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2016 IEEE International Solid-State Circuits Conference (ISSCC)最新文献

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Session 15 Overview: Compute-in-Memory Processors for Deep Neural Networks Machine Learning Subcommittee 第15次会议概述:深度神经网络机器学习小组委员会的内存计算处理器
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9365855
J. Deguchi, Yongpan Liu, Yan Li
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引用次数: 0
Session 14 Overview: mm-Wave Transceivers for Communication and Radar Wireless Subcommittee 会议14概述:毫米波收发器用于通信和雷达无线小组委员会
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9366009
B. Sadhu, M. Bassi, V. Giannini
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引用次数: 0
SE2: Going Remote: Challenges and Opportunities to Remote Learning, Work, and Collaboration SE2:走向远程:远程学习、工作和协作的挑战和机遇
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9365845
Alicia Klinefelter, Huichu Liu, L. Benini, Y. Thonnart, Keith A. Bowman, Kathy Wilcox, D. Bol, Alvin Loke, Ofer Shacham
{"title":"SE2: Going Remote: Challenges and Opportunities to Remote Learning, Work, and Collaboration","authors":"Alicia Klinefelter, Huichu Liu, L. Benini, Y. Thonnart, Keith A. Bowman, Kathy Wilcox, D. Bol, Alvin Loke, Ofer Shacham","doi":"10.1109/ISSCC42613.2021.9365845","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365845","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"25 1","pages":"539-540"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74697771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Session 19 Overview: Optical Systems for Emerging Applications Technology Directions Subcommittee 第十九届会议概述:新兴应用光学系统技术方向小组委员会
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9365864
M. Nagatani, N. V. Helleputte, Naveen Verma
{"title":"Session 19 Overview: Optical Systems for Emerging Applications Technology Directions Subcommittee","authors":"M. Nagatani, N. V. Helleputte, Naveen Verma","doi":"10.1109/ISSCC42613.2021.9365864","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365864","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"30 1","pages":"284-285"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74242741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session 18 Overview: Biomedical Devices, Circuits, and Systems Technology Directions Subcommittee 会议18概述:生物医学设备、电路和系统技术方向小组委员会
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9366033
R. Yazicigil, Milin Zhang, P. Mercier
{"title":"Session 18 Overview: Biomedical Devices, Circuits, and Systems Technology Directions Subcommittee","authors":"R. Yazicigil, Milin Zhang, P. Mercier","doi":"10.1109/ISSCC42613.2021.9366033","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9366033","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"30 1","pages":"274-275"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87447517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session 3 Overview: Highlighted Chip Releases: Modern Digital SoCs Invited Papers 第三部分概述:重点芯片发布:现代数字soc
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9365755
T. Burd, Rangharajan Venkatesan, D. Sylvester
{"title":"Session 3 Overview: Highlighted Chip Releases: Modern Digital SoCs Invited Papers","authors":"T. Burd, Rangharajan Venkatesan, D. Sylvester","doi":"10.1109/ISSCC42613.2021.9365755","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365755","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"93 1","pages":"44-45"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75445102","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers 入门工程师最喜欢的电路设计和测试错误
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9365991
R. Harjani, M. Chen, M. Berkhout, J. V. D. Heuvel, T. H. Lee, R. Staszewski, K. Philips, H. Luong, Vadim Ivanov
{"title":"SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers","authors":"R. Harjani, M. Chen, M. Berkhout, J. V. D. Heuvel, T. H. Lee, R. Staszewski, K. Philips, H. Luong, Vadim Ivanov","doi":"10.1109/ISSCC42613.2021.9365991","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365991","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"3 1","pages":"541-542"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72978170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Session 12 Overview: Innovations in Low-Power and Secure IoT Technology Directions Subcommittee 第十二部分概述:低功耗和安全物联网技术方向的创新小组委员会
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2021-01-01 DOI: 10.1109/ISSCC42613.2021.9365793
S. Vangal, Long Yan, F. Gianesello
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引用次数: 0
23.3 A 0-to-60V-Input VCM Coulomb Counter with Signal-Dependent Supply Current and ±0.5% Gain Inaccuracy from -50°C to 125°C 23.3一个0- 60v输入的VCM库仑计数器，具有信号依赖的电源电流和±0.5%的增益误差，范围为-50°C至125°C
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2020-02-01 DOI: 10.1109/ISSCC19947.2020.9063066
Caspar P. L. van Vroonhoven
{"title":"23.3 A 0-to-60V-Input VCM Coulomb Counter with Signal-Dependent Supply Current and ±0.5% Gain Inaccuracy from -50°C to 125°C","authors":"Caspar P. L. van Vroonhoven","doi":"10.1109/ISSCC19947.2020.9063066","DOIUrl":"https://doi.org/10.1109/ISSCC19947.2020.9063066","url":null,"abstract":"Most battery-powered systems require measurement of the battery's state of charge, (SOC). A straightforward way to determine SOC is to keep track of the current flowing in and out of a battery, a method known as coulomb counting. Compared to other methods such as voltage or impedance monitoring, coulomb counting is simple to implement, does not require complex algorithms and is independent of cell chemistry. However, coulomb counters must operate continuously and essentially integrate forever; traditionally, their relatively high power consumption (several tens of µA e.g. [1]–[3]) and susceptibility to drift in the presence of offset have prevented their more widespread use.","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"11 1","pages":"348-350"},"PeriodicalIF":0.0,"publicationDate":"2020-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80910478","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A 52% Peak-Efficiency >1W Isolated Power Transfer System Using Fully Integrated Magnetic-Core Transformer 采用全集成磁芯变压器的52%峰值效率bbbb1w隔离电力传输系统
2016 IEEE International Solid-State Circuits Conference (ISSCC) Pub Date : 2019-01-01 DOI: 10.1109/ISSCC.2019.8662301
Y. Zhuo, Shaoyu Ma, Tianting Zhao, W. Qin, Yuanyuan Zhao, Yingjie Guo, Baoxing Chen
{"title":"A 52% Peak-Efficiency >1W Isolated Power Transfer System Using Fully Integrated Magnetic-Core Transformer","authors":"Y. Zhuo, Shaoyu Ma, Tianting Zhao, W. Qin, Yuanyuan Zhao, Yingjie Guo, Baoxing Chen","doi":"10.1109/ISSCC.2019.8662301","DOIUrl":"https://doi.org/10.1109/ISSCC.2019.8662301","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"48 1","pages":"244-246"},"PeriodicalIF":0.0,"publicationDate":"2019-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79001370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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