Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering最新文献

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Session details: Defect detection 会话细节:缺陷检测
G. Cantone
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引用次数: 0
Session details: Defect classification 会话细节:缺陷分类
N. Juristo
{"title":"Session details: Defect classification","authors":"N. Juristo","doi":"10.1145/3245572","DOIUrl":"https://doi.org/10.1145/3245572","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126594868","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Software testing 会话细节:软件测试
M. Morisio
{"title":"Session details: Software testing","authors":"M. Morisio","doi":"10.1145/3245569","DOIUrl":"https://doi.org/10.1145/3245569","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134231595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Software operation and evolution 会议细节:软件的运行和演变
M. Zelkowitz
{"title":"Session details: Software operation and evolution","authors":"M. Zelkowitz","doi":"10.1145/3245567","DOIUrl":"https://doi.org/10.1145/3245567","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131120203","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Software development and developers 会议细节:软件开发和开发人员
J. Kontio
{"title":"Session details: Software development and developers","authors":"J. Kontio","doi":"10.1145/3245568","DOIUrl":"https://doi.org/10.1145/3245568","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114592029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Faults and failures 会话详细信息:故障和失败
H. Erdogmus
{"title":"Session details: Faults and failures","authors":"H. Erdogmus","doi":"10.1145/3245560","DOIUrl":"https://doi.org/10.1145/3245560","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133078789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Comparing defect detection techniques 会话细节:比较缺陷检测技术
S. Vegas
{"title":"Session details: Comparing defect detection techniques","authors":"S. Vegas","doi":"10.1145/3245563","DOIUrl":"https://doi.org/10.1145/3245563","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116796326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Software projects 会议细节:软件项目
M. T. Baldassarre
{"title":"Session details: Software projects","authors":"M. T. Baldassarre","doi":"10.1145/3245565","DOIUrl":"https://doi.org/10.1145/3245565","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127424639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Software design 会议细节:软件设计
S. Biffl
{"title":"Session details: Software design","authors":"S. Biffl","doi":"10.1145/3245564","DOIUrl":"https://doi.org/10.1145/3245564","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121147757","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session details: Architecture and refactoring 会话细节:架构和重构
Guenther Ruhe
{"title":"Session details: Architecture and refactoring","authors":"Guenther Ruhe","doi":"10.1145/3245570","DOIUrl":"https://doi.org/10.1145/3245570","url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126342019","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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