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Investigation on the Degradation of the Electrical Characteristics of a-IGZO Thin Film Transistor Under Gate Bias Stress

Journal of The Korean Institute of Electrical and Electronic Material Engineers Pub Date : 2021-01-01 DOI:10.4313/JKEM.2021.34.3.193
Tae-Soo Kim, J. Jeon
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栅极偏置应力下a-IGZO薄膜晶体管电学特性退化的研究
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Journal of The Korean Institute of Electrical and Electronic Material Engineers
Journal of The Korean Institute of Electrical and Electronic Material Engineers
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