2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena最新文献_第10页

Natural and Synthetic Ester Liquids as alternative to mineral oil for power transformers 作为矿物油替代品的天然和合成酯液体

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772928

E. Gockenbach, H. Borsi

引用次数: 53

Analysis of Charging Kinetics of Oxide Ceramics under Short Electron Beam Irradiation: Numerical Simulation of Secondary Electron Emission 短电子束辐照下氧化陶瓷的充电动力学分析:二次电子发射的数值模拟

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772867

A. Aoufi, K. Zarbout, G. Damamme, G. Moya

{"title":"Analysis of Charging Kinetics of Oxide Ceramics under Short Electron Beam Irradiation: Numerical Simulation of Secondary Electron Emission","authors":"A. Aoufi, K. Zarbout, G. Damamme, G. Moya","doi":"10.1109/CEIDP.2008.4772867","DOIUrl":"https://doi.org/10.1109/CEIDP.2008.4772867","url":null,"abstract":"This analysis is connected with the evolution of trapped charges, during electron injection, using a defocused electron beam of a Scanning Electron Microscope especially equipped with a secondary electron low-noise detector. Hence, during pulses of about ten ms, giving injection doses of a few pC, the measurements of the influence induced currents, Iind(t), due to the image charges Qind (t) in the metallic holder (corresponding to the trapped charges Qp (t) in the sample) and the total secondary electron currents, Isigma(t), can be carried out. Considering the experimental conditions defined by small primary current density (#104 pA/cm2) and low surface charge density (#10 pC/cm2), the relation, I0 = Iind(t) + Isigma (t) can be verified [1] leading to (after integration over the injection time) a charge balance: Qinj = Qind+Qsigma = Qp+Qsigma The secondary electron emission yield, see(t) = 1 - { Iind (t) / [Iind (t)+Isigma (t)] }, is experimentally studied as a function of Qp(t). A simulation, which corresponds to a new mathematical model describing the spatial and temporal charge trapping, computes the temporal evolution of the secondary electron emission, see(t), as a function of net trapped charge, Qp(t), for various values of the kinetic energy of the primary electrons. The comparison between experimental results and numerical simulations would permit to evaluate absorption and transfer cross sections as well as mobility of the secondary electrons.","PeriodicalId":6381,"journal":{"name":"2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"56 1","pages":"141-144"},"PeriodicalIF":0.0,"publicationDate":"2008-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90769068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Characterization of Fruit juices treated with Electrical Pulses 电脉冲处理果汁的特性

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772925

R. Sundararajan, D. Campbell, J. Harper, Funian Xiao, Rui Ma, K. Otto

{"title":"Characterization of Fruit juices treated with Electrical Pulses","authors":"R. Sundararajan, D. Campbell, J. Harper, Funian Xiao, Rui Ma, K. Otto","doi":"10.1109/CEIDP.2008.4772925","DOIUrl":"https://doi.org/10.1109/CEIDP.2008.4772925","url":null,"abstract":"Non-thermal pasteurization of fruit juices, such as orange juice using electrical pulses is gaining momentum due to their attractive attributes, such as less heating and more retention of taste, flavor and color. Using electrical pusles of suitable intensity (V/cm) and duration or pulsewidth (milli/micro/nano seconds), it is possible to pasteurize the juices to enhance their longevity (at room temperatures). This paper presents the results of a juice study using milli and micro pulses. Multiple pulses with optimal intervals are in general used in these applications to reduce the heat generated. Various juices including orange and lime were tested in this study. Analyses were made using microbial study and impedance spectroscopy measurements of the pulsed and the unpulsed (control) juices. Preliminary results indicate that there is a reduction in the amount of lactic acid bacterial count of the pulsed orange juice compared to the unpulsed orange juice. Impedance spectroscopy measurements also showed difference in impedance values between the pulsed and unpulsed juices. This study will shine more light on the characteristics of electrically pulsed juices and extending their shelf-life.","PeriodicalId":6381,"journal":{"name":"2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"40 1","pages":"536-539"},"PeriodicalIF":0.0,"publicationDate":"2008-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86298920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage 交流电压下聚乙烯基材料微孔老化开始和生长的模型

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772903

G. Montanari, A. Cavallini, L. Testa, S. Serra, L. Dissado

{"title":"Model of ageing inception and growth from microvoids in polyethylene-based materials under AC voltage","authors":"G. Montanari, A. Cavallini, L. Testa, S. Serra, L. Dissado","doi":"10.1109/CEIDP.2008.4772903","DOIUrl":"https://doi.org/10.1109/CEIDP.2008.4772903","url":null,"abstract":"Several degradation mechanisms may affect polymeric insulation system reliability. Some authors postulate that, even in a perfect dielectric, nanoscale cavities can enlarge due to various mechanisms (from mechanical fatigue to lowering of the degradation reaction energy barrier) up to a point where highly energetic phenomena, which bring about breakdown, can be incepted. Other authors are more focused on the inherent limits of manufacturing processes, which leave cavities within the insulation system whose size is large enough to cause electron avalanches, thus a measurable partial discharge (PD) activity, from the time the system is put in service or as a function of external factors (e.g. mechanical damage, thermal shrinking, overvoltages). Given the time scale of polymeric system failures, this latter mechanism seems to be more plausible. It is therefore worthwhile to investigate in depth the degradation rates associated with PD in micrometric cavities in polymeric insulation systems subjected to AC voltage. The proposed model is based on damage accumulation on cavity surfaces caused by PD phenomena. The main degradation mechanism associated with PD is considered to be the hot-electron induced bond-breaking process. This process accumulates with time, leading to the creation of a damaged region of critical size and, ultimately, to breakdown. The proposed model describes the defect induction and growth phase until treeing phenomena start, which is, normally, the largely prevailing component of breakdown time.","PeriodicalId":6381,"journal":{"name":"2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena","volume":"21 1","pages":"29-32"},"PeriodicalIF":0.0,"publicationDate":"2008-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85785750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 16

Studies on the Tracking and Erosion Resistance of RTV Silicone Rubber Nanocomposite RTV硅橡胶纳米复合材料的跟踪和耐冲蚀性能研究

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772806

B. Venkatesulu, M. Thomas

引用次数: 21

Depolarization Current Measurements on Field-Aged XLPE Cable Insulation 场老化交联聚乙烯电缆绝缘去极化电流的测量

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772809

M. Abou-Dakka, A. Bulinski, S. Bamji, M. Selsjord

引用次数: 6

Comparison Between Different Electric Signal Fire Resistant Cables Behaviour During Fire Tests 不同电气信号耐火电缆在防火试验中的性能比较

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772874

F. Guastavino, A. Ratto, M. Celentano, A. Zucchelli, P. Michelato

引用次数: 1

Origin and Nature of the Activated Parameters in the Electrical Aging Equation 电老化方程中活化参数的来源与性质

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772868

J. Crine

引用次数: 3

Comparison of alternative insulating fluids 几种绝缘流体的比较

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772854

R. Eberhardt, H. Muhr, W. Lick, F. Baumann, G. Pukel

引用次数: 17

Eliminate Corrosion on Grounding System By A Conductive RTV Silicone Coating 通过导电RTV硅酮涂层消除接地系统的腐蚀

2008 Annual Report Conference on Electrical Insulation and Dielectric Phenomena Pub Date : 2008-10-01 DOI: 10.1109/CEIDP.2008.4772787

Zhihai Xu, P. Tang, Z. Jia, Z. Guan, Liming Wang

引用次数: 1