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Simulation study of lateral CEFT logic performance at 3 nm Node 横向CEFT逻辑性能在3nm节点的仿真研究
Microelectron. J. Pub Date : 2023-07-01 DOI: 10.2139/ssrn.4377529
Guanguo Wen, Qiang Long, Xinlong Shi, Ying Wang, Feng Liu, Huiyong Hu, Jincheng Zhang
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引用次数: 0
Filtering SIW phase shifter based on through quartz vias technology 基于石英通孔技术的滤波SIW移相器
Microelectron. J. Pub Date : 2023-06-01 DOI: 10.2139/ssrn.4368152
Nuo Liu, Xiaoxian Liu, Chenhui Fan
{"title":"Filtering SIW phase shifter based on through quartz vias technology","authors":"Nuo Liu, Xiaoxian Liu, Chenhui Fan","doi":"10.2139/ssrn.4368152","DOIUrl":"https://doi.org/10.2139/ssrn.4368152","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"106 1","pages":"105793"},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82176801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effect of bias conditions on transient anode current for quasi-double-sided silicon drift detector with high energy resolution 偏压条件对高能量分辨率准双面硅漂移检测器瞬态阳极电流的影响
Microelectron. J. Pub Date : 2023-06-01 DOI: 10.2139/ssrn.4359534
Longjie Wang, Wei Luo, Mingpeng Zhang, Jia Rui, Xing Li, X. Tian, Bolong Wang, Shuai Jiang, Jiawang Cheng, Xiaoping Ouyang
{"title":"Effect of bias conditions on transient anode current for quasi-double-sided silicon drift detector with high energy resolution","authors":"Longjie Wang, Wei Luo, Mingpeng Zhang, Jia Rui, Xing Li, X. Tian, Bolong Wang, Shuai Jiang, Jiawang Cheng, Xiaoping Ouyang","doi":"10.2139/ssrn.4359534","DOIUrl":"https://doi.org/10.2139/ssrn.4359534","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"27 1","pages":"105801"},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87126449","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Complexity reduction in multilevel speculative DFEs with unconstrained receiver response 具有无约束接收者响应的多层推测DFEs的复杂性降低
Microelectron. J. Pub Date : 2023-05-01 DOI: 10.2139/ssrn.4359540
Mohamed O. Abouzeid, T. Musah
{"title":"Complexity reduction in multilevel speculative DFEs with unconstrained receiver response","authors":"Mohamed O. Abouzeid, T. Musah","doi":"10.2139/ssrn.4359540","DOIUrl":"https://doi.org/10.2139/ssrn.4359540","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"31 1","pages":"105835"},"PeriodicalIF":0.0,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77569272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Considerations for SiC super junction MOSFET: On-resistance, gate structure, and oxide shield SiC超级结MOSFET的注意事项:导通电阻、栅极结构和氧化物屏蔽
Microelectron. J. Pub Date : 2023-05-01 DOI: 10.2139/ssrn.4399165
Sihang Liu, Mingmin Huang, Maojun Wang, Meng Zhang, Jin Wei
{"title":"Considerations for SiC super junction MOSFET: On-resistance, gate structure, and oxide shield","authors":"Sihang Liu, Mingmin Huang, Maojun Wang, Meng Zhang, Jin Wei","doi":"10.2139/ssrn.4399165","DOIUrl":"https://doi.org/10.2139/ssrn.4399165","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"53 1","pages":"105823"},"PeriodicalIF":0.0,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91373732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A foreground digital calibration algorithm for time-interleaved ADCs with low computational complexity 一种低计算复杂度的时间交错adc前景数字校准算法
Microelectron. J. Pub Date : 2023-04-01 DOI: 10.2139/ssrn.4359537
Song Wang, Xu Cheng, Zi-Yu Guo, J. Han
{"title":"A foreground digital calibration algorithm for time-interleaved ADCs with low computational complexity","authors":"Song Wang, Xu Cheng, Zi-Yu Guo, J. Han","doi":"10.2139/ssrn.4359537","DOIUrl":"https://doi.org/10.2139/ssrn.4359537","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"59 12","pages":"105778"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91502986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Convolutional neural network-based lightweight hardware IP core design for EEG epilepsy prediction 基于卷积神经网络的脑电癫痫预测轻量级硬件IP核设计
Microelectron. J. Pub Date : 2023-04-01 DOI: 10.2139/ssrn.4377527
Guangpeng Ai, Yuejun Zhang, Yongzhong Wen, Minghong Gu, Huihong Zhang, Pengjun Wang
{"title":"Convolutional neural network-based lightweight hardware IP core design for EEG epilepsy prediction","authors":"Guangpeng Ai, Yuejun Zhang, Yongzhong Wen, Minghong Gu, Huihong Zhang, Pengjun Wang","doi":"10.2139/ssrn.4377527","DOIUrl":"https://doi.org/10.2139/ssrn.4377527","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"21 1","pages":"105810"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81055484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Effects of 5 MeV proton irradiation on 4H-SiC lateral pMOSFETs on-state characteristics 5mev质子辐照对4H-SiC侧pmosfet导态特性的影响
Microelectron. J. Pub Date : 2023-04-01 DOI: 10.2139/ssrn.4380070
Y. Wang, Yanjing He, Xiaoyan Tang, Qingwen Song, Dongxun Li, Hao Yuan, Xiaowu Gong, Yuming Zhang
{"title":"Effects of 5 MeV proton irradiation on 4H-SiC lateral pMOSFETs on-state characteristics","authors":"Y. Wang, Yanjing He, Xiaoyan Tang, Qingwen Song, Dongxun Li, Hao Yuan, Xiaowu Gong, Yuming Zhang","doi":"10.2139/ssrn.4380070","DOIUrl":"https://doi.org/10.2139/ssrn.4380070","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"35 1","pages":"105799"},"PeriodicalIF":0.0,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76312432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Impact of thermal baking before radiation on the total dose response of bipolar device 辐射前热烘烤对双极器件总剂量响应的影响
Microelectron. J. Pub Date : 2023-03-01 DOI: 10.2139/ssrn.4377525
Wuying Ma, Xiaoping Ouyang, Hongxia Guo, Pei Li, Baoping He, Zujun Wang, Shilong Gou, Yuanyuan Xue
{"title":"Impact of thermal baking before radiation on the total dose response of bipolar device","authors":"Wuying Ma, Xiaoping Ouyang, Hongxia Guo, Pei Li, Baoping He, Zujun Wang, Shilong Gou, Yuanyuan Xue","doi":"10.2139/ssrn.4377525","DOIUrl":"https://doi.org/10.2139/ssrn.4377525","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"1 1","pages":"105764"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89622848","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Temperature-frequency boundary of cryogenic dynamic logic 低温动态逻辑的温度-频率边界
Microelectron. J. Pub Date : 2023-03-01 DOI: 10.2139/ssrn.4359538
Nurzhan Zhuldassov, E. Friedman
{"title":"Temperature-frequency boundary of cryogenic dynamic logic","authors":"Nurzhan Zhuldassov, E. Friedman","doi":"10.2139/ssrn.4359538","DOIUrl":"https://doi.org/10.2139/ssrn.4359538","url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"101 1","pages":"105763"},"PeriodicalIF":0.0,"publicationDate":"2023-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79925720","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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