2007 IEEE International Test Conference最新文献_第3页

Lower Bounds for Function Inversion with Quantum Advice 用量子通知函数反演的下界

2007 IEEE International Test Conference Pub Date : 2019-11-20 DOI: 10.4230/LIPIcs.ITC.2020.8

Kai-Min Chung, Tai-Ning Liao, Luowen Qian

{"title":"Lower Bounds for Function Inversion with Quantum Advice","authors":"Kai-Min Chung, Tai-Ning Liao, Luowen Qian","doi":"10.4230/LIPIcs.ITC.2020.8","DOIUrl":"https://doi.org/10.4230/LIPIcs.ITC.2020.8","url":null,"abstract":"Function inversion is the problem that given a random function $f: [M] to [N]$, we want to find pre-image of any image $f^{-1}(y)$ in time $T$. In this work, we revisit this problem under the preprocessing model where we can compute some auxiliary information or advice of size $S$ that only depends on $f$ but not on $y$. It is a well-studied problem in the classical settings, however, it is not clear how quantum algorithms can solve this task any better besides invoking Grover's algorithm, which does not leverage the power of preprocessing. \u0000Nayebi et al. proved a lower bound $ST^2 ge tildeOmega(N)$ for quantum algorithms inverting permutations, however, they only consider algorithms with classical advice. Hhan et al. subsequently extended this lower bound to fully quantum algorithms for inverting permutations. In this work, we give the same asymptotic lower bound to fully quantum algorithms for inverting functions for fully quantum algorithms under the regime where $M = O(N)$. \u0000In order to prove these bounds, we generalize the notion of quantum random access code, originally introduced by Ambainis et al., to the setting where we are given a list of (not necessarily independent) random variables, and we wish to compress them into a variable-length encoding such that we can retrieve a random element just using the encoding with high probability. As our main technical contribution, we give a nearly tight lower bound (for a wide parameter range) for this generalized notion of quantum random access codes, which may be of independent interest.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2019-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82407335","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 13

Separating Local & Shuffled Differential Privacy via Histograms 通过直方图分离本地和洗牌差分隐私

2007 IEEE International Test Conference Pub Date : 2019-11-15 DOI: 10.4230/LIPIcs.ITC.2020.1

Victor Balcer, Albert Cheu

引用次数: 57

Technical Paper Reviewers 技术论文审稿人

2007 IEEE International Test Conference Pub Date : 2019-07-19 DOI: 10.1109/ITC.2004.171

引用次数: 0

Security keynote: Ultra-low-energy security circuit primitives for IoT platforms 安全主题演讲:物联网平台的超低能耗安全电路原语

2007 IEEE International Test Conference Pub Date : 2017-10-01 DOI: 10.1109/TEST.2017.8242026

S. Mathew

引用次数: 0

Testing beyond the green light 超出绿灯范围的测试

2007 IEEE International Test Conference Pub Date : 2017-10-01 DOI: 10.1109/TEST.2017.8242025

Bob Klosterboer

引用次数: 0

Automotive keynote: Look Mom! No hands! 汽车主题演讲:看，妈妈!没有手!

2007 IEEE International Test Conference Pub Date : 2017-10-01 DOI: 10.1109/TEST.2017.8242027

J. Kunkel

引用次数: 0

Keynote address Thursday: Addressing semiconductor industry needs: Defining the future through creative, exciting research 周四的主题演讲:解决半导体行业需求:通过创新、激动人心的研究定义未来

2007 IEEE International Test Conference Pub Date : 2016-11-01 DOI: 10.1109/TEST.2016.7805818

Ken Hansen

引用次数: 0

Plenary keynote address Tuesday: The business of test: Test and semiconductor economics 星期二的全体会议主题演讲:测试业务:测试和半导体经济学

2007 IEEE International Test Conference Pub Date : 2016-11-01 DOI: 10.1109/TEST.2016.7805816

W. Rhines

引用次数: 0

Keynote address Wednesday: Hardware inference accelerators for machine learning 周三的主题演讲:机器学习的硬件推理加速器

2007 IEEE International Test Conference Pub Date : 2016-11-01 DOI: 10.1109/TEST.2016.7805817

Rob A. Rutenbar

{"title":"Keynote address Wednesday: Hardware inference accelerators for machine learning","authors":"Rob A. Rutenbar","doi":"10.1109/TEST.2016.7805817","DOIUrl":"https://doi.org/10.1109/TEST.2016.7805817","url":null,"abstract":"Machine learning (ML) technologies have revolutionized the ways in which we interact with large-scale, imperfect, real-world data. As a result, there is rising interest in opportunities to implement ML efficiently in custom hardware. We have designed hardware for one broad class of ML techniques: Inference on Probabilistic Graphical Models (PGMs). In these graphs, labels on nodes encode what we know and “how much” we believe it; edges encode belief relationships among labels; statistical inference answers questions such as “if we observe some of the labels in the graph, what are most likely labels on the remainder?” These problems are interesting because they can be very large (e.g., every pixel in an image is one graph node) and because we need answers very fast (e.g., at video frame rates). Inference done as iterative Belief Propagation (BP) can be efficiently implemented in hardware, and we demonstrate several examples from current FPGA prototypes. We have the first configurable, scalable parallel architecture capable of running a range of standard vision benchmarks, with speedups up to 40X over conventional software. We also show that BP hardware can be made remarkably tolerant to the low-level statistical upsets expected in end-of-Moore's-Law nanoscale silicon and post-silicon circuit fabrics, and summarize some effective resilience mechanisms in our prototypes.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74584155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Can we ensure reliability in the era of heterogeneous integration? 在异构集成时代，我们能保证可靠性吗?

2007 IEEE International Test Conference Pub Date : 2015-12-03 DOI: 10.1109/TEST.2015.7342376

W. R. Bottoms

引用次数: 0