2007 IEEE International Test Conference最新文献_第3页

Lower Bounds for Function Inversion with Quantum Advice 用量子通知函数反演的下界

2007 IEEE International Test Conference Pub Date : 2019-11-20 DOI: 10.4230/LIPIcs.ITC.2020.8

Kai-Min Chung, Tai-Ning Liao, Luowen Qian

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引用次数: 13

Separating Local & Shuffled Differential Privacy via Histograms 通过直方图分离本地和洗牌差分隐私

2007 IEEE International Test Conference Pub Date : 2019-11-15 DOI: 10.4230/LIPIcs.ITC.2020.1

Victor Balcer, Albert Cheu

引用次数: 57

Technical Paper Reviewers 技术论文审稿人

2007 IEEE International Test Conference Pub Date : 2019-07-19 DOI: 10.1109/ITC.2004.171

引用次数: 0

Security keynote: Ultra-low-energy security circuit primitives for IoT platforms 安全主题演讲:物联网平台的超低能耗安全电路原语

2007 IEEE International Test Conference Pub Date : 2017-10-01 DOI: 10.1109/TEST.2017.8242026

S. Mathew

引用次数: 0

Testing beyond the green light 超出绿灯范围的测试

2007 IEEE International Test Conference Pub Date : 2017-10-01 DOI: 10.1109/TEST.2017.8242025

Bob Klosterboer

引用次数: 0

Automotive keynote: Look Mom! No hands! 汽车主题演讲:看，妈妈!没有手!

2007 IEEE International Test Conference Pub Date : 2017-10-01 DOI: 10.1109/TEST.2017.8242027

J. Kunkel

引用次数: 0

Keynote address Thursday: Addressing semiconductor industry needs: Defining the future through creative, exciting research 周四的主题演讲:解决半导体行业需求:通过创新、激动人心的研究定义未来

2007 IEEE International Test Conference Pub Date : 2016-11-01 DOI: 10.1109/TEST.2016.7805818

Ken Hansen

引用次数: 0

Plenary keynote address Tuesday: The business of test: Test and semiconductor economics 星期二的全体会议主题演讲:测试业务:测试和半导体经济学

2007 IEEE International Test Conference Pub Date : 2016-11-01 DOI: 10.1109/TEST.2016.7805816

W. Rhines

引用次数: 0

Keynote address Wednesday: Hardware inference accelerators for machine learning 周三的主题演讲:机器学习的硬件推理加速器

2007 IEEE International Test Conference Pub Date : 2016-11-01 DOI: 10.1109/TEST.2016.7805817

Rob A. Rutenbar

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引用次数: 0

Can we ensure reliability in the era of heterogeneous integration? 在异构集成时代，我们能保证可靠性吗?

2007 IEEE International Test Conference Pub Date : 2015-12-03 DOI: 10.1109/TEST.2015.7342376

W. R. Bottoms

引用次数: 0