IEEE Transactions on Software Engineering最新文献

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A Retrospective of ChangeDistiller: Tree Differencing for Fine-Grained Source Code Change Extraction
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-02-04 DOI: 10.1109/tse.2025.3538326
Beat Fluri, Michael Würsch, Martin Pinzger, Harald Gall
{"title":"A Retrospective of ChangeDistiller: Tree Differencing for Fine-Grained Source Code Change Extraction","authors":"Beat Fluri, Michael Würsch, Martin Pinzger, Harald Gall","doi":"10.1109/tse.2025.3538326","DOIUrl":"https://doi.org/10.1109/tse.2025.3538326","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"35 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-02-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143125139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
On “Prioritizing Test Cases for Regression Testing”
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-02-04 DOI: 10.1109/tse.2025.3538490
Gregg Rothermel, Roland Untch
{"title":"On “Prioritizing Test Cases for Regression Testing”","authors":"Gregg Rothermel, Roland Untch","doi":"10.1109/tse.2025.3538490","DOIUrl":"https://doi.org/10.1109/tse.2025.3538490","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"55 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-02-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143125062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Program Slicing: A Brief Retrospective
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-02-04 DOI: 10.1109/tse.2025.3538279
Keith B. Gallagher, Suzanne J. Kozaitis
{"title":"Program Slicing: A Brief Retrospective","authors":"Keith B. Gallagher, Suzanne J. Kozaitis","doi":"10.1109/tse.2025.3538279","DOIUrl":"https://doi.org/10.1109/tse.2025.3538279","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"50 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-02-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143125140","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
One Sentence Can Kill the Bug: Auto-Replay Mobile App Crashes From One-Sentence Overviews
IF 6.5 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-02-03 DOI: 10.1109/TSE.2025.3535938
Yuchao Huang;Junjie Wang;Zhe Liu;Mingyang Li;Song Wang;Chunyang Chen;Yuanzhe Hu;Qing Wang
{"title":"One Sentence Can Kill the Bug: Auto-Replay Mobile App Crashes From One-Sentence Overviews","authors":"Yuchao Huang;Junjie Wang;Zhe Liu;Mingyang Li;Song Wang;Chunyang Chen;Yuanzhe Hu;Qing Wang","doi":"10.1109/TSE.2025.3535938","DOIUrl":"10.1109/TSE.2025.3535938","url":null,"abstract":"Crash reports play a crucial role in software maintenance as they inform developers about the issues encountered in mobile applications. Developers must reproduce the reported crash before fixing it, which is extremely time-consuming and tedious. Existing studies have focused on automatic crash reproduction with step-by-step instructions. However, a non-neglectable portion of crash reports only provides a one-sentence overview, which merely describes the final crash-triggering action. These reports require developers to invest more effort in understanding and fixing the issues while existing techniques cannot handle them due to the lack of step-by-step guidance, thus calling for a greater need for automatic support. Leveraging the capability of Large Language Models (LLMs) in combining acting and reasoning, we propose ReActDroid, an automated approach to reproduce mobile application crashes directly from the crash overview. ReActDroid utilizes ReAct prompting to augment the app-specific knowledge and exploration history, enabling the LLM to derive the necessary steps for triggering the crash from a comprehensive and historical perspective. We evaluate ReActDroid on 102 crash reports from 69 popular Android apps and successfully reproduce 57.8% of the crashes, surpassing the performance of state-of-the-art baselines by 69% to 321%. Besides, the average reproducing time is 51.8 seconds, outperforming the baselines by 73% to 949%. We also evaluate the usefulness of ReActDroid with promising results.","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"51 4","pages":"975-989"},"PeriodicalIF":6.5,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143083737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Three “Influential” Software Design Papers
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-01-31 DOI: 10.1109/tse.2025.3535911
David Lorge Parnas
{"title":"Three “Influential” Software Design Papers","authors":"David Lorge Parnas","doi":"10.1109/tse.2025.3535911","DOIUrl":"https://doi.org/10.1109/tse.2025.3535911","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"77 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143072456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Model-Based Systems Engineering and TCAS II: Thirty Years Later
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-01-31 DOI: 10.1109/tse.2025.3537537
Mats P.E. Heimdahl, Nancy G. Leveson
{"title":"Model-Based Systems Engineering and TCAS II: Thirty Years Later","authors":"Mats P.E. Heimdahl, Nancy G. Leveson","doi":"10.1109/tse.2025.3537537","DOIUrl":"https://doi.org/10.1109/tse.2025.3537537","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"50 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143072459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Retrospective: Data Mining Static Code Attributes to Learn Defect Predictors
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-01-31 DOI: 10.1109/tse.2025.3537406
Tim Menzies
{"title":"Retrospective: Data Mining Static Code Attributes to Learn Defect Predictors","authors":"Tim Menzies","doi":"10.1109/tse.2025.3537406","DOIUrl":"https://doi.org/10.1109/tse.2025.3537406","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"20 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143072404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Reflection on “Advances in Software Inspections”
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-01-31 DOI: 10.1109/tse.2025.3537080
Adam A. Porter, Harvey Siy, Lawrence Votta
{"title":"A Reflection on “Advances in Software Inspections”","authors":"Adam A. Porter, Harvey Siy, Lawrence Votta","doi":"10.1109/tse.2025.3537080","DOIUrl":"https://doi.org/10.1109/tse.2025.3537080","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"47 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143072457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
PATEN: Identifying Unpatched Third-Party APIs via Fine-Grained Patch-Enhanced AST-Level Signature
IF 6.5 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-01-31 DOI: 10.1109/TSE.2025.3537102
Li Lin;Jialin Ye;Chao Wang;Rongxin Wu
{"title":"PATEN: Identifying Unpatched Third-Party APIs via Fine-Grained Patch-Enhanced AST-Level Signature","authors":"Li Lin;Jialin Ye;Chao Wang;Rongxin Wu","doi":"10.1109/TSE.2025.3537102","DOIUrl":"10.1109/TSE.2025.3537102","url":null,"abstract":"Using a third-party library (TPL) API that is still unpatched with respect to known vulnerabilities would introduce severe security threats, and thus it is important to detect unpatched API as early as possible. Existing vulnerability detection methods often fail to identify subtle differences between patched and vulnerable versions of code, leading to high rates of false positives and missed vulnerabilities. Addressing these limitations, we propose a novel approach that employs a fine-grained, patch-enhanced Abstract Syntax Tree (AST) level signature. This approach consists of two key steps: patch-induced AST difference extraction and vulnerability trace refinement. These steps enable the detailed analysis of structural changes due to patches and enhance the accuracy of vulnerability detection by focusing on the critical elements of code changes. Building on this methodology, we introduce PATEN, a tool designed to accurately detect unpatched TPL APIs. Our evaluation, conducted on a large dataset, demonstrates that PATEN significantly outperforms the state-of-the-art approaches. Specifically, PATEN identified 82 critical vulnerabilities across numerous open-source projects, demonstrating a substantial advancement in the field of unpatched TPL API detection and highlighting its practical implications for improving software security.","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"51 4","pages":"990-1006"},"PeriodicalIF":6.5,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143072405","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simplifying and Isolating Failure-Inducing Input: A Retrospective on Delta Debugging
IF 7.4 1区 计算机科学
IEEE Transactions on Software Engineering Pub Date : 2025-01-31 DOI: 10.1109/tse.2025.3537167
Andreas Zeller, Ralf Hildebrandt
{"title":"Simplifying and Isolating Failure-Inducing Input: A Retrospective on Delta Debugging","authors":"Andreas Zeller, Ralf Hildebrandt","doi":"10.1109/tse.2025.3537167","DOIUrl":"https://doi.org/10.1109/tse.2025.3537167","url":null,"abstract":"","PeriodicalId":13324,"journal":{"name":"IEEE Transactions on Software Engineering","volume":"8 1","pages":""},"PeriodicalIF":7.4,"publicationDate":"2025-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143072462","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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