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2019 International Conference on Applied Electronics (AE)最新文献

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Simulating ADAS Sensors, their Placement and Environment 模拟ADAS传感器，其位置和环境
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/ae.2019.8867002
J. Rýmus
{"title":"Simulating ADAS Sensors, their Placement and Environment","authors":"J. Rýmus","doi":"10.23919/ae.2019.8867002","DOIUrl":"https://doi.org/10.23919/ae.2019.8867002","url":null,"abstract":"With the advent of autonomous vehicles, carmakers are increasingly involved in developments of Active Safety and Advanced Driver Assistance Systems. Those systems are part of complex electronic equipment, that – with its sensors, microcontrollers, cable harnesses – will represent up to 40% of the total manufacturing cost. Today, virtual prototyping is integral part of development process, assuring fast innovation cycles and minimizing costs. A multiscale hybrid strategy is proposed to simulate Advanced Driver Assistance Systems (ADAS) in both Short Radar Range (SRR) and Long Radar Range (LRR). While SRR devices (typically blind spot/dead-angle radars) are operating at 24 GHz, the LRR devices used for Adaptive Cruise Control systems are utilizing the 77 GHz band. The sensor itself is modeled using FDTD or MoM/MLFMM methods. Then, the related electromagnetic environment is computed by means of Physical Optics (PO). Dedicated PO upgrades are utilized to handle plastic parts (bumper, front grille) in front of a sensor.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"168 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127344173","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Assessment of Three Multiple Cuff Blood Pressure Devices 三种多重袖带血压计的评估
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/AE.2019.8867036
J. Jílek, M. Stork
{"title":"Assessment of Three Multiple Cuff Blood Pressure Devices","authors":"J. Jílek, M. Stork","doi":"10.23919/AE.2019.8867036","DOIUrl":"https://doi.org/10.23919/AE.2019.8867036","url":null,"abstract":"Shortcomings of single cuff blood pressure devices have led to research of devices with more than one cuff for improved accuracy. We assessed two devices that use two cuffs and one device that uses three cuffs. The devices with two cuffs use one occluding arm cuff and one cuff that detects pulses that pass past the occluding cuff. The device with three cuffs uses pulse delay time. The advantages and the shortcomings of the devices are discussed in this paper.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"29 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132609901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
[Copyright notice] (版权)
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/ae.2019.8866996
{"title":"[Copyright notice]","authors":"","doi":"10.23919/ae.2019.8866996","DOIUrl":"https://doi.org/10.23919/ae.2019.8866996","url":null,"abstract":"","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130387269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rationalisation of the Fibonacci Charge Pump 斐波那契电荷泵的合理化
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/AE.2019.8867024
D. Matousek, Bohumil Brtnik
{"title":"Rationalisation of the Fibonacci Charge Pump","authors":"D. Matousek, Bohumil Brtnik","doi":"10.23919/AE.2019.8867024","DOIUrl":"https://doi.org/10.23919/AE.2019.8867024","url":null,"abstract":"This paper focuses on the practical aspects of the realisation the Fibonacci charge pump (FCP). The main attention is dedicated to the study of the influence of clock frequency and the capacitance of the used capacitor to key parameters of proposed FCP. This studying is performed by measurement of four specimens of FCP with different values of capacitance and clocking frequency. The rationalisation increases the efficiency to 85 % approximately (for VIN=3 V, VOUT =34.3 V, IOUT =1 mA). The results of this work allow rational selection of capacitance in relation to requested parameters of the designed charge pump.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"174 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122992095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Network Scanning and Mapping for IIoT Edge Node Device Security 面向IIoT边缘节点设备安全的网络扫描与映射
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/AE.2019.8867032
Matthew Niedermaier, Florian Fischer, D. Merli, G. Sigl
{"title":"Network Scanning and Mapping for IIoT Edge Node Device Security","authors":"Matthew Niedermaier, Florian Fischer, D. Merli, G. Sigl","doi":"10.23919/AE.2019.8867032","DOIUrl":"https://doi.org/10.23919/AE.2019.8867032","url":null,"abstract":"The amount of connected devices in the industrial environment is growing continuously, due to the ongoing demands of new features like predictive maintenance. New business models require more data, collected by IIoT edge node sensors based on inexpensive and low performance Microcontroller Units (MCUs). A negative side effect of this rise of interconnections is the increased attack surface, enabled by a larger network with more network services. Attaching badly documented and cheap devices to industrial networks often without permission of the administrator even further increases the security risk. A decent method to monitor the network and detect “unwanted” devices is network scanning. Typically, this scanning procedure is executed by a computer or server in each sub-network. In this paper, we introduce network scanning and mapping as a building block to scan directly from the Industrial Internet of Things (IIoT) edge node devices. This module scans the network in a pseudo-random periodic manner to discover devices and detect changes in the network structure. Furthermore, we validate our approach in an industrial testbed to show the feasibility of this approach.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"250 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121460922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Designing a MSP430 Bootloader 设计一个MSP430引导加载程序
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/AE.2019.8866999
S. Mischie, R. Pazsitka
{"title":"Designing a MSP430 Bootloader","authors":"S. Mischie, R. Pazsitka","doi":"10.23919/AE.2019.8866999","DOIUrl":"https://doi.org/10.23919/AE.2019.8866999","url":null,"abstract":"This paper presents implementation of a serial bootloader for a MSP430G2553 microcontroller. It is implemented in assembly language and it is written in the information area of the microcontroller memory by using any usual tool for flashing. Then, the source of the application can be developed. The application code that is obtained by using the compiler and linker must be sent to the microcontroller. For this purpose, a serial communication between PC and the UART port of the microcontroller via an USB to serial converter is implemented. In this case a MATLAB application is run on the PC while the bootloader is run on the microcontroller. Finally, the bootloader receives and writes the application code in the main area of the Flash memory. Thus, an efficient method to update the application code, having advantages in comparison with those in literature is proposed.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114112551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Active-RC Filters Suitable as Antialiasing and/or Reconstruction Filters 有源rc滤波器适用于抗混叠和/或重构滤波器
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/AE.2019.8867035
Bohumil Brtnik, D. Matousek
{"title":"Active-RC Filters Suitable as Antialiasing and/or Reconstruction Filters","authors":"Bohumil Brtnik, D. Matousek","doi":"10.23919/AE.2019.8867035","DOIUrl":"https://doi.org/10.23919/AE.2019.8867035","url":null,"abstract":"The discrete time signal processing circuit requires an anti-aliasing filter at the input and a reconstruction filter at the output, generally. In this paper, selected basic structures of biquads are described and compared with a view to the degradation of the attenuation over the transient frequency of the operational amplifier. Concretely, low-pass and bandpass Sallen-Key, Huelsman (i.e. multi feedback) and non-cascade filter structures are confronted with the limits of a real operational amplifier. Firstly, the reasons for the degradation of the attenuation are explained theoretically. Secondly, these conclusions are verified by simulations. These simulations were performed by spice-like circuit simulator MicroCap version 11.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125801989","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Performing safety functions to monitor the protected area using a light curtain 执行安全功能，使用光幕监控受保护区域
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/AE.2019.8867005
J. Ždánsky, Milan Medvedík
{"title":"Performing safety functions to monitor the protected area using a light curtain","authors":"J. Ždánsky, Milan Medvedík","doi":"10.23919/AE.2019.8867005","DOIUrl":"https://doi.org/10.23919/AE.2019.8867005","url":null,"abstract":"In many applications, a light curtain is used to detect the intrusion of a human (or other protected object) into the danger zone. After detecting the interruption of the light curtain, a safety function is activated to bring the danger zone into a safe state (non-human). If the space taken by the light curtain is at the same time a working space, it is necessary to distinguish whether the light curtain interrupt is caused by man or material (material flows cannot cause the dangerous zone to be put into a safe state). There are several ways how to achieve this resolution, but additional (optional) sensors are commonly used. The paper deals with the parameters of additional sensors and how to connect them to the achieved Safety Integrity Level (SIL) of the safety functions realized by the help of the light curtain.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122140614","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Calculation of solid particle trajectory inside electrical separator based on measured values 基于实测值的电分离器内固体颗粒轨迹计算
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/AE.2019.8867030
M. Bělík
{"title":"Calculation of solid particle trajectory inside electrical separator based on measured values","authors":"M. Bělík","doi":"10.23919/AE.2019.8867030","DOIUrl":"https://doi.org/10.23919/AE.2019.8867030","url":null,"abstract":"This article discusses application of data acquisition device National Instruments NI PCI-6221 for electrical separator low cost monitoring. Results can be applicable for air protection and air pollution prevention. Measured basic electrical and environmental values are logged into a file. Further the data serve as input for calculation of solid particles trajectory inside the separator. Influence of particular quantities onto the separator operation and particle trajectory calculation is discussed. Theoretical and technical limits of used device for high voltage measurements are explained in the first part. Main part of the paper deals with calculation of the trajectory and implementation in LabVIEW environment. Influence of particular physical parameters is elaborated. Presented ideas are generalized for more complex system in last chapter.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":" 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120935926","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
[AE 2019 Ad pages] [AE 2019广告页]
2019 International Conference on Applied Electronics (AE) Pub Date : 2019-09-01 DOI: 10.23919/ae.2019.8866877
{"title":"[AE 2019 Ad pages]","authors":"","doi":"10.23919/ae.2019.8866877","DOIUrl":"https://doi.org/10.23919/ae.2019.8866877","url":null,"abstract":"","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134146467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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