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High sensitivity low cost capacitive strain gage 高灵敏度、低成本电容应变计
... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference Pub Date : 2004-05-18 DOI: 10.1109/IMTC.2004.1351063
J. G. D. Silva, A. A. Carvalho, R. D. O. Rodriges
{"title":"High sensitivity low cost capacitive strain gage","authors":"J. G. D. Silva, A. A. Carvalho, R. D. O. Rodriges","doi":"10.1109/IMTC.2004.1351063","DOIUrl":"https://doi.org/10.1109/IMTC.2004.1351063","url":null,"abstract":"This paper describes a high sensitivity low cost capacitive strain gage sensor. The theory, design and sensor construction details are presented. It consists of eight capacitive sensors connected in two full bridges. The capacitive strain gage sensor structure was designed in order to produce high sensitivity and low dependence with temperature. By using a simple signal conditioning circuit constituted by a differential amplifier, a band-pass filter, and a precision rectifier the device can measure forces with resolution of 0.009 N and precision of 98.7%. It is rugged, presents linear response, and good repeatability. It presents sensitivity of 8.7 V/N and fall time of 12 ms.","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2004-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89009493","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Identification of experimental models for control design 控制设计实验模型的辨识
... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference Pub Date : 2001-05-21 DOI: 10.1109/IMTC.2001.928260
P. V. D. Hof
{"title":"Identification of experimental models for control design","authors":"P. V. D. Hof","doi":"10.1109/IMTC.2001.928260","DOIUrl":"https://doi.org/10.1109/IMTC.2001.928260","url":null,"abstract":"The identification of linear models that are particularly suitable for serving as a basis for (robust) model-based control design has recently attracted considerable attention. Both the system identification community and the control community have spent considerable efforts in developing a coherent approach to the problem. Typical problems that have to be dealt with consider questions of optimal experiment design, feedback-relevant system approximations and control-relevant model uncertainty specifications. Research into these problems has delivered several attempts for bridging the gap between identification and control theory. In this lecture these developments are highlighted, directing particular attention to the identification of control-relevant approximate models, the use of closed-loop experimental data for identification, the quantification of model uncertainty, and the use of identification criteria that are motivated by control performance cost functions.","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75578981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
High resolution electron microscopy from imaging towards measuring 高分辨率电子显微镜从成像到测量
... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference Pub Date : 2001-05-21 DOI: 10.1109/IMTC.2001.929564
S. Aert, A. J. D. Dekker, A. Bos, D. Dyck
{"title":"High resolution electron microscopy from imaging towards measuring","authors":"S. Aert, A. J. D. Dekker, A. Bos, D. Dyck","doi":"10.1109/IMTC.2001.929564","DOIUrl":"https://doi.org/10.1109/IMTC.2001.929564","url":null,"abstract":"High resolution electron microscopy is discussed as a measuring, rather than an imaging technique. It is shown that the interpretation of the images could greatly benefit from a quantitative instead of a qualitative approach accompanied by quantitative statistical experimental design.","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2001-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90683265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Composite real-time image processing for railways track profile measurement 铁路轨道轮廓测量的复合实时图像处理
... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference Pub Date : 1999-05-24 DOI: 10.1109/IMTC.1999.777061
C. Alippi, E. Casagrande, F. Scotti, V. Piuri
{"title":"Composite real-time image processing for railways track profile measurement","authors":"C. Alippi, E. Casagrande, F. Scotti, V. Piuri","doi":"10.1109/IMTC.1999.777061","DOIUrl":"https://doi.org/10.1109/IMTC.1999.777061","url":null,"abstract":"Checking railway status is critical to guarantee high operating safety, proper maintenance schedule, low maintenance and operating costs. This operation consists of the analysis of the rail profile and level as well as overall geometry and undulation. Traditional detection systems are based on mechanical devices in contact with the track. Innovative approaches are based on laser scanning and image analysis. This paper presents an efficient composite technique for track profile extraction with real-time image processing. High throughput is obtained by algorithmic pre-filtering to restrict the image area containing the track profile, while high accuracy is achieved by neural reconstruction of the profile itself.","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1999-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84997987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 128
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