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Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering最新文献

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Session details: Keynote address 会议详情:主题演讲
Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering Pub Date : 2006-09-21 DOI: 10.1145/3245559
Guilherme Travassos
{"title":"Session details: Keynote address","authors":"Guilherme Travassos","doi":"10.1145/3245559","DOIUrl":"https://doi.org/10.1145/3245559","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117161044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Cost and effort estimation 会话细节:成本和工作量估算
Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering Pub Date : 2006-09-21 DOI: 10.1145/3245562
Martin Höst
{"title":"Session details: Cost and effort estimation","authors":"Martin Höst","doi":"10.1145/3245562","DOIUrl":"https://doi.org/10.1145/3245562","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128920804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Research methodology 会议细节:研究方法
Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering Pub Date : 2006-09-21 DOI: 10.1145/3245561
Andreas Jedlitschka
{"title":"Session details: Research methodology","authors":"Andreas Jedlitschka","doi":"10.1145/3245561","DOIUrl":"https://doi.org/10.1145/3245561","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122277270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Test-driven development 会话细节:测试驱动的开发
Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering Pub Date : 2006-09-21 DOI: 10.1145/3245573
L. Williams
{"title":"Session details: Test-driven development","authors":"L. Williams","doi":"10.1145/3245573","DOIUrl":"https://doi.org/10.1145/3245573","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"145 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133651135","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Metrics and measurement 会话细节:度量和度量
Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering Pub Date : 2006-09-21 DOI: 10.1145/3245571
M. Oivo
{"title":"Session details: Metrics and measurement","authors":"M. Oivo","doi":"10.1145/3245571","DOIUrl":"https://doi.org/10.1145/3245571","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124043486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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