A Method for Optimal Value Measurement of Some Parameters of Fault Attacks on Cryptographic Algorithms
IF 0.58
Q3 Engineering
引用次数: 0
Abstract
This paper is devoted to the construction of a time-optimal method for measuring the maximum permissible (critical) value of the supply voltage (as well as other parameters) of the device on which the cryptographic algorithm is performed. Knowledge of these values is necessary for successful conduct of error injection, as part of a fault attack. The method is based on dynamic programming.
密码算法故障攻击某些参数的最优值测量方法
摘要 本文致力于构建一种时间最优方法，用于测量执行加密算法的设备的电源电压（以及其他参数）的最大允许（临界）值。作为故障攻击的一部分，了解这些值是成功进行错误注入的必要条件。该方法基于动态编程。
本文章由计算机程序翻译，如有差异，请以英文原文为准。
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来源期刊
Journal of Applied and Industrial Mathematics
Engineering-Industrial and Manufacturing Engineering
CiteScore
1.00
自引率
0.00%
发文量
16
期刊介绍：
Journal of Applied and Industrial Mathematics is a journal that publishes original and review articles containing theoretical results and those of interest for applications in various branches of industry. The journal topics include the qualitative theory of differential equations in application to mechanics, physics, chemistry, biology, technical and natural processes; mathematical modeling in mechanics, physics, engineering, chemistry, biology, ecology, medicine, etc.; control theory; discrete optimization; discrete structures and extremum problems; combinatorics; control and reliability of discrete circuits; mathematical programming; mathematical models and methods for making optimal decisions; models of theory of scheduling, location and replacement of equipment; modeling the control processes; development and analysis of algorithms; synthesis and complexity of control systems; automata theory; graph theory; game theory and its applications; coding theory; scheduling theory; and theory of circuits.
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