{"title":"2024 Index IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Vol. 43","authors":"","doi":"10.1109/TCAD.2024.3518672","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3518672","url":null,"abstract":"","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 12","pages":"4865-4939"},"PeriodicalIF":2.7,"publicationDate":"2024-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10804686","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142844453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems publication information","authors":"","doi":"10.1109/TCAD.2024.3498115","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3498115","url":null,"abstract":"","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 12","pages":"C3-C3"},"PeriodicalIF":2.7,"publicationDate":"2024-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10762833","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142694654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems society information","authors":"","doi":"10.1109/TCAD.2024.3498113","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3498113","url":null,"abstract":"","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 12","pages":"C2-C2"},"PeriodicalIF":2.7,"publicationDate":"2024-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10762834","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142679261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Formal Verification of Virtualization-Based Trusted Execution Environments","authors":"Hasini Witharana;Hansika Weerasena;Prabhat Mishra","doi":"10.1109/TCAD.2024.3443008","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3443008","url":null,"abstract":"Trusted execution environments (TEEs) provide a secure environment for computation, ensuring that the code and data inside the TEE are protected with respect to confidentiality and integrity. Virtual machine (VM)-based TEEs extend this concept by utilizing virtualization technology to create isolated execution spaces that can support a complete operating system or specific applications. As the complexity and importance of VM-based TEEs grow, ensuring their reliability and security through formal verification becomes crucial. However, these technologies often operate without formal assurances of their security properties. Our research introduces a formal framework for representing and verifying VM-based TEEs. This approach provides a rigorous foundation for defining and verifying key security attributes for safeguarding execution environments. To demonstrate the applicability of our verification framework, we conduct an analysis of real-world TEE platforms, including Intel’s trust domain extensions (TDX). This work not only emphasizes the necessity of formal verification in enhancing the security of VM-based TEEs but also provides a systematic approach for evaluating the resilience of these platforms against sophisticated adversarial models.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"4262-4273"},"PeriodicalIF":2.7,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142636465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems publication information","authors":"","doi":"10.1109/TCAD.2024.3479791","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3479791","url":null,"abstract":"","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"C3-C3"},"PeriodicalIF":2.7,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10745784","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142636469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"NOVELLA: Nonvolatile Last-Level Cache Bypass for Optimizing Off-Chip Memory Energy","authors":"Aritra Bagchi;Ohm Rishabh;Preeti Ranjan Panda","doi":"10.1109/TCAD.2024.3446720","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3446720","url":null,"abstract":"Contemporary multiprocessor systems-on-chips (MPSoCs) continue to confront energy-related challenges, primarily originating from off-chip data movements. Nonvolatile memories (NVMs) emerge as a promising solution with their high-storage density and low leakage, yet they suffer from slow and expensive write operations. Writebacks from higher-level caches and responses from off-chip memory create significant contention at the shared nonvolatile last-level cache (LLC), affecting system performance with increased queuing for critical reads. Previous research primarily addresses the performance issues by trying to mitigate contention through the bypassing of NVM writes. Nevertheless, off-chip memory energy, one of the most critical components of system energy, remains unaddressed by state-of-the-art bypass policies. While certain energy components, such as leakage and refresh, depend on system performance, performance-optimizing bypass policies may not ensure energy efficiency. Aggressive bypass decisions aimed only at performance enhancement could degrade cache reuse, potentially outweighing reductions in leakage and refresh energies with the increase in off-chip dynamic energy. While both performance and off-chip memory energy are influenced by both cache contention and reuse, the tradeoffs for achieving optimal performance versus optimal energy are different. We introduce nonvolatile last-level cache bypass for optimizing off-chip memory energy (NOVELLA), a novel bypass policy for the nonvolatile LLC, to optimize off-chip memory energy by exploiting tradeoffs between cache contention and reuse, achieving a balance across different components of the energy. Compared to a naïve no-bypass baseline, while state-of-the-art reuse-aware bypass solutions reduce off-chip memory energy consumption by up to 8%, and a contention- and reuse-aware bypass baseline by 12%, NOVELLA achieves significant energy savings of 21% across diverse SPEC workloads.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"3913-3924"},"PeriodicalIF":2.7,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142594994","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"FreePrune: An Automatic Pruning Framework Across Various Granularities Based on Training-Free Evaluation","authors":"Miao Tang;Ning Liu;Tao Yang;Haining Fang;Qiu Lin;Yujuan Tan;Xianzhang Chen;Duo Liu;Kan Zhong;Ao Ren","doi":"10.1109/TCAD.2024.3443694","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3443694","url":null,"abstract":"Network pruning is an effective technique that reduces the computational costs of networks while maintaining accuracy. However, pruning requires expert knowledge and hyperparameter tuning, such as determining the pruning rate for each layer. Automatic pruning methods address this challenge by proposing an effective training-free metric to quickly evaluate the pruned network without fine-tuning. However, most existing automatic pruning methods only investigate a certain pruning granularity, and it remains unclear whether metrics benefit automatic pruning at different granularities. Neural architecture search also studies training-free metrics to accelerate network generation. Nevertheless, whether they apply to pruning needs further investigation. In this study, we first systematically analyze various advanced training-free metrics for various granularities in pruning, and then we investigate the correlation between the training-free metric score and the after-fine-tuned model accuracy. Based on the analysis, we proposed FreePrune score, a more general metric compatible with all pruning granularities. Aiming at generating high-quality pruned networks and unleashing the power of FreePrune score, we further propose FreePrune, an automatic framework that can rapidly generate and evaluate the candidate networks, leading to a final pruned network with both high accuracy and pruning rate. Experiments show that our method achieves high correlation on various pruning granularities and comprehensively improves the accuracy.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"4033-4044"},"PeriodicalIF":2.7,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142594995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Implementing Neural Networks on Nonvolatile FPGAs With Reprogramming","authors":"Hao Zhang;Jian Zuo;Huichuan Zheng;Sijia Liu;Meihan Luo;Mengying Zhao","doi":"10.1109/TCAD.2024.3443708","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3443708","url":null,"abstract":"NV-FPGAs have attracted significant attention in research due to their high density, low leakage power, and reduced error rates. The nonvolatile memory (NVM) crossbar’s compute-in-memory (CiM) capability further enables NV-FPGAs to execute high-efficiency, high-throughput neural network (NN) inference tasks. However, with the rapid increase in network size and considering that the parameter size often exceeds the memory capacity of the field programmable gate array (FPGA), implementing the entire network on a single FPGA chip becomes impractical. In this article, we utilize FPGA’s inherent run time reprogramming feature to implement oversized NNs on NV-FPGAs. This approach splits NN models into multiple tasks for the cyclical execution. Specifically, we propose a performance-driven task adapter (PD-Adapter), which aims to achieve high-performance NN inference by employing the task deployment to optimize settings, such as processing element size and quantity, and the task switching to select the most suitable switching type for each task. We integrate the proposed PD-Adapter into an open-source toolchain and evaluate it. Experimental results demonstrate that the PD-Adapter can achieve a run time reduction of 85.37% and 76.12% compared to the baseline and execution-time-first policy, respectively.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"3961-3972"},"PeriodicalIF":2.7,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142595016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Indoor–Outdoor Energy Management for Wearable IoT Devices With Conformal Prediction and Rollout","authors":"Nuzhat Yamin;Ganapati Bhat","doi":"10.1109/TCAD.2024.3448382","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3448382","url":null,"abstract":"Internet of Things (IoT) devices have the potential to enable a wide range of applications, including smart health and agriculture. However, they are limited by their small battery capacities. Utilizing energy harvesting is a promising approach to augment the battery life of IoT devices. However, relying solely on harvested energy is insufficient due to the stochastic nature of ambient sources. Predicting and accounting for uncertainty in the energy harvest (EH) is critical for optimal energy management (EM) in wearable IoT devices. This article proposes a two-step uncertainty-aware EH prediction and management framework for wearable IoT devices. First, the framework employs an energy-efficient conformal prediction (CP) method to predict future EH and construct prediction intervals. Contrasting to prior CP approaches, we propose constructing the prediction intervals using a combination of residuals from previous hours and days. Second, the framework proposes a near-optimal EM approach that utilizes a rollout algorithm. The rollout algorithm efficiently simulates various energy allocation trajectories as a function of predicted EH bounds. Using results from the rollout, the proposed approach constructs energy allocation bounds that maximize application utility (quality of service) with a high probability. Evaluations using real-world energy data from ARAS and Mannheim datasets show that the proposed CP for EH prediction provides 93% coverage probability with an average width of 9.5 J and 1.9 J, respectively. Moreover, EM using the rollout algorithm provides energy allocation decisions that are within 1.9–2.9 J of the optimal with minimal overhead.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"3370-3381"},"PeriodicalIF":2.7,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142595861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Meta-Scanner: Detecting Fault Attacks via Scanning FPGA Designs Metadata","authors":"Hassan Nassar;Jonas Krautter;Lars Bauer;Dennis Gnad;Mehdi Tahoori;Jörg Henkel","doi":"10.1109/TCAD.2024.3443769","DOIUrl":"https://doi.org/10.1109/TCAD.2024.3443769","url":null,"abstract":"With the rise of the big data, processing in the cloud has become more significant. One method of accelerating applications in the cloud is to use field programmable gate arrays (FPGAs) to provide the needed acceleration for the user-specific applications. Multitenant FPGAs are a solution to increase efficiency. In this case, multiple cloud users upload their accelerator designs to the same FPGA fabric to use them in the cloud. However, multitenant FPGAs are vulnerable to low-level denial-of-service attacks that induce excessive voltage drops using the legitimate configurations. Through such attacks, the availability of the cloud resources to the nonmalicious tenants can be hugely impacted, leading to downtime and thus financial losses to the cloud service provider. In this article, we propose a tool for the offline classification to identify which FPGA designs can be malicious during operation by analysing the metadata of the bitstream generation step. We generate and test 475 FPGA designs that include 38% malicious designs. We identify and extract five relevant features out of the metadata provided from the bitstream generation step. Using ten-fold cross-validation to train a random forest classifier, we achieve an average accuracy of 97.9%. This significantly surpasses the conservative comparison with the state-of-the-art approaches, which stands at 84.0%, as our approach detects stealthy attacks undetectable by the existing methods.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"3443-3454"},"PeriodicalIF":2.7,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142595917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}