{"title":"Recognising aircraft without radar databases","authors":"R. Miller, C. Sarno, D. Shephard","doi":"10.1049/ESS:20050106","DOIUrl":"https://doi.org/10.1049/ESS:20050106","url":null,"abstract":"To identify enemy aircraft effectively, radar systems depend on a database of known targets. This article outlines a system which can be used if radar signatures are not available. It considers classification of aircraft using data derived from non-radar sources. The key approach adopted here is the use of a scattering-centre model from which prominent scattering features on each candidate aircraft are derived. These features are then compared with features derived from measured profiles in order to classify the radar target. The results given here support the notion of a model consisting of a small number of scattering centres, but indicate that the variation of backscatter with aspect angle from these scattering centres may be quite complicated.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127068805","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Happiness is a mass-market box [Roadmap]","authors":"P. Dempsey","doi":"10.1049/ESS:20050110","DOIUrl":"https://doi.org/10.1049/ESS:20050110","url":null,"abstract":"The two 800lb gorillas of the PC world, Microsoft and Intel, believe thay have spotted their best chance yet to get into one of the most coveted slots in consumer electronics - managing entertainment from under the TV.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115128089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"C-change for safety critical systems","authors":"C. Hills","doi":"10.1049/ESS:20050105","DOIUrl":"https://doi.org/10.1049/ESS:20050105","url":null,"abstract":"The group responsible for MISRA-C, which defines a safer C for embedded systems, has updated the standard. This article outlines the reasons behind the changes and details the rule changes, additions and deletions. It also recommends mechanical static analysis which is one of the most efficient, and reliable, ways of checking source code. The issue of safety integrity levels is clarified along with the compliance levels of current compilers.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"2016 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127485823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Intelligent agents for radar systems","authors":"E. Hughes, M. Lewis","doi":"10.1049/ESS:20050107","DOIUrl":"https://doi.org/10.1049/ESS:20050107","url":null,"abstract":"This article describes a system using multilevel agents which offer a way of tracking radar objects that fly close to the ground or are otherwise difficult to detect. Our research uses a pre-track system that exploits spatio-temporal Doppler correlations to help reduce ghost targets, as well as reducing false alarms due to noise. Further, it makes use of intelligent agents. The two main processing methods we have used are dynamic programming and Hough transforms. In summary, the system is a simplified multiple hypothesis tracker, tightly coupled to a self-adaptive, context sensitive, spatio-temporal CFAR system. In environments with diverse clutter characteristics, the self-adaptive nature of the agent system self-organises using simple processing and by assuming that there will be too few data measurements to establish the clutter statistics accurately, a robust sub-optimal solution is formed.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-05-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124515661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Verification in layers","authors":"R. Ninane","doi":"10.1049/ess:20050203","DOIUrl":"https://doi.org/10.1049/ess:20050203","url":null,"abstract":"The semiconductor industry is becoming familiar with the claim that \"design is no longer a problem\". Although this is undoubtedly an exaggeration, there is a sound underlying point: engineering teams producing large, complex chips spend more time on verification - checking that the design they have produced actually does what they intend it to - than they do on the initial design phase itself. In the process, first-pass silicon success has fallen to barely one third of all designs, and, frustratingly, the vast majority of first-pass failures are due to errors that could have been spotted with better functional verification techniques. This article looks at the need to use a more structured and layered approach to verification that allows test code to be reused more easily, and bury the old, unstructured techniques.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114518653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Reboot for the router [IC design]","authors":"C. Edwards","doi":"10.1049/ESS:20050205","DOIUrl":"https://doi.org/10.1049/ESS:20050205","url":null,"abstract":"The move to chip designs that use sub-100 nm dimensions is bringing big changes to the tool flows. Magma Design Automation and Synopsys have decided to rewrite their tools to perform physical synthesis, placement and routing because of concerns over the way that on-chip interconnect behaves on 65 nm processes and, to some extent, 90 nm. It is a change that has been coming for a while because on-chip wiring has steadily become a bigger problem since the introduction of the 0.5 μm process more than 10 years ago. Chip-level tool vendors have begun revising their implementation tools as they aim for the upcoming crop of designs for the 65 nm process.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"87 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131887477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Bringing maturity to test [software testing]","authors":"K. K. Rana, Shahbaz Ahmad","doi":"10.1049/ESS:20050206","DOIUrl":"https://doi.org/10.1049/ESS:20050206","url":null,"abstract":"Test is an often forgotten process when software development organisations try to improve their software quality practices. The Test Maturity Model is one way of helping software teams to evolve better testing practices and keep development on track.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125916821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Distant shores [chip design outsourcing]","authors":"L. Collins","doi":"10.1049/ESS:20050202","DOIUrl":"https://doi.org/10.1049/ESS:20050202","url":null,"abstract":"The business of transforming register transfer level (RTL) descriptions of chips into finished designs could become commoditised, according to speakers at a recent panel on outsourcing design. Some panelists said they believe the chip industry could be on the verge of spawning a chip-implementation services business that will parallel the development of wafer foundries.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"12 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123304337","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Express yourself [embedded computers]","authors":"C. Edwards","doi":"10.1049/ESS:20050208","DOIUrl":"https://doi.org/10.1049/ESS:20050208","url":null,"abstract":"The arrival of PCI-Express in Intel's high-end chipsets for PC motherboards looks set to drive the next wave of embedded computer standards. PCI Express is being pushed into a number of standards for embedded boards, but as this article notes, it is COM Express that is picking up the most interest. COM Express is a specification for computer modules that plug into a baseboard or a server blade: the acronym COM stands for 'computer on module'. The idea is that system builders can mix and match processors on one motherboard that carries the I/O signals they need for each specific application.","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121102842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ending the loneliness of the high-density board designer","authors":"C. Edwards","doi":"10.1049/ess:20040604","DOIUrl":"https://doi.org/10.1049/ess:20040604","url":null,"abstract":"","PeriodicalId":132835,"journal":{"name":"Electronic Systems and Software","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2005-02-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132719452","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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