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Comments on the Ey + 0.45 eV Quenched-in Level in Silicon 硅中Ey + 0.45 eV淬火水平的评述
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-049
D. Ioannou
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引用次数: 0
Study of Boron Implantation in Ag-Si Layer Structures Ag-Si层结构中硼的注入研究
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-037
L. Pelikán, V. Rybka, P. Krejčí, V. Hnatowicz, J. Kvítek
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引用次数: 1
Phase Transformations in Amorphous Zr-Ni Alloys 非晶Zr-Ni合金的相变
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-014
H. Swijgenhoven, L. Stals, K. Buschow
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引用次数: 0
Order-Disorder Transitions in Substitutional Solid Solutions2 取代固溶体中的有序-无序转变[j]
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-001
F. Reynaud
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引用次数: 0
Thermal Study of cx-LilO^ Single Crystals below Room Temperature 室温下cx-LilO^单晶的热研究
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-047
J. Cerro, S. Ramos, J. Isidoro
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引用次数: 0
Hydrogen Passivation of y-Induced Point Defects in Silicon 硅中y诱导点缺陷的氢钝化
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-058
S. Pearton
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引用次数: 0
Deformation and Slip Behaviour of Cold-Worked Molybdenum Single Crystals at Elevated Temperature 冷加工钼单晶在高温下的变形和滑移行为
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-022
A. Luft, C. Ritschel
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引用次数: 1
A Transmission Electron Microscope Study of the Chalcocite-Djurleite Transformation in Topotactically Grown Thin Films of Cu„.S 铜薄膜中黄铜矿-珠雷岩相变的透射电镜研究。年代
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-030
J. Echigoya, J. Edington
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引用次数: 0
Thermal Spectroscopy of Impurity Levels by Optical Absorption in Bulk G a As 用光学吸收法研究体中杂质能级的热光谱
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-056
J. Fillard, J. Bonnafé, M. Castagne
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引用次数: 0
Investigation of Refractive Index Gratings in Electro-Optic Crystals by a Microscope Technique 电光晶体折射率光栅的显微镜研究
July 16 Pub Date : 1982-12-31 DOI: 10.1515/9783112495063-042
R. Rupp, E. Krätzig
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引用次数: 0
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