{"title":"A Method for Optimal Value Measurement\u0000of Some Parameters of Fault Attacks\u0000on Cryptographic Algorithms","authors":"Yu. A. Zuev, P. G. Klyucharev","doi":"10.1134/S1990478924020182","DOIUrl":"10.1134/S1990478924020182","url":null,"abstract":"<p> This paper is devoted to the construction of a time-optimal method for measuring the\u0000maximum permissible (critical) value of the supply voltage (as well as other parameters) of the\u0000device on which the cryptographic algorithm is performed. Knowledge of these values is necessary\u0000for successful conduct of error injection, as part of a fault attack. The method is based on\u0000dynamic programming.\u0000</p>","PeriodicalId":607,"journal":{"name":"Journal of Applied and Industrial Mathematics","volume":"18 2","pages":"371 - 377"},"PeriodicalIF":0.58,"publicationDate":"2024-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142224611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}