Annual Reliability and Maintainability Symposium 1995 Proceedings最新文献_第4页

Exploratory research on nonthermal damage to electronics from fires and fire-suppression agents 火灾及灭火剂对电子设备非热损伤的探索性研究

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513215

F. Mowrer, M. Pecht

{"title":"Exploratory research on nonthermal damage to electronics from fires and fire-suppression agents","authors":"F. Mowrer, M. Pecht","doi":"10.1109/RAMS.1995.513215","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513215","url":null,"abstract":"Electronic equipment is expected to operate reliably under normal conditions as well as under foreseeable abnormal conditions, particularly in life-critical and environmentally sensitive applications. One foreseeable abnormal condition to which electronic equipment may be subjected at least once during its life-cycle is a fire environment. Such an environment may include the thermal and corrosive effects in the immediate vicinity of the fire and the nonthermal effects associated with smoke contamination, humidity and corrosion in remote locations. Direct thermal effects are generally so severe that reasonable remedial actions may not be feasible. Fortunately, such effects are frequently restricted to a fairly small zone, often through the use of automatic fire detection and suppression systems. On the other hand, the thermal decomposition products of smoke and fire suppression agents resulting from even a small fire may permeate a building and cause nonthermal damage to electronic equipment in locations remote from the actual fire. With ever-increasing reliance being placed on electronic equipment in all types of applications and the consequent increase in value concentrations, nonthermal damage from fires and fire suppression agents is a topic of growing interest. The purpose of this exploratory research is to characterize nonthermal damage mechanisms, consequences, and potential preventive and remedial actions using a physics-of-failure approach.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128358025","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 5

A decision-support approach for the design of human-machine systems and processes 人机系统和过程设计的决策支持方法

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513264

K. P. LaSala, M. L. Roush, Z. Matic

引用次数: 4

Comparative analysis of two architectural alternatives for the N-version programming (NVP) system n版本编程(NVP)系统的两种架构选择的比较分析

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513258

S. A. Doyle, J. L. Mackey

{"title":"Comparative analysis of two architectural alternatives for the N-version programming (NVP) system","authors":"S. A. Doyle, J. L. Mackey","doi":"10.1109/RAMS.1995.513258","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513258","url":null,"abstract":"This paper presents a quantitative analysis of two configurations of one architectural approach to the integration of hardware and software fault tolerance. The importance of this work is to determine if there is a clear-cut advantage to using one configuration of N-version programming (NVP) over the other. A previous preliminary sensitivity analysis on the individual parameter values showed that downloading a faulty software version had the most significant effect on the reliability and safety of the system. The other parameters that we varied had little or no effect on the systems' performances, or on the relationship between the two systems. This fact demonstrates that our results are relatively robust for the particular parameter values that were chosen. Of course a significantly different set of parameter values may yield different results. Closed form solutions proved difficult to manage. We investigate the well-known anomaly for hardware fault tolerant TMR systems to see if the anomaly still holds when software faults are considered. The anomaly considered is that, for a TMR hardware fault tolerant system, discarding an operational component upon the first failure (and continuing in simplex mode) actually improves reliability. When software faults are considered in a more comprehensive analysis, the anomaly no longer holds.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131313384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Test-time compression for qualification testing of electronic packages: a case study 电子封装合格测试的测试时间压缩:一个案例研究

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513253

T. P. Rothman, A. Dasgupta, J.M. Hu

{"title":"Test-time compression for qualification testing of electronic packages: a case study","authors":"T. P. Rothman, A. Dasgupta, J.M. Hu","doi":"10.1109/RAMS.1995.513253","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513253","url":null,"abstract":"This paper illustrates a methodology for using physics-of-failure models to extract acceleration transform information from limited test data under accelerated stresses. Test time compression is achieved by appropriately accelerating the stress levels in order to obtain accurate information on reliability. The critical variables are identified and their influence on the stress magnitude is quantified using physics-of-failure models. The total amount of testing time is minimized by tailoring the critical variables in each sample such that multiple stress levels can be achieved in the samples under a single loading. This type of parametric-accelerated test eliminates the need for repeating the test at multiple load levels. Such techniques are essential for cost effective and timely qualification testing of highly reliable modules under accelerated stresses. All sources of error due to experimental variables and assumptions or simplifications in the analytical model are closely examined and discussed. Future work will employ a more detailed physics-of-failure model to quantify the experimental results. These test results also validate physics-of-failure models for acceleration transforms which relate test data to field reliability. Analytical predictive models for acceleration transforms will obviously result in significant savings of cost and time during qualification.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116586758","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Pacemaker reliability: design to explant 起搏器可靠性:设计为外植式

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513285

G. G. Maxwell

引用次数: 2

Built-in-test adequacy-evaluation methodology for an air-vehicle system 飞行器系统内置测试充分性评估方法

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513260

D.R. Beniquez, D.C. Witteried

引用次数: 1

A double-event testing approach to improve network-element availability 提高网络元素可用性的双事件测试方法

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513261

K. Le

引用次数: 1

Hazard-function implications of stochastic-deterioration and distributed-defect concentrations 随机退化和分布缺陷浓度的危险功能含义

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513248

J. A. Nachlas, C. Cassady, K.F. Rooney

引用次数: 0

Equipment life: can we afford to extend it? 设备寿命:我们能负担得起延长吗?

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513294

N. J. Prescott

引用次数: 2

A method to determine equivalent fault classes for permanent and transient faults 一种确定永久和暂态故障等效故障类别的方法

Annual Reliability and Maintainability Symposium 1995 Proceedings Pub Date : 1995-01-16 DOI: 10.1109/RAMS.1995.513278

D. T. Smith, Barry W. Johnson, J. Profeta, D. Bozzolo

{"title":"A method to determine equivalent fault classes for permanent and transient faults","authors":"D. T. Smith, Barry W. Johnson, J. Profeta, D. Bozzolo","doi":"10.1109/RAMS.1995.513278","DOIUrl":"https://doi.org/10.1109/RAMS.1995.513278","url":null,"abstract":"The expanding size and complexity of dependable computing systems has significantly increased their cost while complicating the estimation of system dependability attributes such as fault coverage and latency. The increasing requirements of safety and reliability for a dependable system, however, have made the evaluation of dependability attributes a crucial task. One approach to performing such an evaluation is through fault injection. The development of a method which enumerates the equivalent faults associated with a given fault injection experiment would significantly reduce the amount of effort required to measure dependability parameters to the desired degree of accuracy and confidence. This research has developed a new method for determining the set of equivalent faults for either a permanent or transient fault injection experiment. The primary objective of the research effort was to expand the data obtained from a single fault injection experiment into a set of data associated with the equivalent fault set. The end result is an automated method for determining equivalent faults from a set of fault injection experiments. The expanded equivalent data sets are then evaluated to determine dependability parameter estimates for fault coverage and error latency.","PeriodicalId":143102,"journal":{"name":"Annual Reliability and Maintainability Symposium 1995 Proceedings","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1995-01-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130299619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 22