Tm-Technisches Messen最新文献

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In-Field Dynamic Performance Optimization of Sensory Readout Electronics with Self-X Properties using Low Cost and Power-Efficient Indirect Measurement Method 采用低成本、低功耗间接测量方法优化具有自x特性的传感读出电子器件的现场动态性能
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0085
S. Alraho, Q. Zaman, A. König
{"title":"In-Field Dynamic Performance Optimization of Sensory Readout Electronics with Self-X Properties using Low Cost and Power-Efficient Indirect Measurement Method","authors":"S. Alraho, Q. Zaman, A. König","doi":"10.1515/teme-2023-0085","DOIUrl":"https://doi.org/10.1515/teme-2023-0085","url":null,"abstract":"","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85162314","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Potentials and challenges of deep-learningassisted porosity prediction based on thermographic in situ monitoring in laser powder bed fusion 基于热成像原位监测的深度学习辅助孔隙度预测的潜力和挑战
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0062
Simon Oster, N. Scheuschner, Keerthana Chand, S. Altenburg, G. Gerlach
{"title":"Potentials and challenges of deep-learningassisted porosity prediction based on thermographic in situ monitoring in laser powder bed fusion","authors":"Simon Oster, N. Scheuschner, Keerthana Chand, S. Altenburg, G. Gerlach","doi":"10.1515/teme-2023-0062","DOIUrl":"https://doi.org/10.1515/teme-2023-0062","url":null,"abstract":"","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80265889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
High-precision interferometric vibration measurement with squeezed light 压缩光高精度干涉振动测量
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0079
Mengwei Yu, P. Gewecke, R. Schnabel, C. Rembe
{"title":"High-precision interferometric vibration measurement with squeezed light","authors":"Mengwei Yu, P. Gewecke, R. Schnabel, C. Rembe","doi":"10.1515/teme-2023-0079","DOIUrl":"https://doi.org/10.1515/teme-2023-0079","url":null,"abstract":"","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89734065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Vorzeichenrichtige tomographische Rekonstruktion von Ultraschallfeldern mit Hilfe der Schlierentechnik 用扬声器,做超声模拟超音波
4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0069
Tim Hetkämper, Leander Claes, Bernd Henning
{"title":"Vorzeichenrichtige tomographische Rekonstruktion von Ultraschallfeldern mit Hilfe der Schlierentechnik","authors":"Tim Hetkämper, Leander Claes, Bernd Henning","doi":"10.1515/teme-2023-0069","DOIUrl":"https://doi.org/10.1515/teme-2023-0069","url":null,"abstract":"","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136020039","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
XXXVII. Messtechnisches Symposium 2023 XXXVII .2023年会议
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0105
S. Rupitsch
{"title":"XXXVII. Messtechnisches Symposium 2023","authors":"S. Rupitsch","doi":"10.1515/teme-2023-0105","DOIUrl":"https://doi.org/10.1515/teme-2023-0105","url":null,"abstract":"","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84767896","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Characterization of Adaptive Implementation of Neuromorphic Spiking Sensory Systems On-Chip with Self-X Abilities 具有自x能力的神经形态脉冲传感系统芯片自适应实现的表征
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0084
H. Abd, A. König
{"title":"Characterization of Adaptive Implementation of Neuromorphic Spiking Sensory Systems On-Chip with Self-X Abilities","authors":"H. Abd, A. König","doi":"10.1515/teme-2023-0084","DOIUrl":"https://doi.org/10.1515/teme-2023-0084","url":null,"abstract":"","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74339033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Instantaneous angular speed estimation in gas foil bearings from vibration signal 基于振动信号的气箔轴承瞬时角速度估计
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0054
Martin L. Kliemank, M. Ahmadzadeh, R. Liebich, C. Gühmann
{"title":"Instantaneous angular speed estimation in gas foil bearings from vibration signal","authors":"Martin L. Kliemank, M. Ahmadzadeh, R. Liebich, C. Gühmann","doi":"10.1515/teme-2023-0054","DOIUrl":"https://doi.org/10.1515/teme-2023-0054","url":null,"abstract":"","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83744004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Das Kompetenzzentrum für Windenergie (CCW) an der PTB 风能中心(CCW
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-14 DOI: 10.1515/teme-2023-0060
F. Härtig, Julia Hornig
{"title":"Das Kompetenzzentrum für Windenergie (CCW) an der PTB","authors":"F. Härtig, Julia Hornig","doi":"10.1515/teme-2023-0060","DOIUrl":"https://doi.org/10.1515/teme-2023-0060","url":null,"abstract":"Zusammenfassung Mit dem Kompetenzzentrum für Windenergie (CCW) hat die Physikalisch-Technische Bundesanstalt (PTB) eine Infrastruktur zur hochgenauen Messung großer dreidimensionaler Bauteile mit Abmaßen bis 5 m × 4 m × 2 m sowie großer Drehmomente bis 5 MN⋅m geschaffen. Die Drehmomenten-Normalmesseinrichtung ist bereits für die Erzeugung und Messung von Drehmomenten bis 20 MN⋅m ausgelegt. Zusätzlich verfügt das CCW über eine Einrichtung, mit der sich Wind-LIDAR-Systeme quantitativ erfassen lassen. Diese Messeinrichtungen mit ihren zugehörigen Messverfahren sind in ihrer Messgenauigkeit weltweit bisher unerreicht. Wie sich heute zeigt, zahlt es sich aus, dass die PTB bereits vor der Energiewende mit diesen Entwicklungen begonnen hat, um auf die bestehenden messtechnischen Herausforderungen Antworten auf die wirtschaftlichen, politischen und gesellschaftlichen Fragen zu geben. Alle drei Messverfahren werden in diesem Beitrag zusammenfassend angesprochen. Ausführliche Erläuterungen finden sich in weiteren Beiträgen dieser Ausgabe.","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78413469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modular Direct Laser Writing setup for high precision nanostructuring 模块化直接激光书写装置,用于高精度纳米结构
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-14 DOI: 10.1515/teme-2023-0025
Annika-Verena Häcker, J. Stauffenberg, Johannes Leineweber, I. Ortlepp, M. Hoffmann, E. Manske
{"title":"Modular Direct Laser Writing setup for high precision nanostructuring","authors":"Annika-Verena Häcker, J. Stauffenberg, Johannes Leineweber, I. Ortlepp, M. Hoffmann, E. Manske","doi":"10.1515/teme-2023-0025","DOIUrl":"https://doi.org/10.1515/teme-2023-0025","url":null,"abstract":"Abstract The increasing demand for micro- and nanofabrication and in parallel the increasing requirements on feature size and resolution is leading to an enormous growth in the field of multi-photon three-dimensional fabrication. To enable new and diverse investigations in this field and to enable high precision for nanofabrication on large areas, a high precision positioning system is combined with an ultra-short pulse laser system. The aim is a modular setup with constant adherence to the Abbe-comparator principle in order to achieve systematic improvements in the area of Direct Laser Writing. For a high-quality identification of the microstructures a measurement tool based on atomic force microscopy is used. To enable the fabrication of continuous micro- and nanostructures on large area, an extremely high positioning precision is used, where no further stitching methods are necessary. Therefore as base of the Direct Laser Writing system the nanopositioning and nanomeasuring machine (NMM-1) is used, which was developed at Technische Universität Ilmenau together with SIOS Meßtechnik GmbH, with a positioning volume of 25 mm × 25 mm × 5 mm and a positioning resolution in the sub-nanometer range. First investigations already confirmed that microfabrication with a Femtosecond Laser and the NMM-1 could be realized and showed the possibility of further developments in the field of Direct Laser Writing. Now the modular structure as a research platform is designed in such a way that the various extensions and measurement setups for large-scale investigations can always be implemented in a metrologically traceable manner. The presented work shows the development of a modular functional setup of an exposure system and NMM-1, which enables micro- and nanofabrication and an improvement in the structure size over large areas.","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86152325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Linearity test of triangular waveform generators 三角波形发生器的线性度测试
IF 1 4区 工程技术
Tm-Technisches Messen Pub Date : 2023-08-14 DOI: 10.1515/teme-2023-0102
F. Alegria
{"title":"Linearity test of triangular waveform generators","authors":"F. Alegria","doi":"10.1515/teme-2023-0102","DOIUrl":"https://doi.org/10.1515/teme-2023-0102","url":null,"abstract":"Abstract This paper presents a novel approach for accurately testing triangular waveform generators by leveraging the Ramp Vernier Test methodology commonly used for Analog-to-Digital Converters (ADCs). The proposed procedure enables efficient measurement of the nonlinearity of a triangular waveform using a low-cost data acquisition board. The key idea is to utilize the waveform generator under test to produce the stimulus signal for the data acquisition system’s testing. By analyzing the results of this test, the nonlinearity of the acquisition system can be determined and subsequently corrected. This approach effectively eliminates the influence of the acquisition system’s nonlinearity on the estimation of the nonlinearity of the waveform generator, ensuring accurate and reliable measurements.","PeriodicalId":56086,"journal":{"name":"Tm-Technisches Messen","volume":null,"pages":null},"PeriodicalIF":1.0,"publicationDate":"2023-08-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90944929","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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