{"title":"Session details: Metrics and measurement","authors":"M. Oivo","doi":"10.1145/3245571","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":177445,"journal":{"name":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2006 ACM/IEEE international symposium on Empirical software engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3245571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}