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2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)最新文献

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Basics of Medical EMC 医疗EMC基础知识
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/EMCSI.2018.8495237
D. P. Ray
{"title":"Basics of Medical EMC","authors":"D. P. Ray","doi":"10.1109/EMCSI.2018.8495237","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495237","url":null,"abstract":"","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121356677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mitigation of High-Frequency CM Conducted EMI in Offline Switching Power Supplies 离线开关电源高频CM传导电磁干扰的抑制
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/EMCSI.2018.8495332
M. Ashritha, M. Sudheer
{"title":"Mitigation of High-Frequency CM Conducted EMI in Offline Switching Power Supplies","authors":"M. Ashritha, M. Sudheer","doi":"10.1109/EMCSI.2018.8495332","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495332","url":null,"abstract":"This paper presents a new technique to minimize high-frequency CM conducted EMI noise in offline flyback SMPS and Near Unity Power Factor (NUPF) converter. In this technique, separate ground paths are provided for noise sources on the primary and secondary side of the high-frequency transformer. This is achieved by splitting the C<inf>z</inf> capacitor of line filter into C<inf>m</inf><inf>1</inf> and C<inf>m</inf><inf>2</inf> with their mid-point grounded. By this method, a considerable reduction in CM conducted EMI in the high-frequency range can be achieved. Hence the size of the EMI line filter can be reduced. Experimentation and simulations are carried out with C<inf>m</inf><inf>1</inf>, C<inf>m</inf><inf>2</inf> and C<inf>z</inf> capacitor for offline flyback configured NUPF and SMPS in the critical conduction mode. The experimental and simulation results are presented and are found to be in close agreement.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126579303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Lightning performance and protection systems 雷电性能和保护系统
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/EMCSI.2018.8495220
R. Procopio
{"title":"Lightning performance and protection systems","authors":"R. Procopio","doi":"10.1109/EMCSI.2018.8495220","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495220","url":null,"abstract":"Introduction","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125854479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An Update on U.S. and Canada Wireless Rulemakings 美国和加拿大无线规则制定的最新情况
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/emcsi.2018.8495281
G. Kiemel
{"title":"An Update on U.S. and Canada Wireless Rulemakings","authors":"G. Kiemel","doi":"10.1109/emcsi.2018.8495281","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495281","url":null,"abstract":"This article consists only of a collection of slides from the author's conference presentation.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124062124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Workshop, WED-PM-5 EMC for Home Appliances, Including Power Converters Applications 研讨会，家用电器的EMC，包括电源转换器的应用
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/EMCSI.2018.8495234
F. Leferink
{"title":"Workshop, WED-PM-5 EMC for Home Appliances, Including Power Converters Applications","authors":"F. Leferink","doi":"10.1109/EMCSI.2018.8495234","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495234","url":null,"abstract":"","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126601101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fast Full Board Crosstalk Scan for Signal Integrity Sign-Off for High Speed PCB Designs 快速全板串扰扫描信号完整性签名高速PCB设计
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/EMCSI.2018.8495173
F. Ling, Kevin Cai, Bidyut Sen
{"title":"Fast Full Board Crosstalk Scan for Signal Integrity Sign-Off for High Speed PCB Designs","authors":"F. Ling, Kevin Cai, Bidyut Sen","doi":"10.1109/EMCSI.2018.8495173","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495173","url":null,"abstract":"Crosstalk analysis for high speed PCB design becomes more and more important due to the high data rate and tightly coupled routing. Traditional circuit-based analysis can not meet the accuracy demand. Three-dimensional (3D) full-wave electromagnetic solver is required to capture the complex 3D PCB environment and the frequency-dependent phenomena. However it is prohibitively expensive to simulate the practical large board cases and the resultant tabulated S-parameter cannot be directly used to quantify the crosstalk level. This paper introduces a novel hybrid solver techniques with improved speed and accuracy. The new crosstalk metrics to quantify the crosstalk level are also developed by post-processing S-parameter. Combining these two techniques allows designers to achieve full board crosstalk in a few hours as planned intended with using the tool, which significantly reduces the post-layout review time, allows layout optimization and ensures a timely sign-off.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117341124","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Long Beach Tutorial WED-PM-4 Introduction to Medical EMC Risk Management of Electromagnetic Disturbances, or EMI 长滩教程wd - pm -4介绍电磁干扰的医疗EMC风险管理，或EMI
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/emcsi.2018.8495431
K. Armstrong
{"title":"Long Beach Tutorial WED-PM-4 Introduction to Medical EMC Risk Management of Electromagnetic Disturbances, or EMI","authors":"K. Armstrong","doi":"10.1109/emcsi.2018.8495431","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495431","url":null,"abstract":"Contents Introduction to Functional Safety IEC 61508 and ISO 14971 EMC immunity testing: it's deficiencies for Risk Management Ed.4's requirements for Risk Managing EM disturbances The first practical approach to Risk-Managing EM disturbances Applying the first practical approach to complying with 60601-1-2 Ed.4 60601-1-2 Ed.4 and compliance with Product Liability Legislation","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127480838","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Special Issues Related to the Frequency Range 2kHz-150kHz 频率范围2kHz-150kHz的特殊问题
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/emcsi.2018.8495308
A. Mceachern
{"title":"Special Issues Related to the Frequency Range 2kHz-150kHz","authors":"A. Mceachern","doi":"10.1109/emcsi.2018.8495308","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495308","url":null,"abstract":"2kHz-150kHz Emissions","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129062390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EMI Modeling and Reduction in Modern Power Electronics Systems 现代电力电子系统中的电磁干扰建模与降低
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/EMCSI.2018.8495226
Shuo Wang
{"title":"EMI Modeling and Reduction in Modern Power Electronics Systems","authors":"Shuo Wang","doi":"10.1109/EMCSI.2018.8495226","DOIUrl":"https://doi.org/10.1109/EMCSI.2018.8495226","url":null,"abstract":"A. EMI Measurement","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130322545","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Measurements of Wireless Devices in Reverberation Chambers 混响室中无线设备的测量
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI) Pub Date : 2018-07-01 DOI: 10.1109/emcsi.2018.8495440
D. Senic, K. Remley
{"title":"Measurements of Wireless Devices in Reverberation Chambers","authors":"D. Senic, K. Remley","doi":"10.1109/emcsi.2018.8495440","DOIUrl":"https://doi.org/10.1109/emcsi.2018.8495440","url":null,"abstract":"This article consists only of a collection of slides from the author's conference presentation.","PeriodicalId":120342,"journal":{"name":"2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2018-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130620521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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