Fresenius' Zeitschrift für analytische Chemie最新文献

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Analysis of oxygenated compounds in motor gasoline by HRGC/FTIR/MS HRGC/FTIR/MS分析车用汽油中含氧化合物
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476616
J. Schulz
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引用次数: 2
Ion channeling analysis of buried epitaxial Co silicides 埋藏外延钴硅化物的离子通道分析
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572380
K. Kohlhof, S. Mantl, B. Stritzker
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引用次数: 1
Optical and electron spectroscopy of magneto-optical storage films 磁光存储薄膜的光学和电子能谱
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572358
D. Weller, W. Reim
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引用次数: 1
Optimization in headspace GC/FTIR 顶空GC/FTIR优化
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476615
A. Rau, H. Görtz
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引用次数: 0
Surface analysis for Si-wafers using total reflection X-ray fluorescence analysis 用全反射x射线荧光分析硅片表面
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572369
W. Berneike, J. Knoth, H. Schwenke, U. Weisbrod
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引用次数: 20
AES and SIMS profiling of buried silicide layers formed by 6 MeV high dose nickel implantation into silicon 6mev高剂量镍注入硅形成的埋藏硅化物层的AES和SIMS谱图
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572365
A. Schönborn, J. Lindner, E. Kaat, H. Hubert, M. Grasserbauer, G. Friedbacher
{"title":"AES and SIMS profiling of buried silicide layers formed by 6 MeV high dose nickel implantation into silicon","authors":"A. Schönborn, J. Lindner, E. Kaat, H. Hubert, M. Grasserbauer, G. Friedbacher","doi":"10.1007/BF00572365","DOIUrl":"https://doi.org/10.1007/BF00572365","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84242677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Comparative surface and bulk analysis of oxygen in Si3N4 powders 氮化硅粉末中氧的比较表面和体积分析
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572363
H. Jenett, H. Bubert, E. Grallath
{"title":"Comparative surface and bulk analysis of oxygen in Si3N4 powders","authors":"H. Jenett, H. Bubert, E. Grallath","doi":"10.1007/BF00572363","DOIUrl":"https://doi.org/10.1007/BF00572363","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90966909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 20
Investigation of deep states in thin films of hydrogenated amorphous silicon by photo-induced current transient spectroscopy 用光致电流瞬态光谱法研究氢化非晶硅薄膜的深态
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00572371
J. Herion, M. Tapiero, J. Zielinger, N. Benjelloun-Saki, W. Beyer
{"title":"Investigation of deep states in thin films of hydrogenated amorphous silicon by photo-induced current transient spectroscopy","authors":"J. Herion, M. Tapiero, J. Zielinger, N. Benjelloun-Saki, W. Beyer","doi":"10.1007/BF00572371","DOIUrl":"https://doi.org/10.1007/BF00572371","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83655894","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
On the analysis of platinum group metals 铂族金属的分析
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476636
M. Schuster, D. Hollmann, K. König
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引用次数: 0
Applications of synchrotron radiation in surface analysis 同步辐射在表面分析中的应用
Fresenius' Zeitschrift für analytische Chemie Pub Date : 1989-01-01 DOI: 10.1007/BF00476637
B. Lengeler
{"title":"Applications of synchrotron radiation in surface analysis","authors":"B. Lengeler","doi":"10.1007/BF00476637","DOIUrl":"https://doi.org/10.1007/BF00476637","url":null,"abstract":"","PeriodicalId":12372,"journal":{"name":"Fresenius' Zeitschrift für analytische Chemie","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1989-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82310674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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