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IEEE Photonic Society 24th Annual Meeting最新文献

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Ultrasensitive plasmonic fano sensor enables seeing protein monolayers with naked eye 超灵敏的等离子体法诺传感器可以用肉眼看到蛋白质单层
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110608
A. Yanik, A. E. Cetin, Min A. Huang, A. Artar, S. H. Mousavi, A. Khanikaev, J. Connor, G. Shvets, H. Altug
{"title":"Ultrasensitive plasmonic fano sensor enables seeing protein monolayers with naked eye","authors":"A. Yanik, A. E. Cetin, Min A. Huang, A. Artar, S. H. Mousavi, A. Khanikaev, J. Connor, G. Shvets, H. Altug","doi":"10.1109/PHO.2011.6110608","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110608","url":null,"abstract":"By exploiting plasmonic sub-radiant dark modes, we demonstrate ultrasensitive biosensors with record high figure of merits (FOM~162). We also show direct detection of single monolayers of proteins with naked eye using associated fundamental Fano resonances.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121633095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Survivability evaluation of optimum network node placement in a hybrid fiber-wireless access network 光纤-无线混合接入网中最优网络节点布局的生存性评估
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110544
Sheng-Chyan Lee, Su-Wei Tan, E. Wong, Ka-Lun Lee, C. Lim
{"title":"Survivability evaluation of optimum network node placement in a hybrid fiber-wireless access network","authors":"Sheng-Chyan Lee, Su-Wei Tan, E. Wong, Ka-Lun Lee, C. Lim","doi":"10.1109/PHO.2011.6110544","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110544","url":null,"abstract":"Mixed integer linear programs for minimum cost FiWi deployment and survivability of the resultant network under nodes failure are formulated and evaluated. Number of potential installation sites determines the network's feasibility and survivability.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121762930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Thermal emission control by simultaneous manipulation of electronic and photonic states 同时操纵电子和光子态的热发射控制
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110652
M. de Zoysa, T. Asano, A. Oskooi, T. Inoue, S. Noda
{"title":"Thermal emission control by simultaneous manipulation of electronic and photonic states","authors":"M. de Zoysa, T. Asano, A. Oskooi, T. Inoue, S. Noda","doi":"10.1109/PHO.2011.6110652","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110652","url":null,"abstract":"Broad thermal emission spectrum has been successfully converted into a narrow spectrum by using intersubband-transitions in quantum wells and photonic crystal band-edge resonant effects.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131393258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Implementation of optical burst switching in data centers 数据中心光突发交换的实现
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110618
Mohammed Y. S. Sowailem, D. Plant, O. Liboiron-Ladouceur
{"title":"Implementation of optical burst switching in data centers","authors":"Mohammed Y. S. Sowailem, D. Plant, O. Liboiron-Ladouceur","doi":"10.1109/PHO.2011.6110618","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110618","url":null,"abstract":"We demonstrate the implementation and performance of optical burst switching in data centers. We propose the use of hybrid burst assembly algorithm and compare both the first-fit and horizon scheduling algorithms in a fat-tree topology.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130057990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
A robust overlapped-SCM WDM PON with a standalone burst-mode OLT receiver 具有独立突发模式OLT接收机的鲁棒重叠scm WDM PON
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110508
Z. El-Sahn, B. Shastri, J. Buset, D. Plant
{"title":"A robust overlapped-SCM WDM PON with a standalone burst-mode OLT receiver","authors":"Z. El-Sahn, B. Shastri, J. Buset, D. Plant","doi":"10.1109/PHO.2011.6110508","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110508","url":null,"abstract":"We demonstrate an overlapped-SCM WDM PON using a burst-mode receiver capable of tracking instantaneous phase variations within the uplink. The receiver ensures proper alignment between the clock and up-converted data for efficient SCM down-conversion.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130185655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Features and applications of various TFTs - Si based matured TFTs and oxide semiconductor based transparent TFTs 各种薄膜晶体管的特点和应用——硅基成熟薄膜晶体管和氧化物半导体基透明薄膜晶体管
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110669
M. Kimura
{"title":"Features and applications of various TFTs - Si based matured TFTs and oxide semiconductor based transparent TFTs","authors":"M. Kimura","doi":"10.1109/PHO.2011.6110669","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110669","url":null,"abstract":"Thin-film transistors (TFTs) are key devices for high image quality information displays. Features and applications of various TFTs, such as matured amorphous and poly-Si TFTs and transparent poly-ZnO and amorphous InGaZnO TFTs, are discussed.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"199 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134139159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Noise properties and information capacities of phase-(in)sensitive parametric amplifiers 相位敏感参数放大器的噪声特性和信息容量
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110445
C. McKinstrie
{"title":"Noise properties and information capacities of phase-(in)sensitive parametric amplifiers","authors":"C. McKinstrie","doi":"10.1109/PHO.2011.6110445","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110445","url":null,"abstract":"In this tutorial, I will review the basic concepts of information theory and quantum optics. Subsequently, I will use these concepts to discuss the noise properties and information capacities of phase-insensitive and phase-sensitive parametric amplifiers.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134319074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Room-temperature lasing operation of a 1.3-µm npn-AlGaInAs/InP transistor laser 1.3µm npn-AlGaInAs/InP晶体管激光器的室温激光工作
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110715
Takashi Sato, M. Shirao, Y. Takino, N. Sato, N. Nishiyama, S. Arai
{"title":"Room-temperature lasing operation of a 1.3-µm npn-AlGaInAs/InP transistor laser","authors":"Takashi Sato, M. Shirao, Y. Takino, N. Sato, N. Nishiyama, S. Arai","doi":"10.1109/PHO.2011.6110715","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110715","url":null,"abstract":"A first room-temperature pulsed operation of a 1.3-μm wavelength npn AlGaInAs/InP transistor laser was achieved with a threshold emitter current and current gain of 130 mA and 1, respectively.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131508074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Strain driven degradation in laser diodes 激光二极管的应变驱动退化
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110614
A. Martín-Martín, M. Iñiguez, J. Jiménez
{"title":"Strain driven degradation in laser diodes","authors":"A. Martín-Martín, M. Iñiguez, J. Jiménez","doi":"10.1109/PHO.2011.6110614","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110614","url":null,"abstract":"Improving the reliability of high power laser diodes is a crucial issue for their practical application. The understanding of the mechanisms behind the degradation of high power laser diodes is necessary to increase their power and lifetime. The study of the degradation mechanisms requires the investigation of the main defects generated during the laser degradation; therefore, an exhaustive examination of the defect signatures in the degraded devices must be crucial to establish reliable degradation scenarios. Cathodoluminescence (CL) is a unique tool to identify the main defects generated by the device degradation, which will permit to build up a model providing a comprehensive scenario of the laser degradation. CL images of the degraded devices reveal the presence of regions with low, or fully quenched, radiative activity, associated with the presence of extended defects in the active layers of the laser structure, in both the front facet and the cavity.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131653184","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Techno-economic study of optical networks 光网络的技术经济研究
IEEE Photonic Society 24th Annual Meeting Pub Date : 2011-12-22 DOI: 10.1109/PHO.2011.6110826
K. Casier, S. Verbrugge, C. Mas Machuca
{"title":"Techno-economic study of optical networks","authors":"K. Casier, S. Verbrugge, C. Mas Machuca","doi":"10.1109/PHO.2011.6110826","DOIUrl":"https://doi.org/10.1109/PHO.2011.6110826","url":null,"abstract":"Techno-economic research focusing on optical access networks traditionally looks at the upfront network installation costs. This paper additionally indicates where techno-economic research is heading and which questions it aims to answer.","PeriodicalId":173679,"journal":{"name":"IEEE Photonic Society 24th Annual Meeting","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132617159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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