IEEE Journal of Quantum Electronics最新文献

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High-Resolution Thermal Profiling of a High-Power Diode Laser Facet During Aging 高功率二极管激光表面老化过程的高分辨率热分析
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-10-19 DOI: 10.1109/JQE.2023.3325256
Luyang Wang;Aman Kumar Jha;Salmaan H. Baxamusa;Jack Kotovsky;Robert J. Deri;Rebecca B. Swertfeger;Prabhu Thiagarajan;Mark T. Crowley;Gerald Thaler;Jiyon Song;Kevin P. Pipe
{"title":"High-Resolution Thermal Profiling of a High-Power Diode Laser Facet During Aging","authors":"Luyang Wang;Aman Kumar Jha;Salmaan H. Baxamusa;Jack Kotovsky;Robert J. Deri;Rebecca B. Swertfeger;Prabhu Thiagarajan;Mark T. Crowley;Gerald Thaler;Jiyon Song;Kevin P. Pipe","doi":"10.1109/JQE.2023.3325256","DOIUrl":"10.1109/JQE.2023.3325256","url":null,"abstract":"We study the facet temperature distribution of a high-power diode laser over its lifetime using a noncontact, high spatial resolution CCD-based thermoreflectance technique. Based on the known correlation between non-radiative defects and heating, thermal maps can provide valuable information regarding the formation and evolution of small point defects that are at or near the facet during aging. In the laser under study in this work we measure the appearance of local hot spots on the facet, including concentrated hot spots that appear just before or just after COD and are correlated with loss of local light emission. The locations of these hot spots do not exhibit morphology changes in high-resolution SEM imaging of the facet, indicating that the related defects are too small to be observable in SEM or are located at some depth under the facet. Prior to COD, we measure a gradual facet temperature increase accompanied by a gradual optical power decrease and gradual facet optical absorption increase, indicating gradual degradation of the laser.","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"60 1","pages":"1-11"},"PeriodicalIF":2.5,"publicationDate":"2023-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135058867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
AlGaInP-Based Visible Red Photonic Crystal Surface Emitting Lasers Without Regrowth 基于algainp的无再生可见红色光子晶体表面发射激光器
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-10-17 DOI: 10.1109/JQE.2023.3325238
Tsung-Yeh Ku;Chi-Hao Wang;Ming-Chin Hsieh;Gray Lin
{"title":"AlGaInP-Based Visible Red Photonic Crystal Surface Emitting Lasers Without Regrowth","authors":"Tsung-Yeh Ku;Chi-Hao Wang;Ming-Chin Hsieh;Gray Lin","doi":"10.1109/JQE.2023.3325238","DOIUrl":"https://doi.org/10.1109/JQE.2023.3325238","url":null,"abstract":"AlGaInP-based visible red photonic crystal (PC) surface emitting lasers (SELs) without regrowth were demonstrated for the first time. Square-latticed and circular-shaped holes were deeply etched to form the air-pillar PC structure, where indium-tin-oxide was deployed to facilitate both current injection and laser light transmission. The optically pumped and electrically injected PC-SELs lased in wavelength range of 626-667 nm and 650-670 nm, respectively. For the best PC-SEL of 656-nm emissions, threshold current density was as low as 1.4 kA/cm2 and maximum laser power over 18 mW was achieved at 2.5 A. The un-optimized V-shaped PC holes led to weak optical coupling, which was manifested in the reconstructed band structure without clear bandgap opening at \u0000<inline-formula> <tex-math>$Gamma $ </tex-math></inline-formula>\u0000 point. Therefore, one-dimensional lasing oscillation was favored and radiation far-field exhibited two-lobe pattern. Lastly, temperature dependent threshold currents and lasing wavelengths of PC-SELs were measured and investigated in terms of gain-cavity detuning.","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 6","pages":"1-6"},"PeriodicalIF":2.5,"publicationDate":"2023-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"109157714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Theoretical Simulation of Extended Mid-Wave Infrared High Operating Temperature InSb pBn Photodetectors 扩展中波红外高工作温度InSb - pBn光电探测器的理论模拟
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-10-17 DOI: 10.1109/JQE.2023.3325233
Yinlin Zhang;Chuang Li;Daqian Guo;Keming Cheng;Kai Shen;Jiang Wu
{"title":"Theoretical Simulation of Extended Mid-Wave Infrared High Operating Temperature InSb pBn Photodetectors","authors":"Yinlin Zhang;Chuang Li;Daqian Guo;Keming Cheng;Kai Shen;Jiang Wu","doi":"10.1109/JQE.2023.3325233","DOIUrl":"https://doi.org/10.1109/JQE.2023.3325233","url":null,"abstract":"The application of the barrier architecture exhibits the potential in reducing the noise current and improving the performance of photodetectors. However, the development of mid-infrared InSb barrier detector is lagging far behind its III-V counterparts due to the problem of lattice mismatch. In this paper, we proposed two InSb barrier detectors that have reduced dark current and raised operating temperatures with the help of commercial software APSYS platform. The incorporation of a In0.72 Al0.28Sb barrier architecture to the InSb absorber offers a significant dark current reduction over the conventional InSb photodiode, regardless the presence of strain-induced defects within the barrier layers. At 150 K, the InSb bulk barrier detector has a cutoff wavelength at \u0000<inline-formula> <tex-math>$5.65 mu text{m}$ </tex-math></inline-formula>\u0000. With a barrier design, the dark current, \u0000<inline-formula> <tex-math>$9.96times 10^{-3}text{A}$ </tex-math></inline-formula>\u0000/cm2 at −220 mV, is about 77 times lower than the InSb photodiode and the specific detectivity is about \u0000<inline-formula> <tex-math>$2.07times 10 ^{11}$ </tex-math></inline-formula>\u0000 cm Hz\u0000<inline-formula> <tex-math>$^{1/2}$ </tex-math></inline-formula>\u0000/W with a–220 mV bias voltage, which brings approximately an order of magnitude of performance improvement.","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 6","pages":"1-7"},"PeriodicalIF":2.5,"publicationDate":"2023-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"109157715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A Design Approach for a Homogeneous Hole-Assisted Multi-Core Fiber Through Hole-Allocation Around the Central Core for Minimizing Crosstalk 一种均匀孔辅助多芯光纤的设计方法,通过中心芯周围的孔分配来减少串扰
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-10-09 DOI: 10.1109/JQE.2023.3322678
Sonali Basak;Santu Sarkar;Abhijit K. Mukhopadhyay;Nikhil Ranjan Das;Madhusudan Mishra
{"title":"A Design Approach for a Homogeneous Hole-Assisted Multi-Core Fiber Through Hole-Allocation Around the Central Core for Minimizing Crosstalk","authors":"Sonali Basak;Santu Sarkar;Abhijit K. Mukhopadhyay;Nikhil Ranjan Das;Madhusudan Mishra","doi":"10.1109/JQE.2023.3322678","DOIUrl":"https://doi.org/10.1109/JQE.2023.3322678","url":null,"abstract":"In this paper, a new design of seven-core hole-assisted multi-core fiber with surrounding each core is presented. Here, the holes are assumed to be filled with materials having very low refractive index contrast with cladding. Coupling of light from the central core to the outer cores of seven-core structure is investigated by rotating the holes in the range +30° to −30° around the central core. The optimum range of angles for which coupling is very low is estimated for different values of core-pitch. An average value of crosstalk and power penalty are then calculated from the minimum coupling region for core pitch \u0000<inline-formula> <tex-math>$40~mu text{m}$ </tex-math></inline-formula>\u0000 to \u0000<inline-formula> <tex-math>$45~mu text{m}$ </tex-math></inline-formula>\u0000 where crosstalk goes below the threshold limit (which is taken as −30dB). An analytical model has also been developed based on proposed design and the results are seen to be in good agreement with the results from simulation. The proposed optimum design is extremely helpful for enhancing the capacity and efficiency of Space division multiplexing based applications with low crosstalk and power penalty.","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 6","pages":"1-8"},"PeriodicalIF":2.5,"publicationDate":"2023-10-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"109157718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Journal of Quantum Electronics information for authors IEEE量子电子学杂志作者信息
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-09-27 DOI: 10.1109/JQE.2023.3313751
{"title":"IEEE Journal of Quantum Electronics information for authors","authors":"","doi":"10.1109/JQE.2023.3313751","DOIUrl":"https://doi.org/10.1109/JQE.2023.3313751","url":null,"abstract":"","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 5","pages":"C3-C3"},"PeriodicalIF":2.5,"publicationDate":"2023-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/3/10189366/10265265.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49940695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Journal of Quantum Electronics publication information IEEE量子电子学杂志出版信息
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-09-27 DOI: 10.1109/JQE.2023.3313753
{"title":"IEEE Journal of Quantum Electronics publication information","authors":"","doi":"10.1109/JQE.2023.3313753","DOIUrl":"https://doi.org/10.1109/JQE.2023.3313753","url":null,"abstract":"","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 5","pages":"C2-C2"},"PeriodicalIF":2.5,"publicationDate":"2023-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/3/10189366/10265279.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49920648","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Blank Page 空白页
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-09-27 DOI: 10.1109/JQE.2023.3313749
{"title":"Blank Page","authors":"","doi":"10.1109/JQE.2023.3313749","DOIUrl":"https://doi.org/10.1109/JQE.2023.3313749","url":null,"abstract":"","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 5","pages":"C4-C4"},"PeriodicalIF":2.5,"publicationDate":"2023-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/3/10189366/10265281.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49940694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A PAM-4 100 Gbps Single-Drive Strained SiGe Optical Lumped Mach-Zehnder Modulator for O-Band Application PAM-4 100 Gbps单驱动应变SiGe光集总马赫-曾德调制器的o波段应用
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-09-25 DOI: 10.1109/JQE.2023.3318587
Youngjoo Bae;Seong Ui An;Taewon Jin;Younghyun Kim
{"title":"A PAM-4 100 Gbps Single-Drive Strained SiGe Optical Lumped Mach-Zehnder Modulator for O-Band Application","authors":"Youngjoo Bae;Seong Ui An;Taewon Jin;Younghyun Kim","doi":"10.1109/JQE.2023.3318587","DOIUrl":"https://doi.org/10.1109/JQE.2023.3318587","url":null,"abstract":"We propose the carrier-depletion type strained SiGe optical lumped Mach-Zehnder modulators (MZMs) with L-shape PN junction (LSPN) with a highly CMOS-compatible fabrication method. The device performance is numerically investigated and optimized by technology computer-aided design (TCAD) simulation. The optimized SiGe LSPN MZ modulator exhibits a high modulation efficiency of 0.52 Vcm for \u0000<inline-formula> <tex-math>$V_{pi }L$ </tex-math></inline-formula>\u0000 with reverse bias voltages of 0V to −2V at 1310 nm wavelength, which is 3.5 times smaller than the conventional PN junction device thanks to strained SiGe. Furthermore, we carried out the large-signal simulation with 1-mW input power. As a result, we found that the SiGe LSPN MZ modulator can achieve 0.54 mW (−2.7 dBm) and 0.17 mW (−7.7 dBm) eye-openings for 50-Gbps NRZ-OOK and 100-Gbps PAM-4, respectively, taking advantage of single-drive configuration and optimizing input characteristics impedance. We expect this SiGe lumped MZ modulator can be one of the promising solutions for replacing a very long Si MZ modulator with traveling-wave electrodes.","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 6","pages":"1-7"},"PeriodicalIF":2.5,"publicationDate":"2023-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"109157717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-Power III–V/Si Integrated Wavelength Tunable Laser for L-Band Applications l波段应用的高功率III-V /Si集成波长可调谐激光器
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-09-25 DOI: 10.1109/JQE.2023.3318589
Changpeng Li;Shaoshuai Sui;Feng Gao;Yiming Wang;Xiao Xu;Jia Zhao
{"title":"High-Power III–V/Si Integrated Wavelength Tunable Laser for L-Band Applications","authors":"Changpeng Li;Shaoshuai Sui;Feng Gao;Yiming Wang;Xiao Xu;Jia Zhao","doi":"10.1109/JQE.2023.3318589","DOIUrl":"https://doi.org/10.1109/JQE.2023.3318589","url":null,"abstract":"We demonstrate a III-V/Si widely wavelength tunable laser covering the entire L-band for the optical communication systems. By carefully designing the silicon ring filter, low threshold current and high output power are expected. Using the standard silicon photonic process, the silicon filter chip is fabricated and compactly packaged with a reflective semiconductor optical amplifier. The low threshold current of 20 mA is achieved at 15 °C, and over 76 mW output power is obtained at 320 mA. The wavelength tuning range from 1565 nm to 1635 nm is realized with the side-mode suppression ratio larger than 50 dB. Furthermore, the intrinsic linewidth narrower than 25 kHz and relative intensity noise below −152 dB/Hz is achieved, which can support the coherent communications.","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 6","pages":"1-6"},"PeriodicalIF":2.5,"publicationDate":"2023-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/iel7/3/10257665/10262027.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49957115","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Vulnerability in Free Space QKD Due to Detection Coupling Mismatch 空闲空间QKD检测耦合失配漏洞研究
IF 2.5 3区 工程技术
IEEE Journal of Quantum Electronics Pub Date : 2023-09-25 DOI: 10.1109/JQE.2023.3318585
Tanya Sharma;Ayan Biswas;Pooja Chandravanshi;Shashi Prabhakar;Ravindra P. Singh
{"title":"Vulnerability in Free Space QKD Due to Detection Coupling Mismatch","authors":"Tanya Sharma;Ayan Biswas;Pooja Chandravanshi;Shashi Prabhakar;Ravindra P. Singh","doi":"10.1109/JQE.2023.3318585","DOIUrl":"https://doi.org/10.1109/JQE.2023.3318585","url":null,"abstract":"Practical implementations of QKD protocols involve devices which are not perfect, and an eavesdropper may exploit this to gain information leading to attacks. Here we have considered the effects of coupling mismatch between the detectors. We find possible information leakage to Eve due to coupling mismatch at the receiver’s detectors in terms of mutual information between the eavesdropper and receiver. The experiment has been performed for the Gaussian and Laguerre-Gaussian modes of the signal. This aspect becomes essential while implementing free space QKD using a satellite. The results suggest that accounting for detection coupling mismatch is crucial to avoid side-channel attacks.","PeriodicalId":13200,"journal":{"name":"IEEE Journal of Quantum Electronics","volume":"59 6","pages":"1-7"},"PeriodicalIF":2.5,"publicationDate":"2023-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49957117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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