2009 IEEE AUTOTESTCON最新文献_第4页

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314023

C. Gorringe, M. Seavey, T. Lopes

引用次数: 1

Reverse engineering for board test 板测试逆向工程

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314092

K. Carlson, Bernd Hauptmann

{"title":"Reverse engineering for board test","authors":"K. Carlson, Bernd Hauptmann","doi":"10.1109/AUTEST.2009.5314092","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314092","url":null,"abstract":"Historically, customers are faced with situations where CCA data is not available for a variety of reasons. Situations where Original Equipment Manufacturers (OEM) have been acquired by other OEMs or designs have been generated prior to the age of remote storage or escrow agents can result in the loss of data. Some companies, especially market segments such as depot repair, no longer have access to actual CAD or memory disks containing the original design files or source code of a particular CCA. With contract obligations up to 20 years what can a field repair shop or depot do to create documentation for a particular CCA? The answer lies in utilizing ATE Flying Probers particularly designed to ‘reverse engineer’ a CCA. This paper will go through the steps of how one premier OEM has added new features and techniques for creating a netlist, schematic, and ultimately a full ICT test program from nothing but a CCA. Using Seica's easy to use Viva wizard software, along with a series of powerful software techniques not previously marketed, and an Aerial double sided, multiple head, flying prober can reverse engineer a board in very little time. Reverse Engineering can assist the depots in documentation creation and full test functionality.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132760732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The future of automatic test system (ATS) brought by Cloud Computing 云计算带来的自动测试系统(ATS)的未来

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314089

L. Hu, M. Xiao

引用次数: 7

Key considerations in the design of an integrated diagnostics test facility 集成诊断测试设备设计中的关键考虑因素

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314038

M. Morgan, D. Dibartolomeo

引用次数: 0

Higher-level development and COTS hardware expand FPGA boundaries 更高层次的开发和COTS硬件扩展了FPGA的边界

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314035

Jamie Brettle, A. Kruger

{"title":"Higher-level development and COTS hardware expand FPGA boundaries","authors":"Jamie Brettle, A. Kruger","doi":"10.1109/AUTEST.2009.5314035","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314035","url":null,"abstract":"FPGA development tools can be complex, especially for users outside the digital design space. As a result of this complexity, industry is calling for software tools to increase efficiency of digital designers by abstracting the low-level details of FPGA programming. Most importantly, this process must close the growing gap between hardware and software design. New tools are emerging to help scientists and engineers use FPGAs without requiring the knowledge of low level Hardware Description Languages (HDLs) or board layout. These domain expert users can use prior knowledge in software design or graphical approaches to create complex systems that include Digital Signal Processing (DSP), Direct Memory Access (DMA), Digital Communication Protocols, and more all within an FPGA. With the ability to use C programming on the host and higher level tools for FPGA development on the target, software engineers can use FPGA technologies along with processors to run algorithms on the most efficient hardware target for test applications. This paper will cover examples of these tools and detail how higher-level abstraction, coupled with COTS hardware, can bring FPGA technology to new domains and users.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114582275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Remote Intelligent Diagnostics for Electronic Systems (RIDES) 电子系统远程智能诊断(RIDES)

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314062

M. Stora, P. Kalgren

{"title":"Remote Intelligent Diagnostics for Electronic Systems (RIDES)","authors":"M. Stora, P. Kalgren","doi":"10.1109/AUTEST.2009.5314062","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314062","url":null,"abstract":"The Remote Intelligent Diagnostics for Electronic Systems (RIDES) is a fusion of technologies developed by Impact Technologies, current USAF assets/infrastructure and COTS components. RIDES is a generic solution, configurable to any military or commercial air platform. The architecture as illustrated in Figure 1, is designed for maximum flexibility in its implementation either as: (1) roll-up maintenance aid with links to net-centric analysis access and expert support; (2) a minimal intrusive plug-in approach to the current platform configuration with wireless data logging and similar net-centric access; or as (3) designed-in integration platform upgrade having direct wireless links to the Forward Operating Locations (FOL) support base and net-centric interface. By implementing each of above approaches in a staged process, minimum investment is made to each platform, while incrementally validating the necessary analysis and data depository failure data, to satisfy the condition-based maintenance (CBM) objectives. The latter being the most difficult to realize, specifically where non-referenced and unstructured failure input data creates ineffective CBM models and guidance to the FOL. The platform aids supplied by RIDES provides those defined data references, beginning with Step 1 minimum data set, that is further expanded with each stage to support greater maintenance effectiveness. To lessening development, Impact has built RIDES on proven analysis tools as well as data depository collection, correlation, and computer generated guidance, used currently by the Navy and Army branches.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133862539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Lessons learned in implementing a net-centric diagnostic solution for the F/A-18 maintenance environment 为F/ a -18维护环境实施以网络为中心的诊断解决方案的经验教训

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314022

R. Shannon, T. Richardson, C. Koepping, A. Alwardt

{"title":"Lessons learned in implementing a net-centric diagnostic solution for the F/A-18 maintenance environment","authors":"R. Shannon, T. Richardson, C. Koepping, A. Alwardt","doi":"10.1109/AUTEST.2009.5314022","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314022","url":null,"abstract":"The AN/USM-681 Electro-Optics Pallet/Pod Tester (EOPT) system has been the main on-aircraft support equipment (SE) item used to test and troubleshoot the AN/ASD-10 Advanced Tactical Aerial Reconnaissance System (ATARS), the AN/ASD-12 Shared Reconnaissance Pod (SHARP), and the AN/ASQ-228 Advanced Targeting Forward Looking Infrared (ATFLIR) Pod. Because most of the technologies used by the EOPT are now obsolete, an SE item was needed to replace the EOPT system. As previously reported, developing a replacement for the EOPT was an opportunity to implement net-centric diagnostics within the F/A-18 automated maintenance environment (AME). This paper describes the second year of a two-year Technology Transition Initiative (TTI) in which the goals were to redesign the tester hardware to mitigate obsolescence by leveraging Local Area Network eXtensions for Instrumentation (LXI) technology, and to design a net-centric diagnostics framework (NCDF) to enable the bi-directional exchange of test data and maintenance data for smarter testing in both the on-aircraft and off-aircraft maintenance environments. This paper will focus on the practical realities of implementing a net-centric diagnostic solution in today's Navy/Marine Corps maintenance environment. This includes a report of the results of first article testing (FAT) as well as descriptions of the numerous design challenges, configuration management challenges, network challenges, and security challenges that were overcome, and those yet to be overcome, in order to move this technology from a working prototype to a fielded piece of support equipment.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133954367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Estimating accuracy and confidence interval of an Intelligent Diagnostic Reasoner System 智能诊断推理系统的精度和置信区间估计

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314019

Sreerupa Das, M. Harris

引用次数: 1

Pre-determining comparative tests and utilizing signal levels to perform accurate diagnostics 预先确定比较测试并利用信号电平进行准确诊断

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314091

L. Kirkland

{"title":"Pre-determining comparative tests and utilizing signal levels to perform accurate diagnostics","authors":"L. Kirkland","doi":"10.1109/AUTEST.2009.5314091","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314091","url":null,"abstract":"Standard diagnostic schemes don't do enough analysis to focus in on the actual cause of a test failure. Often measurements will be border-line on test sequences prior to an actual test failure. These border-line measurements can be used to aid in the determination of an actual fault. An actual fault and the associated test that should detect that fault can be deceiving. The specific test in question can pass but be right on the border-line. The failure might not show up in testing until a later test is performed. This later test assumes all the prior tests passed and therefore the circuitry associated with these prior tests is good. This is not necessarily the case if some of the output measurements prior to the actual failing test were right on the border-line. What can we do? Take advantage of the order in which the faults are simulated1. We should structure our TPSs such that a review of preliminary tests should be evaluated before the R/R component list is presented. The review of the preliminary test can be rather straight forward. We can look at signals that are within 8–10% of the lower or upper limit. We can then use an inter-related test scheme to evaluate the test(s) that can be associated with the actual failing test. This paper will use an example TPS and show how a test scheme and an evaluation scheme can be used to determine the PCOF. The paper will show actual measurements and how these measurements can be evaluated to determine the actual cause of a failure.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128770339","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Achieving Test Program Set transportability through interface design 通过接口设计实现测试程序集的可移植性

2009 IEEE AUTOTESTCON Pub Date : 2009-11-06 DOI: 10.1109/AUTEST.2009.5314002

Joseph E. Eckersley, W. Adams

{"title":"Achieving Test Program Set transportability through interface design","authors":"Joseph E. Eckersley, W. Adams","doi":"10.1109/AUTEST.2009.5314002","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314002","url":null,"abstract":"For decades, the automatic test community has worked to develop hardware standardization and interface protocols that aid in mitigating the impact of equipment obsolescence on the repair and maintenance mission. The traditional view of Test Program Set (TPS) transportability in this environment has always been one of migrating a legacy TPS to a new hardware architecture design born out of a need to replace aging technology or provide new test capability. The Department of Defense (DoD) has recognized the benefit of standardizing automatic test systems (ATS) through policy guidance whose intent is to drive the services to a common configuration test environment, thereby reducing life cycle sustainment costs for all DoD systems. Today, hardware standardization has advanced to the point that many ATS look and function very similar to one another. However, there are two major hurdles that continuously thwart our efforts to develop a standard core test system, the lack of a standard UUT interface and the lack of an open architecture software design that facilitates operations in any environment and on any test system architecture. Automatic Test Markup Language (ATML) provides promise with regards to the development of standardized test software interfaces. Developing a standard hardware configuration for all test requirements is ultimately achievable with the technology currently available today except for one simple but hugely significant hurdle, the cost involved in re-hosting the myriad of test program sets currently in existence. Therefore, any significant advance in common interface design has to take into account the need to minimize the impact to existing test program sets. This paper will seek to explore the various technological possibilities for overcoming the barriers to true TPS transportability that exist in today's automatic test community.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129070932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2