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Broadband Reflection-Type Metasurface for OAM Antenna Design 面向OAM天线设计的宽带反射型元表面
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888592
Dong-Hao Han, Xun-Wang Zhao, Xing-Chang Wei
{"title":"Broadband Reflection-Type Metasurface for OAM Antenna Design","authors":"Dong-Hao Han, Xun-Wang Zhao, Xing-Chang Wei","doi":"10.1109/APEMC53576.2022.9888592","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888592","url":null,"abstract":"Generating orbital angular momentum (OAM) carried by vortex beams in a broad bandwidth is imperative for communication systems. In this paper, we proposed a low-profile and wide-band metasurface to generate high-purity vortex beams by combining the polarization converter and the resonant phase. In addition, it is applicable for Linearly Polarized (LP) incident wave and Circularly Polarized (CP) incident wave. The metasurface consisting of 10 × 10 elements is used to generate vortex beam with mode l = 1. Simulation results at 15 GHz verify the feasibility of this method, which paves a new way for generating vortex beams.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116096297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Investigation of Induced EFT Transient Noise and Effect on Chip and Package Level 诱发EFT瞬态噪声及其对芯片和封装水平的影响研究
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888343
Han-Nien Lin, Tzu-Hao Ho, Wan-Yu Syu, Yu-Ming Wei, Yueh-Hsun Lee, Qain-Yu Ye, Cheng-Hao Huang, Yuan-Fu Ku, Liang-Yang Lin, J. Lin
{"title":"Investigation of Induced EFT Transient Noise and Effect on Chip and Package Level","authors":"Han-Nien Lin, Tzu-Hao Ho, Wan-Yu Syu, Yu-Ming Wei, Yueh-Hsun Lee, Qain-Yu Ye, Cheng-Hao Huang, Yuan-Fu Ku, Liang-Yang Lin, J. Lin","doi":"10.1109/APEMC53576.2022.9888343","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888343","url":null,"abstract":"This paper investigates the noise induced from EFT Burst transient IEC61000-4-4 on the chip and package levels and analyzes its degradation effect. We first introduce the EFT Burst transient generator model previously established published with ANSYS Designer, which has later been adopted into ANSYS Electronics Desktop serving for immunity effect and protection measure analysis. We then describe how electromagnetic simulations can provide chip-level immunity analysis for IEC 62215-3. The analysis of EFT pulse propagation can be extended to package level with its impact on clock waveforms of different frequencies. With the help of established model, the residual transient noise energy due to normally found decoupling capacitor will be observed to show its effectiveness on noise filtering and the significant benefits to EMS protection. This study intends to provide an efficient simulation model to help IC and package designers enhancing their design capability against EFT disturbance.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123774847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Measurement-based Modeling of High Frequency Equivalent Circuit of Permanent Magnet Synchronous Motor of Electric Vehicle 基于测量的电动汽车永磁同步电机高频等效电路建模
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888573
Shuangji Yang, L. Zhai, Guixing Hu
{"title":"Measurement-based Modeling of High Frequency Equivalent Circuit of Permanent Magnet Synchronous Motor of Electric Vehicle","authors":"Shuangji Yang, L. Zhai, Guixing Hu","doi":"10.1109/APEMC53576.2022.9888573","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888573","url":null,"abstract":"The high-frequency circuit model of drive motor will affect the accuracy of electromagnetic interference (EMI) prediction of electric drive system. Therefore, a measurement-based high-frequency equivalent circuit modeling method for the permanent magnet synchronous motor (PMSM) of electric vehicles (EVs) is proposed. The common mode (CM) and differential mode (DM) impedance of star-connected PMSM is measured using a vector network analyzer (VNA). According to resonance points on the impedance curve, the circuit topology of motor winding is determined and parameters are calculated, the high-frequency CM and DM equivalent circuit models of PMSM are established respectively. There is a clear correlation between the components and geometry of the motor. The simulation and measurement comparison results verify the accuracy of the model. The influence of the motor impedance on the conducted EMI is analyzed through the system conducted emission test. Using this model, main components of PMSM that cause conducted emission to exceed the standard can be found, which provides a theoretical basis for suppressing conducted EMI exceeding the standard point.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"62 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114013821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An improved FDTD thin wire model for conductors with an asymmetrical cross section 非对称截面导体的改进FDTD细线模型
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888579
Binghao Li, Jianwei Cheng, Jiahui Yang, Kejie Huang, Dexu Zou, Shan Wang, Z. Hong
{"title":"An improved FDTD thin wire model for conductors with an asymmetrical cross section","authors":"Binghao Li, Jianwei Cheng, Jiahui Yang, Kejie Huang, Dexu Zou, Shan Wang, Z. Hong","doi":"10.1109/APEMC53576.2022.9888579","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888579","url":null,"abstract":"Large structural components may carry lightning current during a lightning strike. They could affect current distribution in wiring systems connected to electrical or electronic equipment. It is then necessary to model these wire structures correctly when performing lightning surge analysis. In this paper, an improved thin wire model for conductors with an asymmetrical cross section is investigated. The frequency-dependent loss is considered. The simulation results obtained by this model are validated with an analytical method. Three cross sectional shapes are tested. The cross section edges of these structures may not be necessarily in parallel to the FDTD grid lines. Good agreements are observed. It is found that the results of the proposed models generally have the errors of less than 0.5%.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122661435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Research On Ray Path Classification in Indoor Electromagnetic Environment 室内电磁环境下射线路径分类研究
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888504
Yuncheng Mo, Jian-Feng Gu, Luqi Duan, Zedian Wang, Wanchun Tang
{"title":"Research On Ray Path Classification in Indoor Electromagnetic Environment","authors":"Yuncheng Mo, Jian-Feng Gu, Luqi Duan, Zedian Wang, Wanchun Tang","doi":"10.1109/APEMC53576.2022.9888504","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888504","url":null,"abstract":"Indoor space is an indispensable part of the whole element scene of geospatial. The study of indoor electromagnetic environment distribution is gradually get more and more attention. Deterministic methods represented by frequency-domain ray tracing method (FD-RTM) are more and more widely used in indoor electromagnetic environment modeling and analysis. Different from analyzing the multipath effect in general, this paper proposes to classify the paths in the ray tracing method based on the image theory. The propagation paths of indoor electromagnetic wave are divided into five categories: direct path, transmission path, single-reflected path, double-reflected path and mixed path. The number of different categories of paths and their power contribution at the receiving point are quantitatively analyzed, and the difference of receiving power composition of different receiving points is studied.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131214937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Research for Electromagnetic Interference of Automotive Motor 汽车电机电磁干扰研究
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888618
T. Tan, T. Jiang
{"title":"Research for Electromagnetic Interference of Automotive Motor","authors":"T. Tan, T. Jiang","doi":"10.1109/APEMC53576.2022.9888618","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888618","url":null,"abstract":"Motors have been used in the automotive industry widely, the electromagnetic interference (EMI) problem, cause by motor systems, has become a serious trouble. In this paper, the EMI performance of an automotive motor is researched based on Simulation and test. The optimized parameters of schematic are proposed via simulation, and the reliability and accuracy of the simulation are verified by the validation test. The result shows that the product can get some improvement in the EMI test. In order to cover the problem of EMI, test result exceeded the emission limit in some frequency points, some simulation analysis performed, and the validation test, with the proposed component parameters in the actual project, performed. It is a real case of forward design with electromagnetic interference simulation, and the optimized component parameter is also available for other similar motor projects.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127933184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
NRZ and ENRZ SerDes System Comparison With Proposed GA Optimization 基于遗传算法优化的NRZ和ENRZ伺服系统比较
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888407
Zhifei Xu, S. Chen, A. Tajalli
{"title":"NRZ and ENRZ SerDes System Comparison With Proposed GA Optimization","authors":"Zhifei Xu, S. Chen, A. Tajalli","doi":"10.1109/APEMC53576.2022.9888407","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888407","url":null,"abstract":"This study compares the channel loss performance of the ENRZ high speed signaling technique against NRZ with equalization applied. A FIR CTLE linear SerDes equalization system is built up in Matlab. Genetic Algorithm is employed to locate the optimal SerDes settings with a much less time-consuming. The comparison shows that due to ENRZ algorithmic advantages, although ENRZ has a smaller eye height than NRZ when channel loss is low, its eye height exceeds that of NRZ when the channel loss goes beyond 12 dB in this study. Meanwhile, throughout the loss range, ENRZ gives a larger eye width than NRZ which is most advantageous especially with high channel loss.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115538127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electromagnetic Interference Attacks on GaN Half- Bridge Module GaN半桥模块的电磁干扰攻击
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888557
Fei Fan, Zhenyu Zhao, P. Tu, Huamin Jie, Minghai Dong, K. See
{"title":"Electromagnetic Interference Attacks on GaN Half- Bridge Module","authors":"Fei Fan, Zhenyu Zhao, P. Tu, Huamin Jie, Minghai Dong, K. See","doi":"10.1109/APEMC53576.2022.9888557","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888557","url":null,"abstract":"Electromagnetic interference (EMI) attacks on a GaN half-bridge module can falsely trigger the gate signal, leading to potential destructive damages. However, the false triggering issue and the corresponding protective measures are not well studied. This paper firstly presents the EMI attacks on a Gallium nitride (GaN) half-bridge module, demonstrating false triggering effects caused by low energy EM pulses. The susceptibility level of a commercially available GaN half-bridge is obtained over a frequency range from 100 kHz to 400 MHz, and it reveals that an attack at a lower frequency is prone to cause prominent interference effects.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114366807","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation of Conducted Electromagnetic Interference of Three-Level SiC Power Module 三电平SiC电源模块传导电磁干扰研究
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888586
Yingzhe Wu, Honglang Zhang, S. Yin, Shaofeng Lin, Tian Jiang, Chuang Bi, Hui Li, Yuhua Cheng
{"title":"Investigation of Conducted Electromagnetic Interference of Three-Level SiC Power Module","authors":"Yingzhe Wu, Honglang Zhang, S. Yin, Shaofeng Lin, Tian Jiang, Chuang Bi, Hui Li, Yuhua Cheng","doi":"10.1109/APEMC53576.2022.9888586","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888586","url":null,"abstract":"In this paper, a 1200-V/200-A three-level silicon carbide (SiC) power module with neutral point clamped (NPC) topology has been investigated in terms of electromagnetic interference (EMI). Compared with traditional two-level SiC modules, the three-level module can effectively alleviate voltage stress of the device, and ensure lower spectrum amplitude of the output terminal voltage below resonance frequency. However, the three-level module presents higher spectrum amplitude in high-frequency (HF) ranges (above 10 MHz) due to the aggravated switching ringings. As a result, RC snubber circuit is required to mitigate such ringings and reduce spectrum amplitude for three-level module. According to relative experimental results, it can be figured out that the three-level NPC power module combined with RC snubber circuit can suppress switching ringings, which is critical for reducing the level of conducted EMI.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115890815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
An Optimization Approach for Predicting Worst-Case Positions in EMI Final Measurement Based on Convolution Neural Network 基于卷积神经网络的电磁干扰最终测量中最坏情况位置预测优化方法
2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC) Pub Date : 2022-09-01 DOI: 10.1109/APEMC53576.2022.9888710
Hussam Elias, Ninovic Perez, H. Hirsch
{"title":"An Optimization Approach for Predicting Worst-Case Positions in EMI Final Measurement Based on Convolution Neural Network","authors":"Hussam Elias, Ninovic Perez, H. Hirsch","doi":"10.1109/APEMC53576.2022.9888710","DOIUrl":"https://doi.org/10.1109/APEMC53576.2022.9888710","url":null,"abstract":"In this paper, we present an improvement in existing Electromagnetic Interference (EMI) measurement according to the norm FCC§ 15.209 in the range 30MHz to 1GHz. A developed measurement tool and a convolution neural network(CNN) were used to reduce the required time to carry out the final measurement on critical frequencies by predicting the radiation emission and then determining the position azimuth of the turntable and the height of the antenna that meet the maximum radiated emission level. The neural network was trained using real EMI measurements which were performed in the Semi Anechoic Chamber(SAC) by Cetecom GmbH in Essen, Germany.","PeriodicalId":186847,"journal":{"name":"2022 Asia-Pacific International Symposium on Electromagnetic Compatibility (APEMC)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116284021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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