{"title":"On the Asymptotic Evaluation of the Physical Optics Approximation for Plane Wave Scattering by Circular Conducting Cylinders","authors":"N. Ta, H. Shirai","doi":"10.1587/transele.2021rep0001","DOIUrl":"https://doi.org/10.1587/transele.2021rep0001","url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"36 1","pages":"128-136"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85566804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Naoya Hieda, K. Morimoto, A. Iguchi, Y. Tsuji, T. Kashiwa
{"title":"Topology Optimal Design of NRD Guide Devices Using Function Expansion Method and Evolutionary Approaches","authors":"Naoya Hieda, K. Morimoto, A. Iguchi, Y. Tsuji, T. Kashiwa","doi":"10.1587/transele.2021esp0005","DOIUrl":"https://doi.org/10.1587/transele.2021esp0005","url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"14 1","pages":"652-659"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76261020","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
N. Matsuo, K. Yoshida, K. Sumitomo, K. Yamana, T. Tabei
{"title":"Ambipolar Conduction of λ-DNA Transistor Fabricated on SiO2/Si Structure","authors":"N. Matsuo, K. Yoshida, K. Sumitomo, K. Yamana, T. Tabei","doi":"10.1587/transele.2021ecp5049","DOIUrl":"https://doi.org/10.1587/transele.2021ecp5049","url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"320 1","pages":"369-374"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76459834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multi-Port Amplifier with Enhanced Linearity and Isolation Employing Feed-Forward Techniques","authors":"Yasunori Suzuki, T. Hirota, T. Nojima","doi":"10.1587/transele.2022mmp0005","DOIUrl":"https://doi.org/10.1587/transele.2022mmp0005","url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"35 1","pages":"501-508"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80500939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Effect of Inter Layers on the Ferroelectric Undoped HfO2 Formation","authors":"Masakazu Tanuma, Joong‐Won Shin, S. Ohmi","doi":"10.1587/transele.2021fup0004","DOIUrl":"https://doi.org/10.1587/transele.2021fup0004","url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"8 1","pages":"584-588"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79095864","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Numerical Analysis of Pulse Response for Slanted Grating Structure with an Air Regions in Dispersion Media by TE Case","authors":"R. Ozaki, T. Yamasaki","doi":"10.1587/transele.2021res0001","DOIUrl":"https://doi.org/10.1587/transele.2021res0001","url":null,"abstract":"SUMMARY In our previous paper, we have proposed a new numerical technique for transient scattering problem of periodically arrayed dispersion media by using a combination of the fast inversion Laplace transform (FILT) method and Fourier series expansion method (FSEM), and analyzed the pulse response for several widths of the dispersion media or rectangular cavities. From the numerical results, we examined the influence of a periodically arrayed dispersion media with a rectangular cavity on the pulse response. In this paper, we analyzed the transient scattering problem for the case of dispersion media with slanted air regions by utilizing a combination of the FILT, FSEM, and multilayer division method (MDM), and investigated an influence for the slanted angle of an air region. In addition, we verified the computational accuracy for term of the MDM and truncation mode number of the electromagnetic fields.","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"15 1","pages":"154-158"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82513101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Kiyoshi Kamimura, Y. Fujimaki, Haruki Hoshikawa, Kazuki Imaizumi, K. Izawa, R. Nagase
{"title":"Return Loss Measurement Procedure for Multicore Fiber Connectors","authors":"Kiyoshi Kamimura, Y. Fujimaki, Haruki Hoshikawa, Kazuki Imaizumi, K. Izawa, R. Nagase","doi":"10.1587/transele.2022emp0001","DOIUrl":"https://doi.org/10.1587/transele.2022emp0001","url":null,"abstract":"SUMMARY Multi-core fiber (MCF) is one of the most promising can- didates for achieving ultra-wideband optical transmission in the near fu-ture. To build a network using MCF, a high-performance and reliable MCF connector is indispensable. We have developed an SC-type optical connector for MCF and confirmed its excellent optical performance, mechanical durability, and environmental reliability. To put the communication system using MCF into practical use, it is necessary to establish a procedure for measuring the initial connection characteristics. Fan-in / fan-out (FIFO) devices are indispensable for measuring the connection characteristics of MCF connectors. To measure the return loss of the MCF connector, it is necessary to remove the influence of reflection at the FIFO itself and at the connection points with the FIFO. In this paper, we compare four types of return loss measurement procedures (three usual method and a new method we proposed) and find that most stable measurement method involves using our new method, the OCWR method without FIFO. The OCWR method without FIFO is considered to be the most advantageous when used for outgoing inspection of connectors. The reason is that it eliminates the mea- surement uncertainty caused by the FIFO and enables speedy measurement.","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"2016 1","pages":"721-728"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89895585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Makihara, T. Takemoto, Shuji Obayashi, A. Ohta, N. Taoka, S. Miyazaki
{"title":"Study on Electron Emission from Phosphorus δ-Doped Si-QDs/Undoped Si-QDs Multiple-Stacked Structures","authors":"K. Makihara, T. Takemoto, Shuji Obayashi, A. Ohta, N. Taoka, S. Miyazaki","doi":"10.1587/transele.2021fup0006","DOIUrl":"https://doi.org/10.1587/transele.2021fup0006","url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"39 1","pages":"610-615"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90049677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Noise Suppression in SiC-MOSFET Body Diode Turn-Off Operation with Simple and Robust Gate Driver","authors":"H. Suzuki, T. Funaki","doi":"10.1587/transele.2021ecp5030","DOIUrl":"https://doi.org/10.1587/transele.2021ecp5030","url":null,"abstract":"","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"52 1","pages":"750-760"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82207799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"4-Cycle-Start-Up Reference-Clock-Less Digital CDR Utilizing TDC-Based Initial Frequency Error Detection with Frequency Tracking Loop","authors":"T. Iizuka, Meikan Chin, T. Nakura, K. Asada","doi":"10.1587/transele.2021ctp0001","DOIUrl":"https://doi.org/10.1587/transele.2021ctp0001","url":null,"abstract":"SUMMARY This paper proposes a reference-clock-less quick-start-up CDR that resumes from a stand-by state only with a 4-bit preamble utilizing a phase generator with an embedded Time-to-Digital Converter (TDC). The phase generator detects 1-UI time interval by using its internal TDC and works as a self-tunable digitally-controlled delay line. Once the phase gen- erator coarsely tunes the recovered clock period, then the residual time difference is finely tuned by a fine Digital-to-Time Converter (DTC). Since the tuning resolution of the fine DTC is matched by design with the time resolution of the TDC that is used as a phase detector, the fine tuning completes instantaneously. After the initial coarse and fine delay tuning, the feedback loop for frequency tracking is activated in order to improve Consecutive Identical Digits (CID) tolerance of the CDR. By applying the frequency tracking architecture, the proposed CDR achieves more than 100bits of CID tolerance. A prototype implemented in a 65nm bulk CMOS process operates at a 0.9 − 2.15Gbps continuous rate. It consumes 5.1 − 8.4mA in its active state and 42µA leakage current in its stand-by state from a 1.0V supply. key words: Clock-and-data recovery (CDR),","PeriodicalId":13259,"journal":{"name":"IEICE Trans. Electron.","volume":"79 1","pages":"544-551"},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83917774","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}