2012 International Conference on High Voltage Engineering and Application最新文献_第9页

Simulation studies of power frequency continuous current under 10/ 350µs impulse current tests 10/ 350µs冲击电流下工频连续电流的仿真研究

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357016

Xiaoming Ren, Qin Zhou

引用次数: 0

Internal failure analysis of transformer windings 变压器绕组内部失效分析

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357063

P. Tuethong, P. Yutthagowith, A. Kunakorn, S. Potivejkul

{"title":"Internal failure analysis of transformer windings","authors":"P. Tuethong, P. Yutthagowith, A. Kunakorn, S. Potivejkul","doi":"10.1109/ICHVE.2012.6357063","DOIUrl":"https://doi.org/10.1109/ICHVE.2012.6357063","url":null,"abstract":"This paper presents internal failure analysis of transformer windings based on the characteristic of winding impedance in the frequency domain. Two winding samples are selected to test. The simple equivalent circuit of the transformer winding is investigated and proposed. The two windings under test have 76 turns with different length. An iron core is either inserted or not inserted inside a winding in the test to investigate the effect of the iron core. Turn to turn short circuit on the windings is considered as internal failure in this paper. The simulated turn to turn short on the model is carried out in the experiment to observe impedance characteristic in the frequency domain. A number and position of short turns are varied to observe characteristics of impedances The impedance of the models of the transformer windings are measured by a spectrum analyzer in a wide frequency range upto 2 MHz. From the test results, it is investigated that a resonance frequency of the transformer model is depended on a number and position of short turns. From the investigation, it has high possibility that the characteristic can be used for analysis of internal failures occurring in a transformer.","PeriodicalId":6375,"journal":{"name":"2012 International Conference on High Voltage Engineering and Application","volume":"13 1","pages":"100-104"},"PeriodicalIF":0.0,"publicationDate":"2012-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79151131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Intelligent condition monitoring and management for power transmission and distribution equipments in Yunnan Power Grid 云南电网输配电设备状态智能监测与管理

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357153

M. Cao, Kunnan Cao, Bo Wu, Min Tan

引用次数: 9

Application of insulating camellia oil in high fire resistance transformer 绝缘茶油在高耐火性变压器中的应用

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357104

J. Han, Wubin Qiu, Wei Wang, Hongwei Cao, De-heng Yao

引用次数: 6

Frequency domain characteristics and insulation condition evaluation of power transformer oil-paper insulation 电力变压器油纸绝缘的频域特性及绝缘状态评价

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357145

Ming-jie Tang, Min Lei, Hao Xu, Y. Lu, Xu Wei, Peng Wu, Guanjun Zhang

引用次数: 2

Study of surface degradation of HTV silicone rubber under thermal and ultraviolet exposures 热和紫外线照射下高温硅橡胶表面降解的研究

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357079

G. Haddad, R. Gupta, K. Wong

{"title":"Study of surface degradation of HTV silicone rubber under thermal and ultraviolet exposures","authors":"G. Haddad, R. Gupta, K. Wong","doi":"10.1109/ICHVE.2012.6357079","DOIUrl":"https://doi.org/10.1109/ICHVE.2012.6357079","url":null,"abstract":"Polymeric insulators are widely used in electrical power system in particular transmission and distribution lines. Silicon rubber is a high performance polymeric material with superior insulation property and physical properties such as light weight. This paper presents the effects of ultra violet radiation and heat on the aging of silicon rubber and estimates the lifetime of insulators made of this material based on chemical bounds percentage at different exposure times. Experimental works were performed on samples collected from a 22KV silicone rubber insulator. The specimens were subjected to accelerated aging cycles using an Accelerated Weathering Tester (QUV) at 50°C and UVA exposure of 340nm at the irradiation intensity of 0.68W/m2 for up to 3000 hours. A series of tests were conducted on the samples using instruments that measure different aspects of aging. The degradation was examined using a Scanning Electron Microscope (SEM) and a Fourier Transforms Infrared Spectroscopy (ATR-FTIR). In addition, the color change of the specimens was measured by CHROMA Meter (CR-300). In this paper, we show that the remaining service life of the insulators can be estimated using the chemical measurements and color factors by making comparisons between new, aged and totally damaged specimens. The 3D scatterplot for the obtained data show a clear trend and timeline on how a new specimen degrades over time and eventually leads to complete failure. This information provided by the 3D scatterplot could be used to estimate the remaining life of silicone rubber insulators.","PeriodicalId":6375,"journal":{"name":"2012 International Conference on High Voltage Engineering and Application","volume":"267 1","pages":"241-245"},"PeriodicalIF":0.0,"publicationDate":"2012-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76316817","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

Space charge and thickness dependent dc electrical breakdown of solid dielectrics 固体电介质直流击穿的空间电荷和厚度相关

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357154

G. Chen, Junwei Zhao

{"title":"Space charge and thickness dependent dc electrical breakdown of solid dielectrics","authors":"G. Chen, Junwei Zhao","doi":"10.1109/ICHVE.2012.6357154","DOIUrl":"https://doi.org/10.1109/ICHVE.2012.6357154","url":null,"abstract":"A new model based on space charge dynamics under very high dc electric field has been proposed to explain thickness dependent dielectric breakdown. Space charge phenomenon under high electric field has been studied for several decades thanks to the development of new charge mapping techniques. Overwhelming evidences show that the charge packet can be formed in the material under high electric field. The formation and dynamics of the charge packet will result in local electric field enhancement that has a direct impact on breakdown. It has been found that the key factors leading to the formation of charge packet are negative differential mobility and low trapping coefficient. Take these factors into the space charge based model, our simulation results clearly show that the breakdown is dependent on the sample thickness. Through the simulation, it has been noticed that the electrical breakdown field reduction depends on several parameters such as the onset of critical electric field when breakdown occurs. By varying the ramp rate of dc applied voltage, simulation has also shown that the breakdown strength increases with the voltage ramp rate.","PeriodicalId":6375,"journal":{"name":"2012 International Conference on High Voltage Engineering and Application","volume":"120 1","pages":"12-15"},"PeriodicalIF":0.0,"publicationDate":"2012-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78173239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 4

Duality-based lumped transformer equivalent circuit at low frequencies under single-phase excitation 单相激励下低频双重性集总变压器等效电路

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357097

D. A. K. Pham, T. M. T. Pham, V. Ho, H. Borsi, E. Gockenbach

{"title":"Duality-based lumped transformer equivalent circuit at low frequencies under single-phase excitation","authors":"D. A. K. Pham, T. M. T. Pham, V. Ho, H. Borsi, E. Gockenbach","doi":"10.1109/ICHVE.2012.6357097","DOIUrl":"https://doi.org/10.1109/ICHVE.2012.6357097","url":null,"abstract":"The lumped transformer equivalent circuit has been recently adapted based on duality principle and verified for the purposes of transient analysis with reasonable accuracy and frequency response analysis. However such circuit is developed and validated for balanced and unbalanced three-phase excitation. On the other hand, several diagnostic tests such as Frequency Response Analysis (FRA), ratio, short-circuit impedance measurements etc. are performed only under single-phase excitation in open- and short-circuit conditions. Therefore, there is a requirement to develop an equivalent circuit for power transformers under single-phase excitation to analyse relevant tests, which has not been completely investigated until now. The required equivalent circuit should in general include all windings of three phases as suggested by several recent publications since the influence from other non-tested windings to the tested phase winding was confirmed. The paper's main contribution is to introduce a duality-principle-based lumped equivalent circuit for a three-phase two-winding transformer under single-phase excitation at low frequencies for the purpose of impedance and frequency response analyses. More importantly, a method for determining internal, i.e. per-phase, parameters of the circuit based on impedance tests is also proposed. Results show that, thanks to frequency-dependent functions of the parameters and their connection in the circuit, inter-phase effect and quantitative interpretation of several first parallel- and series resonances in frequency response of winding impedances in transformer bulk are now possible. Furthermore, these physical parameters can be useful as input for machine-learning algorithms to diagnose transformer failures.","PeriodicalId":6375,"journal":{"name":"2012 International Conference on High Voltage Engineering and Application","volume":"1 1","pages":"600-603"},"PeriodicalIF":0.0,"publicationDate":"2012-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82342231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 6

Thermal aging properties of BIOTEMP oil with controlled air BIOTEMP油在受控空气中的热老化特性

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357135

Chao Guo, R. Liao, Lijun Yang, Ke Wang, Chaoliang Qi

引用次数: 0

Effect of repeated impulses on OIP 重复脉冲对OIP的影响

2012 International Conference on High Voltage Engineering and Application Pub Date : 2012-11-26 DOI: 10.1109/ICHVE.2012.6357044

S. Balaji, L. Lavanya, S. Usa

引用次数: 5