property (correction factor $K_{R}$) is obtained using the conductor loss calculated by subtracting extracted dielectric loss from the total loss. To demonstrate the feasibility of the proposed method examples are provided using simulation data and fabricated PCB.","PeriodicalId":189322,"journal":{"name":"2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"132 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115901752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Measurement Investigation of MLCC Mounting Variation Impact on Acoustic Noise in Power Distribution Network MLCC安装变化对配电网噪声影响的测量研究

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191464

Yin Sun, Songping Wu, Jianmin Zhang, C. Hwang, Zhiping Yang

引用次数: 1

Effects of Various Via Patterns on Resonance and Crosstalk in High Speed Printed Circuit Boards 不同通孔模式对高速印刷电路板谐振串扰的影响

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191554

I. Park, Iftikhar Ahmed, D. Brunker, Pu Xie, Jayanthi Natarajan

引用次数: 1

A Cross-sectional Profile Based Model for Stripline Conductor Surface Roughness 基于截面轮廓的带状线导体表面粗糙度模型

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191620

Shaohui Yong, V. Khilkevich, Yuanzhuo Liu, Ruijie He, Yuandong Guo, Han Gao, S. Hinaga, Darja Padilla, Douglas Yanagawa, J. Fan, J. Drewniak

引用次数: 5

Wireless Communication Desense Due to Electromagnetic Shields 基于电磁屏蔽的无线通信

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191536

E. Elkhouly, M. Mohajer

引用次数: 0

Investigation and Mitigation of Radio Frequency Interference Caused by Weak Grounding of USB Type-C Receptacle Connector USB Type-C插座接头弱接地射频干扰的研究与缓解

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191587

Anfeng Huang, Xin Yan, Jingdong Sun, Qiaolei Huang, J. Fan, Songping Wu, Dave Zhang, Huan Liao, Shuai Jin, Zhiping Yang

引用次数: 3

Genetic Algorithm PDN Optimization based on Minimum Number of Decoupling Capacitors Applied to Arbitrary Target Impedance 任意目标阻抗下基于最小解耦电容数的遗传算法PDN优化

2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) Pub Date : 2020-07-01 DOI: 10.1109/EMCSI38923.2020.9191458

F. de Paulis, R. Cecchetti, C. Olivieri, Markus Buecker

{"title":"Genetic Algorithm PDN Optimization based on Minimum Number of Decoupling Capacitors Applied to Arbitrary Target Impedance","authors":"F. de Paulis, R. Cecchetti, C. Olivieri, Markus Buecker","doi":"10.1109/EMCSI38923.2020.9191458","DOIUrl":"https://doi.org/10.1109/EMCSI38923.2020.9191458","url":null,"abstract":"The current demand in Power Distribution Network (PDN) design is characterized by the accurate placement of decoupling capacitors and the minimization of their number aimed at cost saving. The paper proposes an optimization algorithm for accordingly placing decoupling capacitors one-by-one and iteratively evaluating the cost function of each PDN design solution. This allows the designer to identify the minimum number of decaps whenever the input impedance satisfies the target impedance requirements. The algorithm is based on the Genetic Algorithm accordingly adapted for the specific application of PDN design. It may involve the evaluation of the input impedance at multiple locations, representing either multiple ICs, as well as multiple power input areas/pins of the same IC. The validation of the developed optimization algorithm is carried out by applying it to a manufactured PCB and by employing typical (low inductance) decaps for PDN design. The optimization process led to a decap configuration that effectively takes into account the decap value, the parasitics inductance, and the decap location. An accurate experimental test further validates the optimized PDN.","PeriodicalId":189322,"journal":{"name":"2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128531191","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 13