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Fresenius' Journal of Analytical Chemistry最新文献

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Grazing incidence X-ray diffraction analysis of surface modified SiC layers 表面改性碳化硅层掠入射x射线衍射分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050421
J. Neuhäuser, Gerd Treffer, Hermann Plänitz, W. Wagner, G. Marx
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引用次数: 2
Atomic resolution of defects in graphite studied by STM 用STM研究石墨中缺陷的原子分辨率
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050425
F. Atamny, A. Baiker, R. Schlögl
{"title":"Atomic resolution of defects in graphite studied by STM","authors":"F. Atamny, A. Baiker, R. Schlögl","doi":"10.1007/S002160050425","DOIUrl":"https://doi.org/10.1007/S002160050425","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"80 1","pages":"344-348"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88434082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS 聚对苯二甲酸乙酯的ESCA和TOF-SIMS表面分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050398
F. Lang, Y. Pitton, H. Mathieu, D. Landolt, E. M. Moser
{"title":"Surface analysis of polyethyleneterephthalate by ESCA and TOF-SIMS","authors":"F. Lang, Y. Pitton, H. Mathieu, D. Landolt, E. M. Moser","doi":"10.1007/S002160050398","DOIUrl":"https://doi.org/10.1007/S002160050398","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"15 6 1","pages":"251-254"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83818134","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 22
Investigation of argon ion bombarded RexSi1-x thin film composites by XPS, SEM and AES 氩离子轰击RexSi1-x薄膜复合材料的XPS, SEM和AES研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050420
R. Reiche, S. Oswald, H. Vinzelberg, C. Metz, J. Schumann, A. Heinrich, K. Wetzig
{"title":"Investigation of argon ion bombarded RexSi1-x thin film composites by XPS, SEM and AES","authors":"R. Reiche, S. Oswald, H. Vinzelberg, C. Metz, J. Schumann, A. Heinrich, K. Wetzig","doi":"10.1007/S002160050420","DOIUrl":"https://doi.org/10.1007/S002160050420","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"19 1","pages":"329-332"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90885509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Investigation of surface changes on mica induced by atomic force microscopy imaging under liquids 液体作用下原子力显微镜成像对云母表面变化的研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050427
R. Resch, G. Friedbacher, M. Grasserbauer
{"title":"Investigation of surface changes on mica induced by atomic force microscopy imaging under liquids","authors":"R. Resch, G. Friedbacher, M. Grasserbauer","doi":"10.1007/S002160050427","DOIUrl":"https://doi.org/10.1007/S002160050427","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"75 1","pages":"352-355"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80959289","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Experiments on the analysis of thick, non-conductive metallic oxide layers on sheet using HF-SNMS 用HF-SNMS分析薄板上厚的非导电金属氧化物层的实验
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050393
D. Sommer, A. Essing, Herbert Patotzki
{"title":"Experiments on the analysis of thick, non-conductive metallic oxide layers on sheet using HF-SNMS","authors":"D. Sommer, A. Essing, Herbert Patotzki","doi":"10.1007/S002160050393","DOIUrl":"https://doi.org/10.1007/S002160050393","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"515 1","pages":"236-239"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77452740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
AES depth profiles of thin SiC-layers – simulation of ion beam induced mixing 碳化硅薄层的AES深度分布-离子束诱导混合的模拟
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050428
G. Ecke, H. Rössler, V. Cimalla, J. Liday
{"title":"AES depth profiles of thin SiC-layers – simulation of ion beam induced mixing","authors":"G. Ecke, H. Rössler, V. Cimalla, J. Liday","doi":"10.1007/S002160050428","DOIUrl":"https://doi.org/10.1007/S002160050428","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"18 1","pages":"355-357"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75851329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
SIMS-analysis on B, N, and C containing layers 含B、N、C层的sims分析
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050410
M. Grießer, H. Hutter, M. Grasserbauer, W. Kalss, R. Haubner, B. Lux
{"title":"SIMS-analysis on B, N, and C containing layers","authors":"M. Grießer, H. Hutter, M. Grasserbauer, W. Kalss, R. Haubner, B. Lux","doi":"10.1007/S002160050410","DOIUrl":"https://doi.org/10.1007/S002160050410","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"1 1","pages":"293-296"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85588011","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Investigation of aerosol particles by atomic force microscopy 原子力显微镜对气溶胶粒子的研究
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050403
G. Köllensperger, G. Friedbacher, M. Grasserbauer, L. Dorffner
{"title":"Investigation of aerosol particles by atomic force microscopy","authors":"G. Köllensperger, G. Friedbacher, M. Grasserbauer, L. Dorffner","doi":"10.1007/S002160050403","DOIUrl":"https://doi.org/10.1007/S002160050403","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"21 1","pages":"268-273"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85721427","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
New insights into the ZnO/a-SiC:H(B) interface using XPS analysis 利用XPS分析对ZnO/a-SiC:H(B)界面的新见解
Fresenius' Journal of Analytical Chemistry Pub Date : 1997-05-21 DOI: 10.1007/S002160050386
E. Böhmer, F. Siebke, H. Wagner
{"title":"New insights into the ZnO/a-SiC:H(B) interface using XPS analysis","authors":"E. Böhmer, F. Siebke, H. Wagner","doi":"10.1007/S002160050386","DOIUrl":"https://doi.org/10.1007/S002160050386","url":null,"abstract":"","PeriodicalId":12375,"journal":{"name":"Fresenius' Journal of Analytical Chemistry","volume":"26 1","pages":"210-213"},"PeriodicalIF":0.0,"publicationDate":"1997-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80873865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
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