{"title":"Application of the Thermal Step Method to characterize the charge ability of XLPE insulation with and without ethylacrylate copolymer","authors":"G. Platbrood, S. Agnel, A. Toureille","doi":"10.1109/CEIDP.2001.963592","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963592","url":null,"abstract":"In Belgium, two types of high voltage underground power cables with different compositions have been installed, namely XLPE (an homopolymer cross linked polyethylene) and XLPE-EA copolymerized with ethylacrylate. The presence of space charge is now acknowledged to have a main role on electrical stresses applied to the insulation, and consequently in insulation lifetime. Part of the study was devoted to obtain a better characterization of their capacity of this two installed insulations to store space charges under AC. in this paper, results of space charge measurements by the Thermal Step Method (TSM) and Thermally Stimulated Depolarization Currents (TSDC) of cable pieces after the manufacturing, are presented. During alternative poling (65 kV RMS : 13 kV/mm RMS) of a 15 kV cable, only the XLPE cable stocks space charge after ten weeks. No charge has been observed in the XLPE-EA insulation after six months with the TSM technique. Some measurements have been carried out with a Scanning Electron Microscope (SEM) used in mirror mode. The bulk sample analysis by TSM and SEM used in mirror mode results are compared and conclusions are given for the XLPE-EA insulation in comparison with the XLPE. These results show differences between the two XLPE cables, and an evolution of the physical structure of the polyethylene insulation is highlighted.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130906824","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Prediction of the breakdown voltage in a point-barrier-plane air gap using neural networks","authors":"L. Mokhnache, A. Boubakeur","doi":"10.1109/CEIDP.2001.963559","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963559","url":null,"abstract":"We have developed a neural network as tool for prediction of the breakdown voltage in a point-barrier-plane air gap for longest air gaps. We have used an array of figures from the experiments (tests) done in the HV laboratories of the Polytechnique University of Warsaw by A.Boubakeur (1979) changing many parameters of the air gap system. This shows promise for use in industry. The application of the radial basis function Gaussian network (RBGF) method trained by random optimisation method (ROM) is found to be very effective in its predictions. The choice of the RBFG method is argued by the fact that it's local characteristic avoids divergence problems. In practice, it would be very economical to use artificial neural networks in the investigations on high voltage insulation breakdown predictions. In fact, we may reduce the laboratory tests and let the network predict the remained breakdown voltages at longest distances. We may propose the application of this method to the prediction of other parameters (barrier width, barrier conductivity, air gap length, barrier hole diameter...); in general, in the case where we need to extrapolate non-linear functions giving their variation versus a given parameter.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133866954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electroluminescence based determination of the space charge limited field","authors":"Yang Cao, S. Boggs","doi":"10.1109/CEIDP.2001.963528","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963528","url":null,"abstract":"Determination of the space charge limited field is compromised by photon detection sensitivity. As a result, the experimental determined field is affected by the test frequency and by the photomultiplier dark count. The electroluminescence inception field determined with semicon needle is in good agreement with the space charge limited field measured using a guarded needle electrode, while metal needles with tip radii smaller than 5 /spl mu/m lead to much greater predicted space charge limited field due to the much smaller light emitting volume. This electrode size effect is explained, and a correction method is proposed which results in a more accurate determination of the space charge limited field from electroluminescence measurements.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"224 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132427736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"PD performance of dielectric insulations in presence of low frequency conducted disturbances: a life model approach","authors":"M. di Lorenzo del Casale, P. Romano, R. Schifani","doi":"10.1109/CEIDP.2001.963542","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963542","url":null,"abstract":"The problem of how 50 Hz power supply voltage distortions affect PD activity and the lifetime of epoxy resin insulation systems, is addressed. In this aim, harmonics up to the 5/sup th/ were summed up to the voltage fundamental component changing the waveform from the sinusoidal into its peaked or flattened resulting shape. In a previous paper, life tests were performed using a sphere-plane electrode configuration; now the experimental research has been carried out, and an analysis of the PD aging phenomena was performed in both sinusoidal and non-sinusoidal life tests by a digital PD system. A good agreement has been:found between the physical phenomena involved during the aging and the obtained new related lifetimes. Finally, a life model is proposed to establish a functional relationship between the shape characteristics of the applied voltage and the failure times, thus providing a useful tool to evaluate the epoxy life changes due to the presence of voltage harmonics with respect to the sinusoidal supply.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"22 1 Suppl 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115349497","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Effect of frequency on XLPE cable insulation at high electric field","authors":"S. Bamji, A. Bulinski, L. Cissé, K. Tohyama","doi":"10.1109/CEIDP.2001.963513","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963513","url":null,"abstract":"Electroluminescence (EL), the emission of light in dielectrics subjected to high electric stress, is a very sensitive technique to detect space charge injection and the very early stages of insulation degradation. In this paper the EL technique is employed to determine the effect of frequency in the range of 5 to 600 Hz on unaged and aged crosslinked polyethylene (XLPE) insulation of underground high voltage cables. The number of EL pulses emitted from XLPE and the area of the space charge region simultaneously obtained by the PMT and CCD camera are studied as the frequency of the ac voltage is varied between 5 and 600 Hz. The implications of the frequency range on diagnostic tests performed on the polymeric insulation of underground power cables is discussed.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123924528","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optimisation of a numerical model for analysis of partial discharge phenomena in a flat cavity","authors":"R. Candela, R. Schifani, P. Romano","doi":"10.1109/CEIDP.2001.963639","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963639","url":null,"abstract":"The failure probability of the insulation in HV components can be studied through partial discharge (PD) measurements to detect defects. A numerical model, previously developed by the authors for the simulation of PD activity in a spherical void embedded in epoxy resin, is implemented for a flat cavity under a divergent electric field. This simulates very well the real working conditions encountered in the insulation of electrical machines. The model is developed taking into account all the geometric and electrical parameters, and a fine examination on physical parameters playing a fundamental role on the PD phenomenon is carried out. In particular, a more accurate formulation of the work function and a finite elements analysis (FEA) of the electric field inside the cavity has been applied. A new approach is investigated to reproduce the uncertainty of the discharge phenomenon. A probability function distribution, obtained by Weibull analysis, gains the best results. In order to obtain the best fitting of the model output to the experimental PD data, a strong procedure based on an heuristic algorithm is performed. This algorithm detects the minimum of a quality function that evaluates the distance between the PD patterns of the numerical model and of the experimental data. After a description of the numerical model adopted, a comparison between the experimental and the simulated data are presented together with comments and remarks.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"184 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121271693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Larsson, Albin Roslund, A. Dernfalk, S. Gubanski
{"title":"Remote and non-intrusive diagnostics of high-voltage insulation materials using laser-induced fluorescence spectroscopy","authors":"A. Larsson, Albin Roslund, A. Dernfalk, S. Gubanski","doi":"10.1109/CEIDP.2001.963574","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963574","url":null,"abstract":"A new method for remote and non-intrusive diagnostics of high-voltage insulation and insulation materials is presented. The method is based on laser-induced fluorescence (LIF) spectroscopy. The relationship between the LIF-spectrum and different material and surface characteristics of silicone rubber samples are studied. These characteristics include hydrophobicity, filler content and biological growth. Furthermore, 33-kV silicone rubber insulators that have been naturally aged in a tropical environment have also been studied. We conclude that laser-induced fluorescence has a significant potential to become a highly useful technique for contact-free and non-intrusive monitoring of the status of insulator materials in high-voltage systems.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116247244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The effect of a finite conductivity on the stability of a falling liquid film subjected to a normal electric field","authors":"A. Gonzalez, A. Castellanos","doi":"10.1109/CEIDP.2001.963596","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963596","url":null,"abstract":"The dynamics of a liquid film falling down an inclined plane wall has been studied in a wide range of situations. In particular, electric fields have been studied as a tool to destabilize or destroy a film. In this work, we consider the effect of a finite, but large, conductivity in the liquid, compared to the case of a perfectly conducting film. The finite conductivity introduces new dissipative terms, as the Joule effect, but also new forms of transforming electrical energy into mechanical energy, through surface stresses. Assuming long wave sinusoidal deformations, a modified dispersion relation is found, that incorporates the new stabilizing and destabilizing factors. The result can be understood in terms of the energy processes involved.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"86 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123812437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A brief history of gaseous dielectrics research at NIST","authors":"J. Olthoff, L. Christophorou","doi":"10.1109/CEIDP.2001.963539","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963539","url":null,"abstract":"Researchers at the National Institute of Standards and Technology (NIST) have investigated gaseous dielectrics for more than 20 years. Significant technical accomplishments in this area include a detailed understanding of the physics and chemistry of corona-induced decomposition of SF/sub 6/, the determination of important collisional cross sections for dielectric gases, the development of conditional detection techniques for partial discharges, and assessment of potential replacement gases for SF/sub 6/. These and other research areas will be highlighted in this brief history of gaseous dielectrics research at NIST.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122534073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Tardieu, G. Teyssèdre, C. Laurent, G. Montanari, L. Raffaelli
{"title":"Combined space charge and electroluminescence detection in polyethylene under AC stress","authors":"G. Tardieu, G. Teyssèdre, C. Laurent, G. Montanari, L. Raffaelli","doi":"10.1109/CEIDP.2001.963482","DOIUrl":"https://doi.org/10.1109/CEIDP.2001.963482","url":null,"abstract":"Time-resolved space charge and electroluminescence measurements are carried out during 50 Hz AC voltage cycles to probe injection, trapping and recombination of charges in polyethylene films. Space charge detection allows defining a field value above which space charge accumulates. This field is well correlated with the onset for electroluminescence. The behavior is consistent with a model of bipolar injection. It is also shown that different polyethylenes behave differently regarding the field above which charge is injected, providing a way to compare the ability of different materials to sustain AC field.","PeriodicalId":112180,"journal":{"name":"2001 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.01CH37225)","volume":"86 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2001-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123522995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}