Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)最新文献_第3页

Effects of electric contact failure on signal transmission in unmatched circuits 非匹配电路中电触点失效对信号传输的影响

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953208

B. Sun

引用次数: 7

Thermal simulation of switchgear 开关柜热模拟

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953183

J. Paulke, H. Weichert, P. Steinhauser

引用次数: 48

Contact resistance comparison of good and bad crimp joints with tinned wires under thermal shock 热冲击下锡线良好和不良卷曲接头的接触电阻比较

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953187

D. Liu, T. Bracket, S. Mccarthy

{"title":"Contact resistance comparison of good and bad crimp joints with tinned wires under thermal shock","authors":"D. Liu, T. Bracket, S. Mccarthy","doi":"10.1109/HOLM.2001.953187","DOIUrl":"https://doi.org/10.1109/HOLM.2001.953187","url":null,"abstract":"#16 wire gauge crimp joints of good quality were made tinned wires in the conventional way. Some of them then subjected to twisting in gap between the two wings. All of them were heat-soaked at 135/spl deg/C for 300 hours. They were then into a thermal-shock furnace for thermal cycling from -40/spl deg/C to 125/spl deg/C, each cycle lasting one hour for a total of 570hours. The four-leads method was used to measure the contact resistance for every cycle under the dry circuit condition. The contact resistance of good crimps generally increased at a slower pace over time than the bad ones. The resistance of some good and bad crimps would tend to more or less off after 100-200 cycles while others would continue to increase their resistance without leveling off and some of them might show a sudden jump. Nevertheless, the measured resistance history showed that a crimp with a tinned wire exhibited accepted performance whether it was good or not so good a crimp. The results also showed that the temperature history would effect the contact resistance measured at a later time. For example, the resistance of a crimp at 125/spl deg/C would be somehow different depending on weather the previous temperature started from -40/spl deg/C or from -17/spl deg/C. Data analysis showed that even with severe thermal shocks for 570 hours and possible consequence of repeated shearing, the contact in the crimp was still essentially a metallic one.","PeriodicalId":136044,"journal":{"name":"Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134217954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 10

Arc motion and wave propagation in arc chambers with lateral chinks 具有横向缝隙的电弧室中的电弧运动和波传播

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953182

K. Berger, B. Gessl, W. Schneider, W. Rieder

引用次数: 11

Melting on axial magnetic field contacts during half-cycle drawn arcs in vacuum 轴向磁场触点在真空半周期拉弧过程中的熔化

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953205

E. Taylor, M.B. Schulmann, P. Slade

{"title":"Melting on axial magnetic field contacts during half-cycle drawn arcs in vacuum","authors":"E. Taylor, M.B. Schulmann, P. Slade","doi":"10.1109/HOLM.2001.953205","DOIUrl":"https://doi.org/10.1109/HOLM.2001.953205","url":null,"abstract":"High-current arcing operations on electrical contacts in vacuum produce distinct patterns of melting and erosion. Single or multiple half-cycle operations have been performed on Cu-Cr contacts with an axial magnetic field (AMF) to investigate these effects. High-speed movies of drawn arcs inside a vacuum chamber connect the observed melting patterns to the arc behavior. From the initial bridge column, the arc passes through an expanding transition mode, producing a localized region of shallow melting on the anode. The AMF level is sufficient to cause the subsequent formation of a fully diffuse high-current arc throughout the contact gap, generating little or no melting on the anode beyond the transition arc region. The combination of arc visualization and contact erosion experiments demonstrates that the transition arc mode is a critically dominant cause of contact melting. The location of final contact separation moves over multiple operations, causing the region of anode melting to move in turn. This can obscure the melting patterns from the individual half-cycles of current. Therefore, using drawn arcs in both individual half-cycle VI tests and vacuum arc movies provides an improved method for studying the process of AMF contact erosion at high current.","PeriodicalId":136044,"journal":{"name":"Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115017348","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 15

A preliminary study of mechanical switch using high temperature superconducting material 高温超导材料机械开关的初步研究

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953200

K. Sawa, M. Suzuki, M. Tomita, M. Murakami

{"title":"A preliminary study of mechanical switch using high temperature superconducting material","authors":"K. Sawa, M. Suzuki, M. Tomita, M. Murakami","doi":"10.1109/HOLM.2001.953200","DOIUrl":"https://doi.org/10.1109/HOLM.2001.953200","url":null,"abstract":"A persistent current switch (PCS) is a key component for superconducting magnetic energy storage (SMES) systems because it is used to switch a superconducting coil from storage mode to transfer mode. In past research on a mechanical PCS for SMES, a metallic superconductor made of Nb and NbTi was used as switching material. However, recent research using SMES coils of high-temperature superconductor (HTS) has been widely carried out, in which a PCS is also expected to work at liquid nitrogen temperature. In this paper, YBCO (yttrium barium copper oxide) bulk HTS was proposed as a switch material, and testing of the fundamental characteristics of a mechanical contact between two YBCO bulks was carried out. As a result, a switching phenomenon between low and high resistance ranges is observed at a threshold current value in the V-I characteristics of the YBCO contact. This phenomenon is also observed after the break and make action is carried out in liquid nitrogen, which indicates the possibility of a superconducting mechanical switch using bulk YBCO. Furthermore, the tests indicate that a certain amount of current must flow before the switching phenomenon, since the discontinuous transition occurred after the surface-insulating layer formed by degradation of YBCO was destroyed in the contact area.","PeriodicalId":136044,"journal":{"name":"Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122551760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 15

Effect of intergranular cohesion on the intermittency of automotive headlamp switch contacts 晶间内聚对汽车前照灯开关触点断续性的影响

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953190

K. Klungtvedt, M. Braunovic

引用次数: 0

Analysis of parallel groove clamp with finite element method 用有限元法分析平行槽式夹具

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953216

Guoping Luo, Laing-Jun Xu, Ji-gao Zhang

{"title":"Analysis of parallel groove clamp with finite element method","authors":"Guoping Luo, Laing-Jun Xu, Ji-gao Zhang","doi":"10.1109/HOLM.2001.953216","DOIUrl":"https://doi.org/10.1109/HOLM.2001.953216","url":null,"abstract":"Due to its simple structure, easy installation and low cost, bolt-type power connector, the parallel groove clamp is widely used in overhead power transmission and distribution lines. However, due to high and fluctuating current loads and harsh environments in China, there are many problems in application of this kind of connector. After analysis of failed connectors collected from Chinese overhead power lines, the main failure causes were found (Luo et al., 1999). For further understanding and simulation in the lab, electrical current tests for parallel groove clamps were conducted and finite element analysis was used to simulate the failure process. Some useful results are summarized and described in this paper. (1) Bolt tension force linearly increases with temperature rise. The force increase rate is up to 43.98 N//spl deg/C. Thus, oxidation on contact surfaces is accelerated and contact resistance increases accordingly. (2) Vibration model FEM analysis shows that there are many kinds of vibration modes for parallel groove clamps, including clamp shaking, rocking and swinging and relative motion between upper and lower covers. The scope of mode frequency is close to vibration of overhead power lines induced by wind, which may cause two-thirds of failed samples with obvious fretting wear morphology at contact interfaces. (3) Imbalance of contact resistance among clamps and connected wires may cause electric current to pass through the bolts, increasing temperature rise and accelerating bolt stress relaxation. (4) Contact force, film resistance and fretting at the contact interfaces are the key points of connector failure.","PeriodicalId":136044,"journal":{"name":"Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130423674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Transition from the anodic arc phase to the cathodic metallic arc phase in vacuum at low DC electrical level 在低直流电压下，真空中由阳极电弧相过渡到阴极金属电弧相

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953194

L. Morin, N. Ben Jemaa, D. Jeannot, H. Sone

{"title":"Transition from the anodic arc phase to the cathodic metallic arc phase in vacuum at low DC electrical level","authors":"L. Morin, N. Ben Jemaa, D. Jeannot, H. Sone","doi":"10.1109/HOLM.2001.953194","DOIUrl":"https://doi.org/10.1109/HOLM.2001.953194","url":null,"abstract":"Contact material transfer in relays has been described in several papers. Transfer from the anode to the cathode has been attributed to the anodic arc phase, and opposite transfer from the cathode to the anode has been attributed to the cathodic arc phase. In a previous paper, we showed that the transition from the anodic to the cathodic arc occurs when a breaking arc becomes longer than a critical arc length, independent of electrical and mechanical parameters. In this paper, we completed our work using the same breaking apparatus (14 VDC, 40 A) equipped with an arc length control device. We showed that the transition from the anodic to the cathodic arc occurs always at the same critical arc length independent of the opening speed and the ambient pressure. Through measurements of material transfer in vacuum, indications are that transfer direction is independent from metallic and gaseous phases, though further work is needed for full confirmation. Finally, we showed that it was possible to distinguish the transition from anodic to cathodic arc by observing the evolution of the arc spots on the rivets.","PeriodicalId":136044,"journal":{"name":"Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132562448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 20

An original method to assess the surface power density brought by an electric arc of short duration, and short electrode gap to the electrodes-case of copper electrodes 一种评估短持续电弧和短电极间隙对铜电极壳产生的表面功率密度的新颖方法

Proceedings of the Forth-Seventh IEEE Holm Conference on Electrical Contacts (IEEE Cat. No.01CH37192) Pub Date : 2001-09-10 DOI: 10.1109/HOLM.2001.953219

P. Teste, T. Leblanc, R. Andlauer

引用次数: 1