IEEE Open Journal of Systems Engineering最新文献

IEEE Open Journal Of Systems Engineering Information for Authors 面向作者的IEEE系统工程信息开放期刊

IEEE Open Journal of Systems Engineering Pub Date : 2025-10-23 DOI: 10.1109/OJSE.2025.3624522

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IEEE Open Journal Of Systems Engineering Information IEEE系统工程信息公开杂志

IEEE Open Journal of Systems Engineering Pub Date : 2025-10-23 DOI: 10.1109/OJSE.2025.3624520

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Early Fault Detection in Nuclear Systems: A Digital Engineering Approach 核系统早期故障检测：数字工程方法

IEEE Open Journal of Systems Engineering Pub Date : 2025-04-30 DOI: 10.1109/OJSE.2025.3562518

Maria Coelho;Kaleb Houck;Logan Browning;Piyush Sabharwall;Christopher Folmar;Jack Cavaluzzi;Patrick McClure;Jack Dunker

{"title":"Early Fault Detection in Nuclear Systems: A Digital Engineering Approach","authors":"Maria Coelho;Kaleb Houck;Logan Browning;Piyush Sabharwall;Christopher Folmar;Jack Cavaluzzi;Patrick McClure;Jack Dunker","doi":"10.1109/OJSE.2025.3562518","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3562518","url":null,"abstract":"Nuclear energy systems present unique challenges in terms of ensuring safety, reliability, and efficiency during their design and operation. Early fault detection is critical for mitigating risks and fostering system resilience. However, current methods often fall short at identifying faults during early stages, potentially leading to costly delays and safety risks. The present work proposes a comprehensive digital engineering approach that leverages digital twins, digital threads, model-based systems engineering, artificial intelligence, and immersive extended reality to support early fault detection in nuclear systems. Through a series of case studies, we highlight specific gaps in the fault detection mechanisms of traditional nuclear design and operation processes, then demonstrate a suite of solutions we are working to implement to address these shortcomings in similar projects. Our findings suggest that a digital engineering approach to design and operation can significantly improve fault detection, ultimately leading to reductions in risk.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"3 ","pages":"10-23"},"PeriodicalIF":0.0,"publicationDate":"2025-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10980436","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144108319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Uncertainty and Sensitivity in the Development Lifecycle of Advanced Aerospace Systems 先进航空航天系统开发生命周期中的不确定性和敏感性

IEEE Open Journal of Systems Engineering Pub Date : 2025-04-21 DOI: 10.1109/OJSE.2025.3563149

Timothy L. Eddy;Christopher M. VanYe;Beatrice E. Li;Thomas L. Polmateer;Christopher P. Goyne;John Friend;David Barnes;Megan E. Gunn;Igor Linkov;David L. Slutzky;James H. Lambert

{"title":"Uncertainty and Sensitivity in the Development Lifecycle of Advanced Aerospace Systems","authors":"Timothy L. Eddy;Christopher M. VanYe;Beatrice E. Li;Thomas L. Polmateer;Christopher P. Goyne;John Friend;David Barnes;Megan E. Gunn;Igor Linkov;David L. Slutzky;James H. Lambert","doi":"10.1109/OJSE.2025.3563149","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3563149","url":null,"abstract":"Reliability and assurance of the research enterprise for the development and acquisition of advanced technologies is urgently needed. In particular, aerospace systems are susceptible to endogenous and exogenous disruptions throughout their lifecycles. A principled approach is needed to address sensitivity, trust, security, and risk in the research and development enterprise. A particular concern is for integrated hardware and software devices that are essential to aerospace systems. This article introduces a method for enterprise-level sensitivity analysis of emergent and future conditions that relies on scenario-based preferences to identify the conditions that are most disruptive to the systems acquisition schedule. We demonstrate the method via a comprehensive analysis for the acquisition of advanced hypersonic glide vehicle technologies using thirteen importance/ordering criteria, forty initiatives, and ten scenarios. The approach and results are applicable to reliability assurance and management for a variety of high technology systems. Additionally, the approach is applicable to enterprise reliability and assurance improvements for supply chains, manufacturing, maintenance, repair, etc.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"3 ","pages":"24-38"},"PeriodicalIF":0.0,"publicationDate":"2025-04-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10972117","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144597696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

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2024 Index IEEE Open Journal of Systems Engineering Vol. 2 系统工程学报第2卷

IEEE Open Journal of Systems Engineering Pub Date : 2025-01-15 DOI: 10.1109/OJSE.2025.3530707

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The Extended Technology Readiness Level (eTRL): From Deployment to Obsolescence 扩展技术准备等级（eTRL）：从部署到淘汰

IEEE Open Journal of Systems Engineering Pub Date : 2025-01-08 DOI: 10.1109/OJSE.2025.3527288

Roshanak Rose Nilchiani;JD Caddell;Hossein Basereh Taramsari

{"title":"The Extended Technology Readiness Level (eTRL): From Deployment to Obsolescence","authors":"Roshanak Rose Nilchiani;JD Caddell;Hossein Basereh Taramsari","doi":"10.1109/OJSE.2025.3527288","DOIUrl":"https://doi.org/10.1109/OJSE.2025.3527288","url":null,"abstract":"The technology readiness level (TRL) has been used for a few decades by National Aeronautics and Space Administration and the Department of Defense to assess the maturity of a technology and evaluate the risks associated with its development. The traditional TRL measure suggests nine levels, from the conception of technology to maturation and deployment. However, the TRL measure is not designed to monitor a system as it matures, ages, and eventually becomes obsolete. There is a critical need for a new measure that captures the performance status and relevance of a system as it ages and eventually becomes a legacy system. This article proposes a novel measure that extends the existing TRL measure, beginning where the traditional TRL stops measuring. The authors propose an extended technology readiness level (eTRL) that measures the contextual relevance of a system and communicates the risks as it ages, faces various environmental, political, and economic changes, or becomes obsolete. The proposed measure takes advantage of set theory to measure the overlaps in requirements, system performance, and system environment to define the eTRL scale from the system's deployment to obsolescence. The eTRL scale will enable stakeholders and program managers to identify and monitor the aging segments within a system and act as a decision analysis tool. The application of the eTRL is demonstrated through a case study of the B52-H airplane, a successful legacy system.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"3 ","pages":"1-9"},"PeriodicalIF":0.0,"publicationDate":"2025-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10833802","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143107223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

IEEE Open Journal Of Systems Engineering Information IEEE系统工程信息公开杂志

IEEE Open Journal of Systems Engineering Pub Date : 2025-01-08 DOI: 10.1109/OJSE.2024.3374612

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IEEE Open Journal Of Systems Engineering Information for Authors 面向作者的IEEE系统工程信息开放期刊

IEEE Open Journal of Systems Engineering Pub Date : 2025-01-08 DOI: 10.1109/OJSE.2024.3374614

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Transition From Scenario-Based to Outcome-Based Engineering in SE4AI 在 SE4AI 中从基于场景的工程过渡到基于成果的工程

IEEE Open Journal of Systems Engineering Pub Date : 2024-09-19 DOI: 10.1109/OJSE.2024.3464495

Niloofar Shadab;Alejandro Salado;Tyler Cody;Peter A. Beling

{"title":"Transition From Scenario-Based to Outcome-Based Engineering in SE4AI","authors":"Niloofar Shadab;Alejandro Salado;Tyler Cody;Peter A. Beling","doi":"10.1109/OJSE.2024.3464495","DOIUrl":"https://doi.org/10.1109/OJSE.2024.3464495","url":null,"abstract":"As intelligent systems become increasingly integrated into our daily lives, it has become evident that there is a mismatch between traditional systems engineering (SE) practices and the nature of intelligent systems. In this article, we posit that the current SE practices need to change their hyperfocus on scenario-based engineering to a process that is more focused on engineering outcomes in the presence of changing environment. To help enabling such transition, we incorporate closed systems precepts from systems theory into formal SE practices. The concept of closed systems is based on the idea that a system is an entity that is bounded by a physical or conceptual boundary and is isolated from its environment. Closed systems are self-contained and self-regulating, and their behavior can be predicted and controlled based on the system's internal rules and mechanisms. In our previous paper, we formalized different types of closed systems and explored how SE practices can utilize these types for various applications. However, there is a need to transition from theorizing about these types of closure to implementing them in SE processes. In this article, we will demonstrate how closed system precepts can be applied to SE practices using a simple example of an intelligent system. We will explore different aspects of applying closed system formalization from our previous effort, including how to define a system's boundary when there is an intelligent property, how to perform problem formulation, and how to address a system's causal dependencies, in order to build a more scalable and well-scoped system.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"2 ","pages":"190-202"},"PeriodicalIF":0.0,"publicationDate":"2024-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10684457","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142518005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Detecting Defects in Sequential Inputs to Digital Twins Using Machine Learning 利用机器学习检测数字双胞胎顺序输入中的缺陷

IEEE Open Journal of Systems Engineering Pub Date : 2024-09-10 DOI: 10.1109/OJSE.2024.3458841

Nathaniel Brown;Steven Simske

{"title":"Detecting Defects in Sequential Inputs to Digital Twins Using Machine Learning","authors":"Nathaniel Brown;Steven Simske","doi":"10.1109/OJSE.2024.3458841","DOIUrl":"https://doi.org/10.1109/OJSE.2024.3458841","url":null,"abstract":"This article presents a method for detecting defects in sequential data inputs for digital twins (DTs) during simulations, emphasizing the importance of input validation for ensuring the accuracy and reliability of the simulation results. By thoroughly validating input data, researchers and practitioners can have confidence in the validity of their models, ultimately leading to better decision-making processes and outcomes that are more successful. As DTs continue to expand in complexity, there are an increasing number of mechanisms that may produce undesirable output. An external data stream is just one such potential source of faulty DT behavior and must be analyzed during simulation execution. The proposed framework for validating inputs in real time offers a way to improve the quality and credibility of DTs, guiding future research in the evolving field of modeling and simulation. The case study described in this article involves using second-order polynomial regression to detect defects in rocket trajectory data streams, highlighting the effectiveness of validation techniques. This method shows promise, as it successfully identified defects in trajectories in real time using only historical data without knowledge of the future of the data stream. The novelties in this article include using machine learning to validate DT inputs, and performing this validation on sequential data in real time to protect modeled results. This research contributes valuable insights to the field, emphasizing the significance of input validation for enhancing the quality and accuracy of simulation models.","PeriodicalId":100632,"journal":{"name":"IEEE Open Journal of Systems Engineering","volume":"2 ","pages":"179-189"},"PeriodicalIF":0.0,"publicationDate":"2024-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10675423","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142397086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0