{"title":"Coupling of transient ultra wide band electro-magnetic fields to complex electronic systems","authors":"M. Camp, H. Garbe, F. Sabath","doi":"10.1109/ISEMC.2005.1513563","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513563","url":null,"abstract":"In this paper the coupling of transient ultra wide band field pulses to complex electronic systems is determined. Different test setups of microcontroller circuits were used to investigate the coupling effects and to describe the injected interference parameters.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"24 1","pages":"483-488 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88857729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The analyzing method of low-level jamming signals for digital wireless communication equipments","authors":"K. Hori, H. Tsutagaya, S. Kazama","doi":"10.1109/ISEMC.2005.1513503","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513503","url":null,"abstract":"We have invented the measurement system to detect the low-level jamming noise. We also have introduced the amplitude probability distribution (APD) method for the time depended noise, which causes the degradation of the reception sensitivity of a cell phone. This measurement method is an effective tool for measuring time-depended noise.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"25 1","pages":"216-221 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88567745","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"TEM cells for whole aircraft EMV testing","authors":"A. Walters, C. Leat","doi":"10.1109/ISEMC.2005.1513574","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513574","url":null,"abstract":"Transverse electromagnetic (TEM) cells offer one solution to the problem of EMV testing of whole vehicles at lower frequencies. This paper discusses computational electromagnetics (CEM) modelling used to investigate various TEM cell configurations in order to optimize the method for testing a military aircraft. A baseline for the study was achieved by comparing a simulated aircraft in the DSTO TEM cell, on an open area test site (OATS) and in free space. The model was then used to investigate improvements to the TEM cell performance by modifying its design. It is shown that by changing from a solid to wire septum, gains are achieved in the low frequency performance of the cell. We also report on studies of active TE mode resonance cancellation. All results are discussed with respect to implications for future TEM cell designs","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"34 1","pages":"539-544"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90956205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Influence of appliance state on transmission characteristics of indoor AC mains lines in frequency range used power line communication","authors":"D. Hirata, N. Kuwabara, Y. Akiyama, H. Yamane","doi":"10.1109/ISEMC.2005.1513617","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513617","url":null,"abstract":"High-speed power line communication (PLC) systems have been developed for home networks. However, the transmission characteristics of an indoor AC mains line have not been clarified. We studied the influence of the appliance operation state on the transmission characteristics of the indoor AC mains line. The AC mains line and appliances were represented by four-port networks and two-port networks. The transmission characteristics were calculated by a model constructed with these networks. The two-port network parameters of the appliances were measured in both operating and stop states. The equivalent circuits were determined for both states based on the condition that the frequency characteristics of the circuits agreed with the measured value. A simple AC mains system was constructed and the transmission characteristics were measured to compare with the calculated value in various states. The results indicate that the calculated value agreed well with the measured one, and the transmission loss deviation resulting from the appliance state was within 10 dB. A common mode choke coil was inserted between the AC mains line and the appliances to reduce the transmission loss deviation resulting from different states. The measured and calculated values indicate that the deviation was reduced from 10 dB to 0.5 dB by inserting the filter.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"116 1","pages":"715-720 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81309217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis on absorbing peak frequency of electromagnetic wave absorption in two low-loss periodically layered dielectric materials","authors":"N. Ishii, M. Miyakawa, Y. Ito","doi":"10.1109/ISEMC.2005.1513474","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513474","url":null,"abstract":"A large absorption of the electromagnetic wave achieves using periodically layered materials with low loss. Our FDTD calculation demonstrates the sharp absorption at discrete frequencies for TM and TE polarizations. These frequencies are called absorbing peak frequencies, which are determined by the characteristic equations related to the transversal resonance in the cross section of the composite material. An equivalent dielectric constant of the composite material is required to solve these equations. One method to estimate the equivalent dielectric constant is based on electrically stored energy in the material, and the other is based on the effective dielectric constant method The absorbing peak frequencies obtained by two methods are compared with FDTD calculation","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"1 1","pages":"69-74"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79805966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Carsimamovic, Z. Bajramovic, M. Ljevak, M. Veledar
{"title":"Very fast electromagnetic transients in air insulated substations and gas insulated substations due to disconnector switching","authors":"S. Carsimamovic, Z. Bajramovic, M. Ljevak, M. Veledar","doi":"10.1109/ISEMC.2005.1513544","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513544","url":null,"abstract":"Very fast electromagnetic transients (VFT) in air insulated substations (AIS) and gas insulated substations (GIS) caused by switching operation of disconnectors are investigated. Results obtained from very extensive field tests and from digital simulations as well as a comparison between field tests and calculation results of VFT in AIS and GIS due to disconnector switching are presented. Field tests of disconnector switching in 220 kV air insulated substations Grabovica and Kakanj as well as test circuit of 110 kV GIS section are performed. Digital simulation of VFT for different models of power network are performed using EMTP-ATP.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"6 1","pages":"382-387 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81925261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"System level EMC - from theory to practice","authors":"R. Zamir, V. Bar-Natan, E. Recht","doi":"10.1109/ISEMC.2005.1513622","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513622","url":null,"abstract":"This article discusses the vast importance of incorporating electro-magnetic compatibility (EMC) engineering as an inseparable part of system engineering in a complex, technologically-advanced, tight-scheduled military project, starting from the project proposal stage (in response to a request for proposal-RFP), down to co-siting impacts tests in the platform. The project's product is defined as an operational prototype. On one hand, this prototype proves the system's functional properties as were specified by the customer, while on the other hand serving as a first article that is required to withstand all of the environmental conditions as a serially-produced system, including full EMC requirements. The unique system which is being addressed here has multiple, diverse capabilities and is comprised of elements and units belonging to various families, e.g., electronic boxes, electro-optical units, inertial sensors, functional display, computer, etc. The units are based on home-developed and commercial off-the-shelf (COTS) units (military as well as civilian/industrial). Furthermore, we present the methodology that was employed to minimize problems/failures during system EMC tests, in both the laboratory and after installation in the platform.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"43 1","pages":"741-743 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85699318","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Information security and emissions control","authors":"S. Pennesi, S. Sebastiani","doi":"10.1109/ISEMC.2005.1513629","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513629","url":null,"abstract":"Electronic equipments produce conducted and radiated emissions that are related to the data processed by the system. When the content is classified or confidential, as in military applications, the emanations must be severely controlled and restricted so that it is not possible for third parties to recover information intercepting and analyzing the emitted \"noise\". Although the problem has first arisen in the military sector, as banks and companies rely completely on electronic equipment to handle and transmit secure data, the TEMPEST aspect becomes a vital part of communications security scenario.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"26 1","pages":"777-781 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75616515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A simplified method for predicting common mode current on dipole and monopole structures","authors":"C. Suriano, J. Suriano, G. Thiele","doi":"10.1109/ISEMC.2005.1513558","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513558","url":null,"abstract":"Many unintentional radiators can be represented as monopole antennas. Key to predicting their near field emissions is the calculation of common mode current on the antenna which is difficult at low frequencies. This paper demonstrates that quasi-static techniques are sufficient for computing the behavior of monopole and dipole structures up to at least the half wave resonance. Furthermore, lumped parameter RLC equivalent circuits are developed from quasi-static means and correlated to conventional antenna theory. The simplified approach provides insight into the important contributors to low frequency emissions.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"30 1","pages":"457-462 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73297294","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Comparison of ISO 7637 transient waveforms to real world automotive transient phenomena","authors":"R. K. Frazier, S. Alles","doi":"10.1109/ISEMC.2005.1513662","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513662","url":null,"abstract":"Modern automotive electronic systems must operate as designed while exposed to transient voltages produced on the vehicle's power distribution system via switched inductive loads. ISO 7637-2 presents a number of test pulses that are presumed to simulate the actual transients produced in the vehicle. This paper compares three of those pulses (pulses 1, 3a and 3b) to actual transient events which are the result of contact arcing during deactivation of an inductive load. The paper demonstrates that the pulses 1, 3a, and 3b are overly simplistic representations of a more complex waveform. This over simplification may impact accurate assessment of system robustness in the presence of actual transient events.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"148 1","pages":"949-954 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79370932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}