Modular Direct Laser Writing setup for high precision nanostructuring

IF 0.8 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION
Annika-Verena Häcker, J. Stauffenberg, Johannes Leineweber, I. Ortlepp, M. Hoffmann, E. Manske
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引用次数: 1

Abstract

Abstract The increasing demand for micro- and nanofabrication and in parallel the increasing requirements on feature size and resolution is leading to an enormous growth in the field of multi-photon three-dimensional fabrication. To enable new and diverse investigations in this field and to enable high precision for nanofabrication on large areas, a high precision positioning system is combined with an ultra-short pulse laser system. The aim is a modular setup with constant adherence to the Abbe-comparator principle in order to achieve systematic improvements in the area of Direct Laser Writing. For a high-quality identification of the microstructures a measurement tool based on atomic force microscopy is used. To enable the fabrication of continuous micro- and nanostructures on large area, an extremely high positioning precision is used, where no further stitching methods are necessary. Therefore as base of the Direct Laser Writing system the nanopositioning and nanomeasuring machine (NMM-1) is used, which was developed at Technische Universität Ilmenau together with SIOS Meßtechnik GmbH, with a positioning volume of 25 mm × 25 mm × 5 mm and a positioning resolution in the sub-nanometer range. First investigations already confirmed that microfabrication with a Femtosecond Laser and the NMM-1 could be realized and showed the possibility of further developments in the field of Direct Laser Writing. Now the modular structure as a research platform is designed in such a way that the various extensions and measurement setups for large-scale investigations can always be implemented in a metrologically traceable manner. The presented work shows the development of a modular functional setup of an exposure system and NMM-1, which enables micro- and nanofabrication and an improvement in the structure size over large areas.
模块化直接激光书写装置,用于高精度纳米结构
随着人们对微纳米加工的需求不断增加,以及对特征尺寸和分辨率要求的不断提高,多光子三维制造领域得到了巨大的发展。为了在这一领域进行新的和多样化的研究,并实现大面积纳米加工的高精度,高精度定位系统与超短脉冲激光系统相结合。目的是一个模块化的设置与不断坚持阿贝比较原则,以实现在直接激光书写领域的系统改进。为了获得高质量的显微结构鉴定,采用了基于原子力显微镜的测量工具。为了能够在大面积上制造连续的微纳米结构,使用了极高的定位精度,而不需要进一步的拼接方法。因此,采用Technische Universität Ilmenau与SIOS Meßtechnik GmbH联合开发的纳米定位和纳米测量机(NMM-1)作为直接激光书写系统的基础,定位体积为25 mm × 25 mm × 5 mm,定位分辨率在亚纳米范围内。初步的研究已经证实,用飞秒激光器和NMM-1进行微加工是可以实现的,并显示了在直接激光书写领域进一步发展的可能性。现在,模块化结构作为一个研究平台的设计方式是,各种扩展和大规模调查的测量设置可以始终以计量可追溯的方式实施。所提出的工作显示了曝光系统和NMM-1的模块化功能设置的发展,这使得微纳米加工和大面积结构尺寸的改进成为可能。
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来源期刊
Tm-Technisches Messen
Tm-Technisches Messen 工程技术-仪器仪表
CiteScore
1.70
自引率
20.00%
发文量
105
审稿时长
6-12 weeks
期刊介绍: The journal promotes dialogue between the developers of application-oriented sensors, measurement systems, and measurement methods and the manufacturers and measurement technologists who use them. Topics The manufacture and characteristics of new sensors for measurement technology in the industrial sector New measurement methods Hardware and software based processing and analysis of measurement signals to obtain measurement values The outcomes of employing new measurement systems and methods.
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