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Static Noise Margin Evaluation Method Based on Direct Polynomial-Curve-Fitting with Universal SRAM Cell Inverter TEG Measurement 基于直接多项式曲线拟合的通用SRAM单元逆变器TEG测量静态噪声裕度评价方法
2009 IEEE International Conference on Microelectronic Test Structures Pub Date : 2009-04-14 DOI: 10.1109/ICMTS.2009.4814599
Kazuyuki Nakamura, Kazunori Noda, H. Koike
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