Patrick L. Theofanis, Oleg Tazetdinov
{"title":"Monte Carlo EUV stochastic simulator (MESS): a chemistry-oriented lithography simulator","authors":"Patrick L. Theofanis, Oleg Tazetdinov","doi":"10.1117/12.2617292","DOIUrl":"https://doi.org/10.1117/12.2617292","url":null,"abstract":"","PeriodicalId":181376,"journal":{"name":"Optical and EUV Nanolithography XXXV","volume":"10 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116735641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2