Automated generation of test cases from output domain of an embedded system using Genetic algorithms

Abstract

A primary issue in black-box testing is how to generate adequate test cases from input domain of the system under test on the basis of user's requirement specification. However, for some types of systems including embedded systems, developing test cases from output domain is more suitable than developing from input domain, especially, when the output domain is smaller. This approach ensures better reliability of the system under test. In this paper, the authors present a new approach to automate the generation of test cases from output domain of a pilot project “Temperature Monitoring and Controlling of Nuclear Reactor System” (TMCNRS) which is an embedded system developed using modified Cleanroom Software Engineering methodology. An Automated Test Case Generator (ATCG) that uses Genetic algorithms (GAs) extensively and generates test cases from output domain is proposed. The ATCG generates test cases which are useful to conduct pseudo — exhaustive testing to detect single, double and several multimode faults in the system. The generator considers most of the combinations of outputs, and finds the corresponding inputs while optimizing the number of test cases generated. In order to investigate the effectiveness of this approach, test cases were generated by ATCG and the tests were conducted on the target embedded system at a minimum cost and time. Experimental results show that this approach is very promising.