轴向磁场触点在真空半周期拉弧过程中的熔化

E. Taylor, M.B. Schulmann, P. Slade
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引用次数: 15

摘要

在真空中对电触点进行大电流电弧操作会产生明显的熔化和侵蚀模式。在轴向磁场(AMF)下,对Cu-Cr触点进行了单次或多次半周期操作,以研究这些影响。在真空室中绘制电弧的高速电影将观察到的熔化模式与电弧行为联系起来。从初始桥柱开始,电弧通过扩展过渡模式,在阳极上产生局部浅熔区域。AMF水平足以导致随后在整个接触间隙形成完全漫射的大电流电弧,在过渡电弧区域以外的阳极上产生很少或没有熔化。电弧可视化和接触侵蚀实验的结合表明,过渡电弧模式是导致接触熔化的主要原因。最终触点分离的位置在多次操作中移动,导致阳极熔化区域依次移动。这可以从单个电流半周期模糊熔化模式。因此,在单独的半周期VI试验和真空电弧膜中使用拉伸电弧为研究大电流下AMF接触侵蚀过程提供了一种改进的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Melting on axial magnetic field contacts during half-cycle drawn arcs in vacuum
High-current arcing operations on electrical contacts in vacuum produce distinct patterns of melting and erosion. Single or multiple half-cycle operations have been performed on Cu-Cr contacts with an axial magnetic field (AMF) to investigate these effects. High-speed movies of drawn arcs inside a vacuum chamber connect the observed melting patterns to the arc behavior. From the initial bridge column, the arc passes through an expanding transition mode, producing a localized region of shallow melting on the anode. The AMF level is sufficient to cause the subsequent formation of a fully diffuse high-current arc throughout the contact gap, generating little or no melting on the anode beyond the transition arc region. The combination of arc visualization and contact erosion experiments demonstrates that the transition arc mode is a critically dominant cause of contact melting. The location of final contact separation moves over multiple operations, causing the region of anode melting to move in turn. This can obscure the melting patterns from the individual half-cycles of current. Therefore, using drawn arcs in both individual half-cycle VI tests and vacuum arc movies provides an improved method for studying the process of AMF contact erosion at high current.
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