Matthew Niedermaier, Florian Fischer, D. Merli, G. Sigl
{"title":"面向IIoT边缘节点设备安全的网络扫描与映射","authors":"Matthew Niedermaier, Florian Fischer, D. Merli, G. Sigl","doi":"10.23919/AE.2019.8867032","DOIUrl":null,"url":null,"abstract":"The amount of connected devices in the industrial environment is growing continuously, due to the ongoing demands of new features like predictive maintenance. New business models require more data, collected by IIoT edge node sensors based on inexpensive and low performance Microcontroller Units (MCUs). A negative side effect of this rise of interconnections is the increased attack surface, enabled by a larger network with more network services. Attaching badly documented and cheap devices to industrial networks often without permission of the administrator even further increases the security risk. A decent method to monitor the network and detect “unwanted” devices is network scanning. Typically, this scanning procedure is executed by a computer or server in each sub-network. In this paper, we introduce network scanning and mapping as a building block to scan directly from the Industrial Internet of Things (IIoT) edge node devices. This module scans the network in a pseudo-random periodic manner to discover devices and detect changes in the network structure. Furthermore, we validate our approach in an industrial testbed to show the feasibility of this approach.","PeriodicalId":177095,"journal":{"name":"2019 International Conference on Applied Electronics (AE)","volume":"250 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Network Scanning and Mapping for IIoT Edge Node Device Security\",\"authors\":\"Matthew Niedermaier, Florian Fischer, D. Merli, G. Sigl\",\"doi\":\"10.23919/AE.2019.8867032\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The amount of connected devices in the industrial environment is growing continuously, due to the ongoing demands of new features like predictive maintenance. New business models require more data, collected by IIoT edge node sensors based on inexpensive and low performance Microcontroller Units (MCUs). A negative side effect of this rise of interconnections is the increased attack surface, enabled by a larger network with more network services. Attaching badly documented and cheap devices to industrial networks often without permission of the administrator even further increases the security risk. A decent method to monitor the network and detect “unwanted” devices is network scanning. Typically, this scanning procedure is executed by a computer or server in each sub-network. In this paper, we introduce network scanning and mapping as a building block to scan directly from the Industrial Internet of Things (IIoT) edge node devices. This module scans the network in a pseudo-random periodic manner to discover devices and detect changes in the network structure. Furthermore, we validate our approach in an industrial testbed to show the feasibility of this approach.\",\"PeriodicalId\":177095,\"journal\":{\"name\":\"2019 International Conference on Applied Electronics (AE)\",\"volume\":\"250 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 International Conference on Applied Electronics (AE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/AE.2019.8867032\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Conference on Applied Electronics (AE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/AE.2019.8867032","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Network Scanning and Mapping for IIoT Edge Node Device Security
The amount of connected devices in the industrial environment is growing continuously, due to the ongoing demands of new features like predictive maintenance. New business models require more data, collected by IIoT edge node sensors based on inexpensive and low performance Microcontroller Units (MCUs). A negative side effect of this rise of interconnections is the increased attack surface, enabled by a larger network with more network services. Attaching badly documented and cheap devices to industrial networks often without permission of the administrator even further increases the security risk. A decent method to monitor the network and detect “unwanted” devices is network scanning. Typically, this scanning procedure is executed by a computer or server in each sub-network. In this paper, we introduce network scanning and mapping as a building block to scan directly from the Industrial Internet of Things (IIoT) edge node devices. This module scans the network in a pseudo-random periodic manner to discover devices and detect changes in the network structure. Furthermore, we validate our approach in an industrial testbed to show the feasibility of this approach.