发布求助
文献互助 智能选刊 最新文献

Journal of The Korean Institute of Electrical and Electronic Material Engineers最新文献

筛选
英文 中文
Mechanical Properties and Wind Energy Harvesting Characteristics of PZT-Based Piezoelectric Ceramic Fiber Composites 压电陶瓷纤维复合材料的力学性能及风能收集特性
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.2.90
Lee Min Seon, Jin Woo Park, Y. Jeong
{"title":"Mechanical Properties and Wind Energy Harvesting Characteristics of PZT-Based Piezoelectric Ceramic Fiber Composites","authors":"Lee Min Seon, Jin Woo Park, Y. Jeong","doi":"10.4313/JKEM.2021.34.2.90","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.2.90","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"29 1","pages":"90-98"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81169675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterization of [011] Poled Pb(In 1/2 Nb 1/2 )O 3 -Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 Single Crystals by Resonance Method [011]极性Pb(In 1/2 Nb 1/2) o3 -Pb(Mg 1/3 Nb 2/3) o3 - pbtio3单晶的共振表征
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.6.11
Y. Je, Min-Seop Sim, Yo-han Cho, Won-Ok Lee, Sang-Goo Lee, Jeong-Min Lee, Hee-Seon Seo
{"title":"Characterization of [011] Poled Pb(In 1/2 Nb 1/2 )O 3 -Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 Single Crystals by Resonance Method","authors":"Y. Je, Min-Seop Sim, Yo-han Cho, Won-Ok Lee, Sang-Goo Lee, Jeong-Min Lee, Hee-Seon Seo","doi":"10.4313/JKEM.2021.34.6.11","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.6.11","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"98 1","pages":"466-474"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81181158","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High Quality Non-Transfer Single-Layer Graphene Process Grown Directly on Ti(10 nm)-Buffered Layer for Photo Lithography Process 在Ti(10nm)缓冲层上直接生长的高质量非转移单层石墨烯工艺-用于光刻工艺
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.21
O. Ryong, Yire-Han, Eom Jiho, Soon-Gil Yoon
{"title":"High Quality Non-Transfer Single-Layer Graphene Process Grown Directly on Ti(10 nm)-Buffered Layer for Photo Lithography Process","authors":"O. Ryong, Yire-Han, Eom Jiho, Soon-Gil Yoon","doi":"10.4313/JKEM.2021.34.1.21","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.1.21","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"22 1","pages":"21-26"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80116022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of Breaking Performance of New Contact Material for the Vacuum Interrupter 真空灭流器新型触头材料分断性能评价
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.50
Young-Kwang Cha, I. Lee, Heung-Jin Ju, Tae-Yong Shin, Kyoung Tae Park
{"title":"Evaluation of Breaking Performance of New Contact Material for the Vacuum Interrupter","authors":"Young-Kwang Cha, I. Lee, Heung-Jin Ju, Tae-Yong Shin, Kyoung Tae Park","doi":"10.4313/JKEM.2021.34.1.50","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.1.50","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"30 1","pages":"50-55"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81572857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Research for Hot Carrier Degradation in N-Type Bulk FinFETs n型体finfet热载流子退化研究
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-05-01 DOI: 10.4313/JKEM.2020.33.3.169
Park jinsu, Sanchari Showdhury, Geonju Yoon, Jaemin Kim, Kwon, Kee-Won, S. Pae, Jinseok Kim, Yi, Junsin
{"title":"Research for Hot Carrier Degradation in N-Type Bulk FinFETs","authors":"Park jinsu, Sanchari Showdhury, Geonju Yoon, Jaemin Kim, Kwon, Kee-Won, S. Pae, Jinseok Kim, Yi, Junsin","doi":"10.4313/JKEM.2020.33.3.169","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.3.169","url":null,"abstract":"In this paper, the effect of hot carrier injection on an n-bulk fin field-effect transistor (FinFET) is analyzed. The hot carrier injection method is applied to determine the performance change after injection in two ways, channel hot electron (CHE) and drain avalanche hot carrier (DAHC), which have the greatest effect at room temperature. The optimum condition for CHE injection is VG=VD, and the optimal condition for DAHC injection can be indirectly confirmed by measuring the peak value of the substrate current. Deterioration by DAHC injection affects not only hot electrons formed by impact ionization, but also hot holes, which has a greater impact on reliability than CHE. Further, we test the amount of drain voltage that can be withstood, and extracted the lifetime of the device. Under CHE injection conditions, the drain voltage was able to maintain a lifetime of more than 10 years at a maximum of 1.25 V, while DAHC was able to achieve a lifetime exceeding 10 years at a 1.05-V drain voltage, which is 0.2 V lower than that of CHE injection conditions.","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"50 1","pages":"169-172"},"PeriodicalIF":0.0,"publicationDate":"2020-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84329849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
W-Band MMIC를 위한 T-형태 게이트 구조를 갖는 MHMET 소자 특성 为W-Band MMIC设计的具有T-形态门结构的MHMET元件特性
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-03-01 DOI: 10.4313/JKEM.2020.33.2.99
Jongmin Lee, Min Byoung-Gue, Sungjae Chang, Woo-Suk Chang, H. Yoon, Jung Hyunwook, Kim Seong-Il, D. M. Kang, 김완식, 정주용, 김종필, 서미희, 김소수
{"title":"W-Band MMIC를 위한 T-형태 게이트 구조를 갖는 MHMET 소자 특성","authors":"Jongmin Lee, Min Byoung-Gue, Sungjae Chang, Woo-Suk Chang, H. Yoon, Jung Hyunwook, Kim Seong-Il, D. M. Kang, 김완식, 정주용, 김종필, 서미희, 김소수","doi":"10.4313/JKEM.2020.33.2.99","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.2.99","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"96 1","pages":"99-104"},"PeriodicalIF":0.0,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75920051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Doping Effects to the Thermoelectric Power Factor of Bi2Te3 Thin Films 掺杂对Bi2Te3薄膜热电功率因数的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.2.141
S. Bae, Choi Soon-Mok
{"title":"Doping Effects to the Thermoelectric Power Factor of Bi2Te3 Thin Films","authors":"S. Bae, Choi Soon-Mok","doi":"10.4313/JKEM.2020.33.2.141","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.2.141","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"15 1","pages":"141-146"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75501011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Preparation and Characterization of Swallow-Tail Terrylene Bisimide as Organic Phosphor 燕尾涤纶二亚胺有机荧光粉的制备与表征
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.3.194
S. Jung, Jeong Yeon Tae
{"title":"Preparation and Characterization of Swallow-Tail Terrylene Bisimide as Organic Phosphor","authors":"S. Jung, Jeong Yeon Tae","doi":"10.4313/JKEM.2020.33.3.194","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.3.194","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"34 1","pages":"194-200"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85093315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Synthesis and Characterization of BaTiO 3 Powder by Solid State Method 固态法制备batio3粉体及其表征
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.6.483
Yongjin Kim, Moonhee Choi, Hyo‐Soon Shin, B. Ju, M. Chun
{"title":"Synthesis and Characterization of BaTiO 3 Powder by Solid State Method","authors":"Yongjin Kim, Moonhee Choi, Hyo‐Soon Shin, B. Ju, M. Chun","doi":"10.4313/JKEM.2020.33.6.483","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.6.483","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"5 1","pages":"483-489"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81128484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Changes of Photovoltaic Properties of Flexible CIGS Solar Cell Under Mechanical Bending Stress 机械弯曲应力下柔性CIGS太阳能电池光伏性能的变化
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2020-01-01 DOI: 10.4313/JKEM.2020.33.3.163
Kim Sung Jun, Jeha Kim
{"title":"Changes of Photovoltaic Properties of Flexible CIGS Solar Cell Under Mechanical Bending Stress","authors":"Kim Sung Jun, Jeha Kim","doi":"10.4313/JKEM.2020.33.3.163","DOIUrl":"https://doi.org/10.4313/JKEM.2020.33.3.163","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"25 1","pages":"163-168"},"PeriodicalIF":0.0,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73124041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
首页 上一页 下一页 尾页
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整，为了账户安全，请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们：info@booksci.cn Book学术提供免费学术资源搜索服务，方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号：481959085
Book学术官方微信