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Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics最新文献

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Examination of the breakdown site in new and aged polyethylene insulated cables 新老聚乙烯绝缘电缆击穿部位的检验
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69162
R. Naybour
{"title":"Examination of the breakdown site in new and aged polyethylene insulated cables","authors":"R. Naybour","doi":"10.1109/ICSD.1989.69162","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69162","url":null,"abstract":"Discharges have been monitored and located in short lengths of cable tested to breakdown. These tests have been used to detect prebreakdown deterioration. The discharge location system is novel and has enabled limited energy breakdown sites to be located. Not all the breakdowns were initiated at the region of the inner screen boundary. In short-term tests to breakdown on new and dry aged cables at a maximum field of 30 MV/m there was no gradual increase in the discharge level above the detection limit of 1 pC. It appears possible that ageing with applied voltage at ambient temperature can improve the breakdown strength.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"237 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133695249","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
On the influence of storage time on the long-term breakdown characteristics of solid synthetic materials 贮存时间对固体合成材料长期击穿特性的影响
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69170
A. Sierota
{"title":"On the influence of storage time on the long-term breakdown characteristics of solid synthetic materials","authors":"A. Sierota","doi":"10.1109/ICSD.1989.69170","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69170","url":null,"abstract":"The author presents results of accelerated voltage tests performed with two model arrangements reflecting conditions of degradation typical for cast epoxy and extruded low-density polyethylene insulations, i.e. internal PD (partial discharge) in regular voids and ET (electrical treeing) from sharp points. As the intervals from the time at which the specimens had been manufactured until the execution of the tests varied from 2 days up to 10 years, the results reflected the influence of storage time on the life of the specimens. No significant variations of inception voltage with storage time was observed for the void arrangement; however they are clearly visible for the point arrangement. Due to the low sensitivity of the method of measurement used in the latter case, differences relevant to sample preparation remained undetected.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133949374","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Analysis of a dielectric measuring circuit using commercial software 用商业软件分析电介质测量电路
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69195
D.T.A. Blair, H. Abravesh
{"title":"Analysis of a dielectric measuring circuit using commercial software","authors":"D.T.A. Blair, H. Abravesh","doi":"10.1109/ICSD.1989.69195","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69195","url":null,"abstract":"The Microcap circuit-analysis package was used to study a measuring circuit when a step voltage is applied to a dielectric specimen in series with the circuit and an operational amplifier is employed to provide an output suitable for driving a recording device. The authors investigated the effects of connecting an operational amplifier into the circuit in two different modes: the voltage-follower mode and the current-voltage converter mode. The treatment of the offset voltage, bias current, and offset current is described. Results are given for the AD515L operational amplifier and the AD310/311 operational amplifier. The minimum acceptable amplifier performance is discussed.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132850945","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Time resolved studies of electronic transport in polymeric insulators 聚合物绝缘体中电子输运的时间分辨研究
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69151
M. Abkowitz
{"title":"Time resolved studies of electronic transport in polymeric insulators","authors":"M. Abkowitz","doi":"10.1109/ICSD.1989.69151","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69151","url":null,"abstract":"Transport in a wide variety of glassy polymeric insulators has been found to be characterized by a convoluted yet familiar pattern of electric field and temperature dependence below T/sub g/, the glass transition temperature, and by a relatively abrupt change in temperature dependence near T/sub g/. Though diverse, all of these glassy dielectrics share the feature that electronic transport is mediated by field-assisted thermally stimulated emission from localized states, a process which remains incompletely understood. By proper 'molecular engineering' it has become possible to design dielectric polymers which exhibit efficient and completely trap-free transport, a requisite feature for practical applications to electrophotography. The importance of the mechanistic understanding derived from analysis of time-resolved injection in the historical development of viable organic-polymer-based photoconductors is discussed. Three materials systems are described: (1) poly(N-vinylcarbazole), PVK; (2) molecularly doped polymers; and (3) polysilanes and polygermanes.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"180 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133340176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Current imbalance and charge build-up on insulators in AC air coronas 交流空气电晕中绝缘子上的电流不平衡和电荷积聚
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69154
K. Amara, A. Goldman, M. Goldman, R. S. Sigmond
{"title":"Current imbalance and charge build-up on insulators in AC air coronas","authors":"K. Amara, A. Goldman, M. Goldman, R. S. Sigmond","doi":"10.1109/ICSD.1989.69154","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69154","url":null,"abstract":"By replacing an AC-corona-stressed insulator surface by a metal electrode subjected to superposed AC and DC corona, the authors studied the processes responsible for the DC charging of insulators. A main result is that the charging is critically dependent on corona processes at the high-field electrode. A corona electrode that gives positive streamers will give substantially less net charge than an electrode burning in the positive glow (Hermstein corona) mode. However, the streamers may do other damage to insulator surfaces. The balance between the synchronous and impulse current components is found to be the decisive factor in determining the charging of corona-exposed dielectric surfaces.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125805148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Digital computer system for measurement of partial discharges in insulation structures 绝缘结构局部放电测量用数字计算机系统
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69263
E. Gulski, F. H. Kreuger
{"title":"Digital computer system for measurement of partial discharges in insulation structures","authors":"E. Gulski, F. H. Kreuger","doi":"10.1109/ICSD.1989.69263","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69263","url":null,"abstract":"A digital discharge analyzer has been built for continuous and multiparameter registration of partial discharges. The measurements indicate that there are significant differences in the behavior of different discharge parameters for different voids. The registration of phase-position quantities is shown to give more information than just the registration of discharge magnitude versus time. Statistical analysis is shown to be a good tool for describing changes of the phase-position quantities. It is also demonstrated that skewness and kurtosis can discriminate among flat, narrow, and square cylindrical voids.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122263182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Effects of plasma treatment on high-field conduction and breakdown of poly-p-xylylene thin films 等离子体处理对聚-对-二甲苯薄膜高场导电和击穿的影响
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69224
T. Mizutani, T. Mori, M. Ieda
{"title":"Effects of plasma treatment on high-field conduction and breakdown of poly-p-xylylene thin films","authors":"T. Mizutani, T. Mori, M. Ieda","doi":"10.1109/ICSD.1989.69224","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69224","url":null,"abstract":"The high-field behavior and breakdown of poly-p-xylylene (PPX) thin films into which defects were introduced by treatment in an Ar plasma were studied. Some of the defects act as scattering or trapping centers. The high-field current in the film was suppressed considerably by the plasma treatment. The plasma treatment increased the breakdown strength of PPX from 7 MV/cm to 10 MV/cm. A comparison between results for poly-2-chloro-p-xylene (PCPX) and the plasma-treated PPX films revealed that some of the defects introduced by the treatment suppressed the high-field current more effectively than the chlorine atoms in PCPX. Moreover, the plasma treatment raised the breakdown strength of PPX without a large increase in dielectric loss.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125024373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
New exact computer analysis of the TSC curve by the asymptotic estimation method and an approach to the electrical conduction of organic crystals 用渐近估计方法对TSC曲线进行了新的精确计算机分析，并对有机晶体的电导率进行了探讨
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69264
S. Maeta, T. Akiyama, F. Yoshida
{"title":"New exact computer analysis of the TSC curve by the asymptotic estimation method and an approach to the electrical conduction of organic crystals","authors":"S. Maeta, T. Akiyama, F. Yoshida","doi":"10.1109/ICSD.1989.69264","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69264","url":null,"abstract":"Experimental results were obtained for a naphthacene-doped anthracene single crystal excited by Q-switched ruby laser pulses. Two representative TSC (thermally stimulated current) curves were obtained. The curves were analyzed by an asymptotic estimation method, involving the autoseparation of the TSC curve and the exact estimation of the energy depth of the carrier trap from the separated curve.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129932952","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Abnormal electrical conduction phenomena in zinc oxide ceramics 氧化锌陶瓷中的异常导电现象
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69211
Jae-Hyung Lee, Sang-Seok Lee, K. Lim, Bong-Heup Kim
{"title":"Abnormal electrical conduction phenomena in zinc oxide ceramics","authors":"Jae-Hyung Lee, Sang-Seok Lee, K. Lim, Bong-Heup Kim","doi":"10.1109/ICSD.1989.69211","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69211","url":null,"abstract":"The transient response of zinc oxide ceramics with additives such as Bi/sub 2/O/sub 3/, Sb/sub 2/O/sub 3/, and MnO/sub 2/ was investigated. A microstructural study suggests that all the ZnO grains are surrounded by an intergranular layer. The voltage-current characteristics measured at 20 degrees C and 60 degrees C are shown. Several of the characteristic phenomena observed, such as current oscillation and negative differential resistance, are discussed.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121158933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tree propagation and the effects of barriers 树木繁殖和屏障的影响
Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69255
D. Auckland, S. Kabir, B.R. Varlow
{"title":"Tree propagation and the effects of barriers","authors":"D. Auckland, S. Kabir, B.R. Varlow","doi":"10.1109/ICSD.1989.69255","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69255","url":null,"abstract":"The authors describe impulse experiments using alternating voltages and the explosion effect simulated to create synthetic tree channels. It is confirmed that trees propagate by fast fracture triggered by the explosive effect of localized intrinsic breakdown at points of electrical stress concentration. The interaction between barriers and advancing tree channels is determined by the barrier's adhesive bond to the surrounding matrix, its fracture toughness, and its melting point. Results are presented for various types of barrier cast in clear polyester resin.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124385508","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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