2011 3rd International Conference on Electronics Computer Technology最新文献_第6页

Impact of gate engineering on double gate MOSFETs using high-k dielectrics 栅极工程对采用高k介电体的双栅极mosfet的影响

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941554

Nirmal, Vijaya Kumar, Divya Mary Thomas, K. Shruti, P. C. Samuel, Mohan Kumar

{"title":"Impact of gate engineering on double gate MOSFETs using high-k dielectrics","authors":"Nirmal, Vijaya Kumar, Divya Mary Thomas, K. Shruti, P. C. Samuel, Mohan Kumar","doi":"10.1109/ICECTECH.2011.5941554","DOIUrl":"https://doi.org/10.1109/ICECTECH.2011.5941554","url":null,"abstract":"This paper analyses the impact of gate engineering on the performance of MOSFETs for system-on-chip applications with high K dielectrics. The performance is analysed for parameters such as electrostatic surface potential, transconductance using a 2D device simulator ISE TCAD. Equivalent Oxide Thickness (EOT) of gate oxide can be reduced by the usage of high K dielectric materials. The gate engineering technique used here is the dual metal gate technology Due to their excellent scalability and better immunity to short channel effects, dual material double-gate (DM DG) MOSFETs are being easily assessed for CMOS applications beyond the 70 nm of the SIA roadmap 2008. Gate engineered devices show an improvement in the analog performance for different high k dielectrics. The gate engineered device show an increase of drain current by about 5% in the subthreshold region and a 3% increase in transconductance in strong inversion. For analog applications, importance is given to the subthreshold regime as CMOS circuits operated in this regime are very much attractive for ultralow-power high-gain performances.","PeriodicalId":184011,"journal":{"name":"2011 3rd International Conference on Electronics Computer Technology","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130465786","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 7

Maintaining the secrecy in visual cryptography schemes 视觉密码方案的保密性

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941910

A. Divya, K. Ramalakshmi

引用次数: 4

Automated generation of test cases from output domain of an embedded system using Genetic algorithms 使用遗传算法从嵌入式系统的输出域自动生成测试用例

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941989

Chandra Prakash Vudatha, Sateesh Nalliboena, Sastry K. R. Jammalamadaka, B. K. K. Duvvuri, L. S. S. Reddy

{"title":"Automated generation of test cases from output domain of an embedded system using Genetic algorithms","authors":"Chandra Prakash Vudatha, Sateesh Nalliboena, Sastry K. R. Jammalamadaka, B. K. K. Duvvuri, L. S. S. Reddy","doi":"10.1109/ICECTECH.2011.5941989","DOIUrl":"https://doi.org/10.1109/ICECTECH.2011.5941989","url":null,"abstract":"A primary issue in black-box testing is how to generate adequate test cases from input domain of the system under test on the basis of user's requirement specification. However, for some types of systems including embedded systems, developing test cases from output domain is more suitable than developing from input domain, especially, when the output domain is smaller. This approach ensures better reliability of the system under test. In this paper, the authors present a new approach to automate the generation of test cases from output domain of a pilot project “Temperature Monitoring and Controlling of Nuclear Reactor System” (TMCNRS) which is an embedded system developed using modified Cleanroom Software Engineering methodology. An Automated Test Case Generator (ATCG) that uses Genetic algorithms (GAs) extensively and generates test cases from output domain is proposed. The ATCG generates test cases which are useful to conduct pseudo — exhaustive testing to detect single, double and several multimode faults in the system. The generator considers most of the combinations of outputs, and finds the corresponding inputs while optimizing the number of test cases generated. In order to investigate the effectiveness of this approach, test cases were generated by ATCG and the tests were conducted on the target embedded system at a minimum cost and time. Experimental results show that this approach is very promising.","PeriodicalId":184011,"journal":{"name":"2011 3rd International Conference on Electronics Computer Technology","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128945071","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 28

Efficient techniques for denoising of speckle and highly corrupted impulse noise images 斑点和高度损坏的脉冲噪声图像去噪的有效技术

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941748

D. Santosh, V. N. L. Kumar, D. Ramesh, P. Prasad

引用次数: 23

Pairwise-consistency checking of basic cardinal direction constraints 基本基本方向约束的成对一致性检验

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941720

Wei-Zhi Sun, Tingxin Ma, Jihong Ouyang, Da-you Liu

引用次数: 1

A novel approach to prune mined association rules in large databases 一种新的大型数据库关联规则剪枝方法

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5942031

D. Narmadha, G. NaveenSundar, S. Geetha

引用次数: 10

A confidence measure based — Score fusion technique to integrate MFCC and Pitch for speaker verification 一种基于置信度的分数融合技术，将MFCC和Pitch融合到说话者验证中

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941763

S. Pandiaraj, H. N. R. Keziah, D. Vinothini, L. Gloria, K. R. S. Kumar

{"title":"A confidence measure based — Score fusion technique to integrate MFCC and Pitch for speaker verification","authors":"S. Pandiaraj, H. N. R. Keziah, D. Vinothini, L. Gloria, K. R. S. Kumar","doi":"10.1109/ICECTECH.2011.5941763","DOIUrl":"https://doi.org/10.1109/ICECTECH.2011.5941763","url":null,"abstract":"The objective of this paper is to evaluate the effectiveness of complementary speech features extracted from a speaker for verification. Traditionally, speaker verification systems use a single feature for representing speaker-specific information. In this work extraction of segmental and suprasegmental features is proposed which shows a significant improvement in the performance of verification. The size and shape assumed by the vocal tract while producing various sound units is generated by Mel Frequency Cepstral Coefficient (MFCC) which is a segmental feature. Pitch information contributes to the uniqueness of the speaker's voice at the suprasegmental feature which spans for a longer duration than the frames used for short term spectral analysis. The scores obtained using MFCC and Pitch based systems are fused using a confidence measure. Speaker Verification experiments were carried out on the CHAINS corpus database. The equal error rate (EER) obtained for the MFCC system is 12.8%. The MFCC system outperforms the system based on Pitch alone. The integration MFCC and Pitch for speaker verification using a confidence measure gives an EER of 11.2%.","PeriodicalId":184011,"journal":{"name":"2011 3rd International Conference on Electronics Computer Technology","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132988356","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

A novel approach of test case generation for concurrent systems using UML Sequence Diagram 一种利用UML序列图生成并发系统测试用例的新方法

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941581

Monalisha Khandai, A. Acharya, D. Mohapatra

引用次数: 47

Edge detection: A statistical approach 边缘检测:一种统计方法

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941707

A. Halder, Nilabha Chatterjee, Arindam Kar, Swastik Pal, Soumajit Pramanik

引用次数: 20

Analysis of power spectral density and development of an adaptive algorithm for filtering wind driven ambient noise in shallow water 功率谱密度分析及自适应滤波算法的发展

2011 3rd International Conference on Electronics Computer Technology Pub Date : 2011-04-08 DOI: 10.1109/ICECTECH.2011.5941879

R. R. Kumar, S. Murugan, V. Natarajan, S. Radha

引用次数: 4