High resolution electron microscopy from imaging towards measuring

... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference Pub Date : 2001-05-21 DOI:10.1109/IMTC.2001.929564

S. Aert, A. J. D. Dekker, A. Bos, D. Dyck

引用次数: 2

Abstract

High resolution electron microscopy is discussed as a measuring, rather than an imaging technique. It is shown that the interpretation of the images could greatly benefit from a quantitative instead of a qualitative approach accompanied by quantitative statistical experimental design.

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高分辨率电子显微镜从成像到测量

高分辨率电子显微镜是作为一种测量技术而不是成像技术来讨论的。结果表明，图像的解释可以大大受益于定量而不是定性的方法伴随着定量统计实验设计。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference

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