{"title":"Approach to reduce PCB distortion after heat treatment for soldering with reflow process","authors":"V. Tsenev, V. Videkov","doi":"10.1109/ET50336.2020.9238213","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238213","url":null,"abstract":"The report presents approach to reduce PCB distortion after heat treatment for soldering using a reflow process. The influence of the temperature profile at different heating of the lower side of the board has been studied and an optimal one has been established, in which the distortion of the boards is minimal and there is no danger of creating defects on the lower side. Conclusions are made when this approach can be used and how a secure temperature profile can be achieved for minimal board distortion after soldering with a reflow process.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"abs/1512.03088 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121522524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reliability estimation of transistor switches in push-pull DC/DC hard switching converter","authors":"P. Prodanov, D. Dankov","doi":"10.1109/ET50336.2020.9238269","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238269","url":null,"abstract":"Power semiconductors have a significant importance to reliability of electronic power convertors. In recent years there are an elements with higher parameters, high efficiency and low power losses. This requirements also can be applied into the power converters. This can be used to determine their reliability parameters and its estimation. Probability of failure-free operation depends on type of elements, their electrical and thermal modes, quality and environmental conditions. In this paper are consider reliability parameters of three type of power semiconductors – SiC MOSFET, “classic” MOSFET and IGBT transistors.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127082183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Study On Information Security Management","authors":"Georgi Tsochev, I. Stankov","doi":"10.1109/ET50336.2020.9238331","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238331","url":null,"abstract":"Cybersecurity is the only defense in one of the longest wars the world has ever known. Battles are fought daily against nation states, organized crime, thieves, terrorists and bored but smart children. This war escalates every day as the battlefield grows. The main focus of the IT group is to ensure efficient and fast processing of information, while the main goal of the information security group is to ensure confidentiality, integrity and availability of information. The paper presents a review of information security management and the main principles in this field.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129034738","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Ciocia, P. Di Leo, Stefania Fichera, Gabriele Malgaroli, A. Russo, F. Spertino, S. Tzanova, Bolormaa Dalanbayar
{"title":"Innovative Laboratories for Teaching on Photovoltaic Generation in Higher Education","authors":"A. Ciocia, P. Di Leo, Stefania Fichera, Gabriele Malgaroli, A. Russo, F. Spertino, S. Tzanova, Bolormaa Dalanbayar","doi":"10.1109/ET50336.2020.9238310","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238310","url":null,"abstract":"The production of energy from Photovoltaic technology is becoming more and more relevant. Therefore, it is essential that academic world focuses attention on this topic in order to properly teach and transmit knowledge, skills and abilities. These ones are very useful in work activities. The academic course “Photovoltaic Power Generation” aims to better explain theoretical aspects by practical activities which require the implementation of innovative laboratories for learning. This paper presents the guidelines for replication of laboratory practices (twin labs), already offered to Italian students, in the context of the project EU-MONG.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127883393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Correlated Multiple Sampling Techniques for Sensor Signal Conditioning","authors":"D. Dobrev, T. Neycheva","doi":"10.1109/ET50336.2020.9238159","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238159","url":null,"abstract":"Correlated Double Sampling (CDS) is a widely used technique in sensor signal conditioning. It effectively cancels offset and low-frequency (flicker) noise. CDS is a discrete time signal processing technique, implemented with Switched Capacitor (SC) circuits or after ADC with a Digital Signal Processing (DSP) algorithm. This paper describes a simple approach wherein the CDS technique is extended to Correlated Multiple Sampling (CMS) techniques, and with the price of processing of more samples, the new CMS techniques greatly improves the amplifier offset and flicker noise suppression.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126811291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Power Optimization of LoRaWAN Wireless End Sensor Node","authors":"Stanislav Asenov, D. Tokmakov","doi":"10.1109/ET50336.2020.9238204","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238204","url":null,"abstract":"The paper presents a method for optimizing the power consumption of the LoraWAN sensor node using the ESP32 microcontroller. We use an Espressif ESP32 microcontroller, a BMP280 pressure sensor, and a SX1276 LoRaWAN transmitter. By using the Ultra-Low-Power Coprocessor, included in the structure on the ESP32 microcontroller, to make measurements, instead of Xtensa® 32-bit LX6 microprocessor, we can reduce microcontroller power consumption. Optimization of the power consumption increases battery life and sensor node autonomous operations for years. We use the Wi-Fi interface of the microcontroller to access the web server of ESP32 to configure the parameters of the wireless sensor node.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134600052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 50MHz-3100MHz DDS based Frequency Synthesizer Module","authors":"H. Aniktar","doi":"10.1109/ET50336.2020.9238241","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238241","url":null,"abstract":"The Software Defined Radio (SDR) concept has attracted considerable interest from research community, industry and military in recent years. Multi-mode, multi-band or software defined radio terminals enable the user to have access to different systems with a single terminal. Realization of multiband, multi-mode, or software defined radio terminals requires technical progress in several areas. The design of programmable, tunable and/or wideband radio frequency (RF) front-end components carries extreme importance for the realization of such a SDR terminal. This proposal shows a DDS (Direct Digital Synthesizer) based synthesizer design which has capability of high tuning speed (17us), low resolution (1Hz), superior phase noise performance, moderate spurious performance and wide tuning range (50MHz-3100MHz).","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133681565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Models in COMSOL of Attenuation of Sonic Crystal Noise Barrier depend on Different Form","authors":"E. Gieva, I. Ruskova","doi":"10.1109/ET50336.2020.9238232","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238232","url":null,"abstract":"In the present publication we have designed models in COMSOL of noise barriers. The influence of the attenuation of the different geometric shapes of the barriers at different frequencies is considered and analysed. The influence of shape at different frequencies is very important parameter and can be decisive. Depending on the application, based on the performed analyses and the obtained results, the most suitable noise barrier, depending on the application, can be selected.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116112638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An Extended Analysis of Reliability Test Data","authors":"T. Papanchev, J. Garipova","doi":"10.1109/ET50336.2020.9238212","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238212","url":null,"abstract":"This paper discusses the possibilities for detecting and evaluating additional information on the influence of various stressors on electronic devices when data from two-sreess factors accelerated tests are collected. Two approaches are considered - standard, with one fixed stress factor, and estimation by severity of impact by solving partial differential equations.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124076092","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IoT solution for monitoring of data in the visible and infrared spectrum","authors":"V. Tsvetkov, G. Spasov, G. Petrova","doi":"10.1109/ET50336.2020.9238289","DOIUrl":"https://doi.org/10.1109/ET50336.2020.9238289","url":null,"abstract":"In this paper a cost-effective combination between infrared and visible camera for thermal imaging applicable in Ambient Assisted Living (AAL) and object monitoring in smart homes is presented and demonstrated. In recent years, we have witnessed a rapid surge in assisted living technologies. Internet of Things (IoT) is a platform where every day devices become smarter, everyday processing becomes intelligent, and every day communication becomes informative. Our implementation is based on four layers IoT architecture. The user interface provides an option for manual adjustment of the image alignment from infrared and visible cameras. Apart from manual procedure, a procedure for the automatic alignment of the images of the both cameras have been developed. The time necessary for the image data processing by the microcontroller which gathers data from the sensors or by the gateway device is estimated.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116052298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}