{"title":"ATML完成状态","authors":"C. Gorringe, M. Seavey, T. Lopes","doi":"10.1109/AUTEST.2009.5314023","DOIUrl":null,"url":null,"abstract":"The IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML (IEEE Std 1671™–2006) [1] and all its ‘dot’ standards have been published and are available from the IEEE.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"ATML completed status\",\"authors\":\"C. Gorringe, M. Seavey, T. Lopes\",\"doi\":\"10.1109/AUTEST.2009.5314023\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML (IEEE Std 1671™–2006) [1] and all its ‘dot’ standards have been published and are available from the IEEE.\",\"PeriodicalId\":187421,\"journal\":{\"name\":\"2009 IEEE AUTOTESTCON\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-11-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 IEEE AUTOTESTCON\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AUTEST.2009.5314023\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AUTEST.2009.5314023","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML (IEEE Std 1671™–2006) [1] and all its ‘dot’ standards have been published and are available from the IEEE.
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