IEEE Open Journal of Systems Engineering最新文献

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IEEE Open Journal Of Systems Engineering Information for Authors 面向作者的IEEE系统工程信息开放期刊
IEEE Open Journal of Systems Engineering Pub Date : 2026-01-01 Epub Date: 2026-09-11 DOI: 10.1109/OJSE.2026.3733049
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引用次数: 0
Enhancing Model-Based Systems Engineering via Graph-Theoretic Partitioning and System Model Metrics 通过图论划分和系统模型度量增强基于模型的系统工程
IEEE Open Journal of Systems Engineering Pub Date : 2025-11-04 DOI: 10.1109/OJSE.2025.3628720
Lukas Macha;Julian Padget;Peter Ebner;Chris Brace
{"title":"Enhancing Model-Based Systems Engineering via Graph-Theoretic Partitioning and System Model Metrics","authors":"Lukas Macha;Julian Padget;Peter Ebner;Chris Brace","doi":"10.1109/OJSE.2025.3628720","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3628720","url":null,"abstract":"Verification, validation, and testing of complex cyber-physical systems, such as autonomous vehicles, have traditionally relied on document-intensive processes and physical prototypes. However, accelerated development timelines increasingly challenge the feasibility of these approaches. Model-based systems engineering (MBSE) offers a model-centric alternative that enables new forms of system analysis. This article presents a graph-based methodology for evaluating system modeling language system models using functional flow block diagrams and interface definitions. By transforming system functions into a functional dependence graph and applying community detection techniques, we derive three structural metrics: system complexity, system modularity, and system test effort. The methodology is applied to three case studies, an academic autonomous mobile robot and two industrial automotive propulsion systems, to explore its potential utility. Across these examples, the graph-based approach yielded improvements in all three metrics compared to traditional subject-matter-expert-based partitioning. The findings suggest that graph-based evaluation may support early-stage architectural reasoning and model refactoring in MBSE workflows, with further validation needed to confirm its broader applicability and practical impact.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"3 ","pages":"55-67"},"PeriodicalIF":0.0,"publicationDate":"2025-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11224723","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145674683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Open Journal Of Systems Engineering Information for Authors 面向作者的IEEE系统工程信息开放期刊
IEEE Open Journal of Systems Engineering Pub Date : 2025-10-23 DOI: 10.1109/OJSE.2025.3624522
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引用次数: 0
IEEE Open Journal Of Systems Engineering Information IEEE系统工程信息公开杂志
IEEE Open Journal of Systems Engineering Pub Date : 2025-10-23 DOI: 10.1109/OJSE.2025.3624520
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引用次数: 0
Early Fault Detection in Nuclear Systems: A Digital Engineering Approach 核系统早期故障检测:数字工程方法
IEEE Open Journal of Systems Engineering Pub Date : 2025-04-30 DOI: 10.1109/OJSE.2025.3562518
Maria Coelho;Kaleb Houck;Logan Browning;Piyush Sabharwall;Christopher Folmar;Jack Cavaluzzi;Patrick McClure;Jack Dunker
{"title":"Early Fault Detection in Nuclear Systems: A Digital Engineering Approach","authors":"Maria Coelho;Kaleb Houck;Logan Browning;Piyush Sabharwall;Christopher Folmar;Jack Cavaluzzi;Patrick McClure;Jack Dunker","doi":"10.1109/OJSE.2025.3562518","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3562518","url":null,"abstract":"Nuclear energy systems present unique challenges in terms of ensuring safety, reliability, and efficiency during their design and operation. Early fault detection is critical for mitigating risks and fostering system resilience. However, current methods often fall short at identifying faults during early stages, potentially leading to costly delays and safety risks. The present work proposes a comprehensive digital engineering approach that leverages digital twins, digital threads, model-based systems engineering, artificial intelligence, and immersive extended reality to support early fault detection in nuclear systems. Through a series of case studies, we highlight specific gaps in the fault detection mechanisms of traditional nuclear design and operation processes, then demonstrate a suite of solutions we are working to implement to address these shortcomings in similar projects. Our findings suggest that a digital engineering approach to design and operation can significantly improve fault detection, ultimately leading to reductions in risk.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"3 ","pages":"10-23"},"PeriodicalIF":0.0,"publicationDate":"2025-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10980436","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144108319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Uncertainty and Sensitivity in the Development Lifecycle of Advanced Aerospace Systems 先进航空航天系统开发生命周期中的不确定性和敏感性
IEEE Open Journal of Systems Engineering Pub Date : 2025-04-21 DOI: 10.1109/OJSE.2025.3563149
Timothy L. Eddy;Christopher M. VanYe;Beatrice E. Li;Thomas L. Polmateer;Christopher P. Goyne;John Friend;David Barnes;Megan E. Gunn;Igor Linkov;David L. Slutzky;James H. Lambert
{"title":"Uncertainty and Sensitivity in the Development Lifecycle of Advanced Aerospace Systems","authors":"Timothy L. Eddy;Christopher M. VanYe;Beatrice E. Li;Thomas L. Polmateer;Christopher P. Goyne;John Friend;David Barnes;Megan E. Gunn;Igor Linkov;David L. Slutzky;James H. Lambert","doi":"10.1109/OJSE.2025.3563149","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3563149","url":null,"abstract":"Reliability and assurance of the research enterprise for the development and acquisition of advanced technologies is urgently needed. In particular, aerospace systems are susceptible to endogenous and exogenous disruptions throughout their lifecycles. A principled approach is needed to address sensitivity, trust, security, and risk in the research and development enterprise. A particular concern is for integrated hardware and software devices that are essential to aerospace systems. This article introduces a method for enterprise-level sensitivity analysis of emergent and future conditions that relies on scenario-based preferences to identify the conditions that are most disruptive to the systems acquisition schedule. We demonstrate the method via a comprehensive analysis for the acquisition of advanced hypersonic glide vehicle technologies using thirteen importance/ordering criteria, forty initiatives, and ten scenarios. The approach and results are applicable to reliability assurance and management for a variety of high technology systems. Additionally, the approach is applicable to enterprise reliability and assurance improvements for supply chains, manufacturing, maintenance, repair, etc.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"3 ","pages":"24-38"},"PeriodicalIF":0.0,"publicationDate":"2025-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10972117","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144597696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2024 Index IEEE Open Journal of Systems Engineering Vol. 2 系统工程学报第2卷
IEEE Open Journal of Systems Engineering Pub Date : 2025-01-15 DOI: 10.1109/OJSE.2025.3530707
{"title":"2024 Index IEEE Open Journal of Systems Engineering Vol. 2","authors":"","doi":"10.1109/OJSE.2025.3530707","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3530707","url":null,"abstract":"","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"2 ","pages":"203-208"},"PeriodicalIF":0.0,"publicationDate":"2025-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10843079","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142993423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Extended Technology Readiness Level (eTRL): From Deployment to Obsolescence 扩展技术准备等级(eTRL):从部署到淘汰
IEEE Open Journal of Systems Engineering Pub Date : 2025-01-08 DOI: 10.1109/OJSE.2025.3527288
Roshanak Rose Nilchiani;JD Caddell;Hossein Basereh Taramsari
{"title":"The Extended Technology Readiness Level (eTRL): From Deployment to Obsolescence","authors":"Roshanak Rose Nilchiani;JD Caddell;Hossein Basereh Taramsari","doi":"10.1109/OJSE.2025.3527288","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3527288","url":null,"abstract":"The technology readiness level (TRL) has been used for a few decades by National Aeronautics and Space Administration and the Department of Defense to assess the maturity of a technology and evaluate the risks associated with its development. The traditional TRL measure suggests nine levels, from the conception of technology to maturation and deployment. However, the TRL measure is not designed to monitor a system as it matures, ages, and eventually becomes obsolete. There is a critical need for a new measure that captures the performance status and relevance of a system as it ages and eventually becomes a legacy system. This article proposes a novel measure that extends the existing TRL measure, beginning where the traditional TRL stops measuring. The authors propose an extended technology readiness level (eTRL) that measures the contextual relevance of a system and communicates the risks as it ages, faces various environmental, political, and economic changes, or becomes obsolete. The proposed measure takes advantage of set theory to measure the overlaps in requirements, system performance, and system environment to define the eTRL scale from the system's deployment to obsolescence. The eTRL scale will enable stakeholders and program managers to identify and monitor the aging segments within a system and act as a decision analysis tool. The application of the eTRL is demonstrated through a case study of the B52-H airplane, a successful legacy system.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"3 ","pages":"1-9"},"PeriodicalIF":0.0,"publicationDate":"2025-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10833802","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143107223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Open Journal Of Systems Engineering Information IEEE系统工程信息公开杂志
IEEE Open Journal of Systems Engineering Pub Date : 2025-01-08 DOI: 10.1109/OJSE.2024.3374612
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引用次数: 0
IEEE Open Journal Of Systems Engineering Information for Authors 面向作者的IEEE系统工程信息开放期刊
IEEE Open Journal of Systems Engineering Pub Date : 2025-01-08 DOI: 10.1109/OJSE.2024.3374614
{"title":"IEEE Open Journal Of Systems Engineering Information for Authors","authors":"","doi":"10.1109/OJSE.2024.3374614","DOIUrl":"https://doi.org/10.1109/OJSE.2024.3374614","url":null,"abstract":"","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"2 ","pages":"C3-C3"},"PeriodicalIF":0.0,"publicationDate":"2025-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10834305","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142937958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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