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Speckle 2023: VIII International Conference on Speckle Metrology最新文献

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Simulation and research on frequency characteristics of laser speckle field in polar region of a rotating target 旋转目标极区激光斑点场频率特性的模拟与研究
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3021748
Rongrong Wang, Liguo Wang, Lei Gong, Zhiqiang Yang, Lihong Yang, Yao Li
{"title":"Simulation and research on frequency characteristics of laser speckle field in polar region of a rotating target","authors":"Rongrong Wang, Liguo Wang, Lei Gong, Zhiqiang Yang, Lihong Yang, Yao Li","doi":"10.1117/12.3021748","DOIUrl":"https://doi.org/10.1117/12.3021748","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"93 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140398251","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of sample rotator for focused ion beam micro-nano machining system 开发用于聚焦离子束微纳加工系统的样品旋转器
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3014240
Hailin Guo, Siling Huang, Shiyan Zhao, Xu Zhang, Chaoxiang Xia, Ning Pei, Dasen Wang
{"title":"Development of sample rotator for focused ion beam micro-nano machining system","authors":"Hailin Guo, Siling Huang, Shiyan Zhao, Xu Zhang, Chaoxiang Xia, Ning Pei, Dasen Wang","doi":"10.1117/12.3014240","DOIUrl":"https://doi.org/10.1117/12.3014240","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"59 10","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140286105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of infrared anti-reflection thin film devices with compatibility of electromagnetic shielding 设计具有电磁屏蔽兼容性的红外线抗反射薄膜设备
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3021734
Yang Li, Junqi Xu, Junhong Su, Yangjun Liu, Jian Wang
{"title":"Design of infrared anti-reflection thin film devices with compatibility of electromagnetic shielding","authors":"Yang Li, Junqi Xu, Junhong Su, Yangjun Liu, Jian Wang","doi":"10.1117/12.3021734","DOIUrl":"https://doi.org/10.1117/12.3021734","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"73 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140398008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient near-infrared lead sulfide quantum dots photodetectors fabricated using an excess PbBr2 passivation process 利用过量 PbBr2 钝化工艺制作的高效近红外硫化铅量子点光电探测器
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3021783
Fei Gao, Huan Liu, Shuai Wen, Jijie Zhao, Sheng-Min Wang, Fei Xie
{"title":"Efficient near-infrared lead sulfide quantum dots photodetectors fabricated using an excess PbBr2 passivation process","authors":"Fei Gao, Huan Liu, Shuai Wen, Jijie Zhao, Sheng-Min Wang, Fei Xie","doi":"10.1117/12.3021783","DOIUrl":"https://doi.org/10.1117/12.3021783","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"159 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140286042","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Construction and error analysis of dual linear array camera target measurement system in long-range target range 双线性阵列相机远距离目标测量系统的构建与误差分析
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3014230
zaiming liu, bin Feng, HaoFei Zhang
{"title":"Construction and error analysis of dual linear array camera target measurement system in long-range target range","authors":"zaiming liu, bin Feng, HaoFei Zhang","doi":"10.1117/12.3014230","DOIUrl":"https://doi.org/10.1117/12.3014230","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"134 9‐12","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140397940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Research on three-dimensional velocimetry technology based on multiplexed photon Doppler 基于多路复用光子多普勒的三维测速技术研究
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3021450
Ya-Nan Sun, Shen-Jiang Wu, Jia Wang, Dang-Juan Li
{"title":"Research on three-dimensional velocimetry technology based on multiplexed photon Doppler","authors":"Ya-Nan Sun, Shen-Jiang Wu, Jia Wang, Dang-Juan Li","doi":"10.1117/12.3021450","DOIUrl":"https://doi.org/10.1117/12.3021450","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"158 1‐8","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140398278","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Exploring the range of optical memory effect by deep learning 通过深度学习探索光学记忆效应的范围
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3018703
Juncheng Chen, Dajiang Lu, Jiapeng Cai, Zaoxin Chen, Xiang Peng, W. He
{"title":"Exploring the range of optical memory effect by deep learning","authors":"Juncheng Chen, Dajiang Lu, Jiapeng Cai, Zaoxin Chen, Xiang Peng, W. He","doi":"10.1117/12.3018703","DOIUrl":"https://doi.org/10.1117/12.3018703","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"157 4‐7","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140398280","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulation and research on one-dimensional laser range profile from a semi-rough target 半粗糙目标一维激光测距剖面模拟与研究
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3021730
Meng Huang, Liguo Wang, Lei Gong, Yue Yu
{"title":"Simulation and research on one-dimensional laser range profile from a semi-rough target","authors":"Meng Huang, Liguo Wang, Lei Gong, Yue Yu","doi":"10.1117/12.3021730","DOIUrl":"https://doi.org/10.1117/12.3021730","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"29 1‐2","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140397900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Determination of the optical transfer matrix for the sinusoidal grating pattern 确定正弦光栅图案的光传递矩阵
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3021240
Jianlin Nie, Yicheng Tuo, Steen G. Hanson, Mitsuo Takeda, Wei Wang
{"title":"Determination of the optical transfer matrix for the sinusoidal grating pattern","authors":"Jianlin Nie, Yicheng Tuo, Steen G. Hanson, Mitsuo Takeda, Wei Wang","doi":"10.1117/12.3021240","DOIUrl":"https://doi.org/10.1117/12.3021240","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"126 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140397950","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Knife-edge method for measuring the optical transfer matrix of polarization imaging systems 测量偏振成像系统光传递矩阵的刀刃法
Speckle 2023: VIII International Conference on Speckle Metrology Pub Date : 2024-03-04 DOI: 10.1117/12.3020985
Yicheng Tuo, Jianlin Nie, Steen G. Hanson, Mitsuo Takeda, Wei Wang
{"title":"Knife-edge method for measuring the optical transfer matrix of polarization imaging systems","authors":"Yicheng Tuo, Jianlin Nie, Steen G. Hanson, Mitsuo Takeda, Wei Wang","doi":"10.1117/12.3020985","DOIUrl":"https://doi.org/10.1117/12.3020985","url":null,"abstract":"","PeriodicalId":517713,"journal":{"name":"Speckle 2023: VIII International Conference on Speckle Metrology","volume":"92 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140398200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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