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Journal of The Korean Institute of Electrical and Electronic Material Engineers最新文献

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Thermal Radiative Properties of Multilayer Graphene/Glass Structure 多层石墨烯/玻璃结构的热辐射性能
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.27
Kyung-Ah Park, Lim Mikyung, Hyun‐June Jung, Jae‐Hyun Kim
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引用次数: 1
The Effects of Substrate Temperature on Electrical and Physical Properties of ZnO:Al for the Application of Solar Cells 衬底温度对太阳能电池用ZnO:Al材料电学和物理性能的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.39
C. Park
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引用次数: 0
Impact of Solution-Processed BCP Buffer Layer on Efficient Perovskite Solar Cells 溶液处理BCP缓冲层对高效钙钛矿太阳能电池的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.73
Minsu Jung, I. Choi, kim dong suk
{"title":"Impact of Solution-Processed BCP Buffer Layer on Efficient Perovskite Solar Cells","authors":"Minsu Jung, I. Choi, kim dong suk","doi":"10.4313/JKEM.2021.34.1.73","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.1.73","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"35 1","pages":"73-77"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78808752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Study on the Surface Properties of Polymer Insulators for Improving Electrical Insulation Performance 提高电绝缘性能的聚合物绝缘子表面性能研究
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.63
Y. Park, J. Bae, Hong Byung-You, L. Hyung
{"title":"A Study on the Surface Properties of Polymer Insulators for Improving Electrical Insulation Performance","authors":"Y. Park, J. Bae, Hong Byung-You, L. Hyung","doi":"10.4313/JKEM.2021.34.1.63","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.1.63","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"53 1","pages":"63-67"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80682104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation on the Degradation of the Electrical Characteristics of a-IGZO Thin Film Transistor Under Gate Bias Stress 栅极偏置应力下a-IGZO薄膜晶体管电学特性退化的研究
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.3.193
Tae-Soo Kim, J. Jeon
{"title":"Investigation on the Degradation of the Electrical Characteristics of a-IGZO Thin Film Transistor Under Gate Bias Stress","authors":"Tae-Soo Kim, J. Jeon","doi":"10.4313/JKEM.2021.34.3.193","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.3.193","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"1 1","pages":"193-197"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91111553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Formation of Anodic Oxide Film by Anodizing Voltage and Time of 6061 Aluminum Alloy 6061铝合金阳极氧化电压和时间对阳极氧化膜形成的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.68
Youngju Park, Chanyoung Jeong
{"title":"The Formation of Anodic Oxide Film by Anodizing Voltage and Time of 6061 Aluminum Alloy","authors":"Youngju Park, Chanyoung Jeong","doi":"10.4313/JKEM.2021.34.1.68","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.1.68","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"4 1","pages":"68-72"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88179525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
The Effect of Substrate Temperature on Tribological and Electrical Properties of Sputtered Carbon Nitride Thin Film 衬底温度对溅射氮化碳薄膜摩擦学和电学性能的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.1.33
C. Park
{"title":"The Effect of Substrate Temperature on Tribological and Electrical Properties of Sputtered Carbon Nitride Thin Film","authors":"C. Park","doi":"10.4313/JKEM.2021.34.1.33","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.1.33","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"1 1","pages":"33-38"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77361981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Condition Monitoring Technique for Heating Cables by Detecting Discharge Signal 基于放电信号检测的加热电缆状态监测技术
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.2.136
Dong-Eon Kim, Nam-Hoon Kim, Seung-hyun Lim, G. Kil
{"title":"Condition Monitoring Technique for Heating Cables by Detecting Discharge Signal","authors":"Dong-Eon Kim, Nam-Hoon Kim, Seung-hyun Lim, G. Kil","doi":"10.4313/JKEM.2021.34.2.136","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.2.136","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"1 1","pages":"136-141"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86412768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Study on Dielectric Properties of Flame-Retardant Silicone Rubber Due to Silica Amount Change 二氧化硅用量变化对阻燃硅橡胶介电性能的影响
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.5.364
S. Lee
{"title":"A Study on Dielectric Properties of Flame-Retardant Silicone Rubber Due to Silica Amount Change","authors":"S. Lee","doi":"10.4313/JKEM.2021.34.5.364","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.5.364","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"95 1","pages":"364-370"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79242970","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation of Transparent Electrodes for Solution-Processed Organic Solar Cells 溶液处理有机太阳能电池透明电极的研究
Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI: 10.4313/JKEM.2021.34.2.115
Sumin Lee, Moon Hee Kang
{"title":"Investigation of Transparent Electrodes for Solution-Processed Organic Solar Cells","authors":"Sumin Lee, Moon Hee Kang","doi":"10.4313/JKEM.2021.34.2.115","DOIUrl":"https://doi.org/10.4313/JKEM.2021.34.2.115","url":null,"abstract":"","PeriodicalId":17325,"journal":{"name":"Journal of The Korean Institute of Electrical and Electronic Material Engineers","volume":"247 1","pages":"115-120"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74987210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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